Effect of the deposition technological parameters on the transparences distribution functions of Josephson junction barriers View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2014-05

AUTHORS

A. V. Shaternik, A. P. Shapovalov, T. O. Prikhna

ABSTRACT

Charge transport in superconductor-insulator-superconductor junctions has been studied. To relate technological parameters of the deposition of junction layers and barrier’s structure to model parameters of charge transport in these junctions for the first time has been made possible by the use of superhard material, leucosapphire, as the substrates to produce Josephson junction. The results have been considered of experimental studies of nanosized structures fabricated on the basis of thin films of MoRe superconductors. The charge transport in these heterostructures has been analyzed in the framework of the modified theoretical model of multiple Andreev reflections taking into account the function of the barrier transparencies distribution. Such approach allows one to describe the evolution of the shape of the real current-voltage characteristics of heterostructures depending on technological conditions of manufacturing the heterostructures. More... »

PAGES

180-186

Identifiers

URI

http://scigraph.springernature.com/pub.10.3103/s1063457614030058

DOI

http://dx.doi.org/10.3103/s1063457614030058

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1041933144


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods\u2019ka 2, 04074, Kiev, Ukraine", 
          "id": "http://www.grid.ac/institutes/grid.418751.e", 
          "name": [
            "Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods\u2019ka 2, 04074, Kiev, Ukraine"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Shaternik", 
        "givenName": "A. V.", 
        "id": "sg:person.015522043043.73", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015522043043.73"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods\u2019ka 2, 04074, Kiev, Ukraine", 
          "id": "http://www.grid.ac/institutes/grid.418751.e", 
          "name": [
            "Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods\u2019ka 2, 04074, Kiev, Ukraine"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Shapovalov", 
        "givenName": "A. P.", 
        "id": "sg:person.015613052124.28", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015613052124.28"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods\u2019ka 2, 04074, Kiev, Ukraine", 
          "id": "http://www.grid.ac/institutes/grid.418751.e", 
          "name": [
            "Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods\u2019ka 2, 04074, Kiev, Ukraine"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Prikhna", 
        "givenName": "T. O.", 
        "id": "sg:person.012572435107.08", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012572435107.08"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2014-05", 
    "datePublishedReg": "2014-05-01", 
    "description": "Charge transport in superconductor-insulator-superconductor junctions has been studied. To relate technological parameters of the deposition of junction layers and barrier\u2019s structure to model parameters of charge transport in these junctions for the first time has been made possible by the use of superhard material, leucosapphire, as the substrates to produce Josephson junction. The results have been considered of experimental studies of nanosized structures fabricated on the basis of thin films of MoRe superconductors. The charge transport in these heterostructures has been analyzed in the framework of the modified theoretical model of multiple Andreev reflections taking into account the function of the barrier transparencies distribution. Such approach allows one to describe the evolution of the shape of the real current-voltage characteristics of heterostructures depending on technological conditions of manufacturing the heterostructures.", 
    "genre": "article", 
    "id": "sg:pub.10.3103/s1063457614030058", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136513", 
        "issn": [
          "1063-4576", 
          "1934-9408"
        ], 
        "name": "Journal of Superhard Materials", 
        "publisher": "Allerton Press", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "3", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "36"
      }
    ], 
    "keywords": [
      "Josephson junction barrier", 
      "real current-voltage characteristics", 
      "multiple Andreev reflections", 
      "charge transport", 
      "technological parameters", 
      "more superconductors", 
      "Josephson junctions", 
      "superconductor junctions", 
      "Andreev reflection", 
      "modified theoretical model", 
      "current-voltage characteristics", 
      "distribution function", 
      "transparency distribution", 
      "thin films", 
      "junction layer", 
      "superhard materials", 
      "heterostructures", 
      "technological conditions", 
      "theoretical model", 
      "barrier structure", 
      "experimental study", 
      "superconductors", 
      "parameters", 
      "junction barrier", 
      "transport", 
      "films", 
      "leucosapphire", 
      "such approaches", 
      "structure", 
      "layer", 
      "function", 
      "materials", 
      "deposition", 
      "junction", 
      "substrate", 
      "model", 
      "distribution", 
      "first time", 
      "shape", 
      "framework", 
      "account", 
      "approach", 
      "characteristics", 
      "conditions", 
      "evolution", 
      "reflection", 
      "results", 
      "time", 
      "effect", 
      "basis", 
      "use", 
      "barriers", 
      "study"
    ], 
    "name": "Effect of the deposition technological parameters on the transparences distribution functions of Josephson junction barriers", 
    "pagination": "180-186", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1041933144"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.3103/s1063457614030058"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.3103/s1063457614030058", 
      "https://app.dimensions.ai/details/publication/pub.1041933144"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-05-20T07:29", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220519/entities/gbq_results/article/article_632.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.3103/s1063457614030058"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.3103/s1063457614030058'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.3103/s1063457614030058'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.3103/s1063457614030058'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.3103/s1063457614030058'


 

This table displays all metadata directly associated to this object as RDF triples.

125 TRIPLES      21 PREDICATES      79 URIs      71 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.3103/s1063457614030058 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author N43589179ed614e67b071bdb9268abfb5
4 schema:datePublished 2014-05
5 schema:datePublishedReg 2014-05-01
6 schema:description Charge transport in superconductor-insulator-superconductor junctions has been studied. To relate technological parameters of the deposition of junction layers and barrier’s structure to model parameters of charge transport in these junctions for the first time has been made possible by the use of superhard material, leucosapphire, as the substrates to produce Josephson junction. The results have been considered of experimental studies of nanosized structures fabricated on the basis of thin films of MoRe superconductors. The charge transport in these heterostructures has been analyzed in the framework of the modified theoretical model of multiple Andreev reflections taking into account the function of the barrier transparencies distribution. Such approach allows one to describe the evolution of the shape of the real current-voltage characteristics of heterostructures depending on technological conditions of manufacturing the heterostructures.
7 schema:genre article
8 schema:inLanguage en
9 schema:isAccessibleForFree false
10 schema:isPartOf N85c2ee71bd7f4d62ab9d99b7176e817e
11 Nce8853040127455ebc5c16dfa6e8f4b7
12 sg:journal.1136513
13 schema:keywords Andreev reflection
14 Josephson junction barrier
15 Josephson junctions
16 account
17 approach
18 barrier structure
19 barriers
20 basis
21 characteristics
22 charge transport
23 conditions
24 current-voltage characteristics
25 deposition
26 distribution
27 distribution function
28 effect
29 evolution
30 experimental study
31 films
32 first time
33 framework
34 function
35 heterostructures
36 junction
37 junction barrier
38 junction layer
39 layer
40 leucosapphire
41 materials
42 model
43 modified theoretical model
44 more superconductors
45 multiple Andreev reflections
46 parameters
47 real current-voltage characteristics
48 reflection
49 results
50 shape
51 structure
52 study
53 substrate
54 such approaches
55 superconductor junctions
56 superconductors
57 superhard materials
58 technological conditions
59 technological parameters
60 theoretical model
61 thin films
62 time
63 transparency distribution
64 transport
65 use
66 schema:name Effect of the deposition technological parameters on the transparences distribution functions of Josephson junction barriers
67 schema:pagination 180-186
68 schema:productId N0a33c6c175ca4b2e840c04ff72ad4cc5
69 N3a20c5b750044ca392e8b8956eaab97a
70 schema:sameAs https://app.dimensions.ai/details/publication/pub.1041933144
71 https://doi.org/10.3103/s1063457614030058
72 schema:sdDatePublished 2022-05-20T07:29
73 schema:sdLicense https://scigraph.springernature.com/explorer/license/
74 schema:sdPublisher N2b6de79d8bfa4bbeae20004c034bbc76
75 schema:url https://doi.org/10.3103/s1063457614030058
76 sgo:license sg:explorer/license/
77 sgo:sdDataset articles
78 rdf:type schema:ScholarlyArticle
79 N0a33c6c175ca4b2e840c04ff72ad4cc5 schema:name dimensions_id
80 schema:value pub.1041933144
81 rdf:type schema:PropertyValue
82 N2b6de79d8bfa4bbeae20004c034bbc76 schema:name Springer Nature - SN SciGraph project
83 rdf:type schema:Organization
84 N3a20c5b750044ca392e8b8956eaab97a schema:name doi
85 schema:value 10.3103/s1063457614030058
86 rdf:type schema:PropertyValue
87 N43589179ed614e67b071bdb9268abfb5 rdf:first sg:person.015522043043.73
88 rdf:rest N9a268eee76714f94884d9d4e42850575
89 N85c2ee71bd7f4d62ab9d99b7176e817e schema:volumeNumber 36
90 rdf:type schema:PublicationVolume
91 N9a268eee76714f94884d9d4e42850575 rdf:first sg:person.015613052124.28
92 rdf:rest Nc2a784f299dc44c1922e6a0b4e9be7c1
93 Nc2a784f299dc44c1922e6a0b4e9be7c1 rdf:first sg:person.012572435107.08
94 rdf:rest rdf:nil
95 Nce8853040127455ebc5c16dfa6e8f4b7 schema:issueNumber 3
96 rdf:type schema:PublicationIssue
97 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
98 schema:name Engineering
99 rdf:type schema:DefinedTerm
100 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
101 schema:name Materials Engineering
102 rdf:type schema:DefinedTerm
103 sg:journal.1136513 schema:issn 1063-4576
104 1934-9408
105 schema:name Journal of Superhard Materials
106 schema:publisher Allerton Press
107 rdf:type schema:Periodical
108 sg:person.012572435107.08 schema:affiliation grid-institutes:grid.418751.e
109 schema:familyName Prikhna
110 schema:givenName T. O.
111 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012572435107.08
112 rdf:type schema:Person
113 sg:person.015522043043.73 schema:affiliation grid-institutes:grid.418751.e
114 schema:familyName Shaternik
115 schema:givenName A. V.
116 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015522043043.73
117 rdf:type schema:Person
118 sg:person.015613052124.28 schema:affiliation grid-institutes:grid.418751.e
119 schema:familyName Shapovalov
120 schema:givenName A. P.
121 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015613052124.28
122 rdf:type schema:Person
123 grid-institutes:grid.418751.e schema:alternateName Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods’ka 2, 04074, Kiev, Ukraine
124 schema:name Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, vul. Avtozavods’ka 2, 04074, Kiev, Ukraine
125 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...