Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+) View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2018-10

AUTHORS

A. I. Chichinin, M. Poretskiy, C. Maul, K.-H. Gericke

ABSTRACT

A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl−, H−) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.

PAGES

303-307

Identifiers

URI

http://scigraph.springernature.com/pub.10.3103/s1068335618100044

DOI

http://dx.doi.org/10.3103/s1068335618100044

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1110674238


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