Reflective interferometer for investigation of the amplitude-phase characteristics of semiconductor nanostructures View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2009-02

AUTHORS

A. A. Kovalev, V. V. Preobrazhenskii, M. A. Putyato, O. P. Pchelyakov, N. N. Rubtsova

ABSTRACT

It is proposed to apply a reflective interferometer in measurements of the spectral dependence of the phase of reflection of mirrors based on multilayer semiconductor nanostructures. The interferometer has been tested on the semiconductor mirror initiating the self-locking mode of a Nd3+: KGd(WO4)2 laser. The technique proposed can be applied in a wide wavelength range and has a higher sensitivity for measuring the phase characteristics in comparison with the conventional two-beam interferometers. More... »

PAGES

278-280

Identifiers

URI

http://scigraph.springernature.com/pub.10.3103/s1062873809020348

DOI

http://dx.doi.org/10.3103/s1062873809020348

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1043184861


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