Resistive switching effect in thin-film heterojunctions based on electron-doped Nd2 − xCexCuO4 − y superconductor View Full Text


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Article Info

DATE

2011-05

AUTHORS

N. A. Tulina, I. Yu. Borisenko, A. A. Ivanov, A. M. Ionov, I. M. Shmyt’ko, A. P. Menushenkov

ABSTRACT

Thin-film heterojunctions Nd2 − xCexCuO4 − y/Ag were obtained. The bipolar effect of resistive switching in these heterostructures was detected and investigated. X-ray diffraction data indicate the presence of a second phase in thin films; along with the basic phase Nd2 − xCexCuO4 − y, it affects the behavior of the interface of investigated heterojunctions and leads to an alteration of the type of conductivity. The threshold frequency of alternating voltage at which the resistive switching effect is observed in heterojunctions was detected. More... »

PAGES

605-608

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.3103/s1062873811050480

DOI

http://dx.doi.org/10.3103/s1062873811050480

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1003042166


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