The accuracy of diffraction patterns taken in a diamond-anvil cell using an X-ray diffractometer according to the Dobrovol’skii-Shvedov method View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2013-05

AUTHORS

N. V. Novikov, Yu. N. Krivosheya, L. K. Shvedov

ABSTRACT

The accuracy of the diffraction patterns taken on a DRON-3 diffractometer by the Dobrovol’skii-Shvedov method in a diamond-anvil cell has been analyzed. The generally accepted reference materials (polycrystalline silicon and NaCl) have been used as samples. The long-term stability has been checked on a steel sample.

PAGES

192-194

Identifiers

URI

http://scigraph.springernature.com/pub.10.3103/s106345761303009x

DOI

http://dx.doi.org/10.3103/s106345761303009x

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1014247506


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