Influence of Different Atmospheres on the Life Time of Porous Silicon Light-Emitting Devices View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2002

AUTHORS

B.R. Jumayev, H.L. Tam, K.W. Cheah, N.E. Korsunska

ABSTRACT

ABSTRACT In present report, we investigated the degradation processes in porous silicon light-emitting devices (LED) in different atmospheres (O 2 , N 2 , air and vacuum) by photoluminescence (PL), electroluminescence (EL), lifetime (LT) and I-V characteristic measurements as well as by Energy Dispersive X-ray Spectroscopy (EDS). The contacts were made by evaporation of Au and Au/Cu alloy. The LEDs emit in visible range at forward and reverse bias. As a rule, full width at half maximum of EL spectrum is wider than that of PL spectrum. The bias direction of applied voltage during degradation change EL, PL, I-V characteristics, and LT of the LEDs. At forward bias, LT degradation is less than that in reverse bias. The degradation of LEDs during forward bias did not produce any change in the spectral shape of EL and PL. At reverse bias, degradation led to red shift in the peak of EL and PL. The results show that the lifetime of LEDs with Au contact is longer than Au-Cu. Operating in different atmospheres, the LT in vacuum is longest and is more than 100 hours in reverse bias at room temperature. Possible mechanisms of degradation of LEDs are discussed. It is proposed that degradation is connected mainly with two processes: oxidation and metal diffusion. It is shown that the oxygen and metal in ionic state can diffuse quickly. Hence, in forward bias, the diffusion of metal would dominate, and in reverse bias, diffusion of oxygen dominates. More... »

PAGES

f8.14

Identifiers

URI

http://scigraph.springernature.com/pub.10.1557/proc-737-f8.14

DOI

http://dx.doi.org/10.1557/proc-737-f8.14

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1067954467


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/03", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Chemical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0302", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Inorganic Chemistry", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China", 
          "id": "http://www.grid.ac/institutes/grid.221309.b", 
          "name": [
            "Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Jumayev", 
        "givenName": "B.R.", 
        "id": "sg:person.016537705226.25", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016537705226.25"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China", 
          "id": "http://www.grid.ac/institutes/grid.221309.b", 
          "name": [
            "Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Tam", 
        "givenName": "H.L.", 
        "id": "sg:person.01336130346.19", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01336130346.19"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China", 
          "id": "http://www.grid.ac/institutes/grid.221309.b", 
          "name": [
            "Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Cheah", 
        "givenName": "K.W.", 
        "id": "sg:person.011760672100.97", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011760672100.97"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 03028 Kiev, Ukraine", 
          "id": "http://www.grid.ac/institutes/grid.466789.2", 
          "name": [
            "Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 03028 Kiev, Ukraine"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Korsunska", 
        "givenName": "N.E.", 
        "id": "sg:person.01137661264.75", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01137661264.75"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2002", 
    "datePublishedReg": "2002-01-01", 
    "description": "ABSTRACT  In present report, we investigated the degradation processes in porous silicon light-emitting devices (LED) in different atmospheres (O 2 , N 2 , air and vacuum) by photoluminescence (PL), electroluminescence (EL), lifetime (LT) and I-V characteristic measurements as well as by Energy Dispersive X-ray Spectroscopy (EDS). The contacts were made by evaporation of Au and Au/Cu alloy. The LEDs emit in visible range at forward and reverse bias. As a rule, full width at half maximum of EL spectrum is wider than that of PL spectrum. The bias direction of applied voltage during degradation change EL, PL, I-V characteristics, and LT of the LEDs. At forward bias, LT degradation is less than that in reverse bias.  The degradation of LEDs during forward bias did not produce any change in the spectral shape of EL and PL. At reverse bias, degradation led to red shift in the peak of EL and PL. The results show that the lifetime of LEDs with Au contact is longer than Au-Cu. Operating in different atmospheres, the LT in vacuum is longest and is more than 100 hours in reverse bias at room temperature. Possible mechanisms of degradation of LEDs are discussed. It is proposed that degradation is connected mainly with two processes: oxidation and metal diffusion. It is shown that the oxygen and metal in ionic state can diffuse quickly. Hence, in forward bias, the diffusion of metal would dominate, and in reverse bias, diffusion of oxygen dominates.", 
    "genre": "article", 
    "id": "sg:pub.10.1557/proc-737-f8.14", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1297379", 
        "issn": [
          "2731-5894", 
          "2059-8521"
        ], 
        "name": "MRS Advances", 
        "publisher": "Springer Nature", 
        "type": "Periodical"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "737"
      }
    ], 
    "keywords": [
      "light-emitting devices", 
      "energy dispersive X-ray spectroscopy", 
      "reverse bias", 
      "silicon light emitting devices", 
      "silicon light-emitting devices", 
      "forward bias", 
      "light emitting devices", 
      "dispersive X-ray spectroscopy", 
      "X-ray spectroscopy", 
      "evaporation of Au", 
      "different atmospheres", 
      "LEDs emit", 
      "ionic states", 
      "diffusion of metals", 
      "visible range", 
      "half maximum", 
      "full width", 
      "PL spectra", 
      "oxygen dominates", 
      "spectral shape", 
      "red shift", 
      "EL spectra", 
      "photoluminescence", 
      "electroluminescence", 
      "room temperature", 
      "metal diffusion", 
      "characteristic measurements", 
      "bias direction", 
      "lifetime", 
      "Au contacts", 
      "spectra", 
      "atmosphere", 
      "life time", 
      "devices", 
      "diffusion", 
      "vacuum", 
      "Au-Cu", 
      "spectroscopy", 
      "emits", 
      "Au", 
      "width", 
      "evaporation", 
      "dominates", 
      "measurements", 
      "peak", 
      "metals", 
      "voltage", 
      "Cu alloy", 
      "shift", 
      "temperature", 
      "state", 
      "maximum", 
      "possible mechanism", 
      "bias", 
      "range", 
      "direction", 
      "shape", 
      "oxygen", 
      "alloy", 
      "degradation process", 
      "process", 
      "contact", 
      "degradation", 
      "time", 
      "Abstract", 
      "results", 
      "mechanism", 
      "characteristics", 
      "influence", 
      "oxidation", 
      "present report", 
      "changes", 
      "rules", 
      "hours", 
      "report"
    ], 
    "name": "Influence of Different Atmospheres on the Life Time of Porous Silicon Light-Emitting Devices", 
    "pagination": "f8.14", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1067954467"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1557/proc-737-f8.14"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1557/proc-737-f8.14", 
      "https://app.dimensions.ai/details/publication/pub.1067954467"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-12-01T06:23", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20221201/entities/gbq_results/article/article_347.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1557/proc-737-f8.14"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1557/proc-737-f8.14'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1557/proc-737-f8.14'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1557/proc-737-f8.14'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1557/proc-737-f8.14'


 

This table displays all metadata directly associated to this object as RDF triples.

153 TRIPLES      20 PREDICATES      99 URIs      91 LITERALS      5 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1557/proc-737-f8.14 schema:about anzsrc-for:03
2 anzsrc-for:0302
3 schema:author Ne6e0be198784402a886f57c325599af7
4 schema:datePublished 2002
5 schema:datePublishedReg 2002-01-01
6 schema:description ABSTRACT In present report, we investigated the degradation processes in porous silicon light-emitting devices (LED) in different atmospheres (O 2 , N 2 , air and vacuum) by photoluminescence (PL), electroluminescence (EL), lifetime (LT) and I-V characteristic measurements as well as by Energy Dispersive X-ray Spectroscopy (EDS). The contacts were made by evaporation of Au and Au/Cu alloy. The LEDs emit in visible range at forward and reverse bias. As a rule, full width at half maximum of EL spectrum is wider than that of PL spectrum. The bias direction of applied voltage during degradation change EL, PL, I-V characteristics, and LT of the LEDs. At forward bias, LT degradation is less than that in reverse bias. The degradation of LEDs during forward bias did not produce any change in the spectral shape of EL and PL. At reverse bias, degradation led to red shift in the peak of EL and PL. The results show that the lifetime of LEDs with Au contact is longer than Au-Cu. Operating in different atmospheres, the LT in vacuum is longest and is more than 100 hours in reverse bias at room temperature. Possible mechanisms of degradation of LEDs are discussed. It is proposed that degradation is connected mainly with two processes: oxidation and metal diffusion. It is shown that the oxygen and metal in ionic state can diffuse quickly. Hence, in forward bias, the diffusion of metal would dominate, and in reverse bias, diffusion of oxygen dominates.
7 schema:genre article
8 schema:isAccessibleForFree false
9 schema:isPartOf Nbdda956a54134e108e0bc4a0de8d67af
10 sg:journal.1297379
11 schema:keywords Abstract
12 Au
13 Au contacts
14 Au-Cu
15 Cu alloy
16 EL spectra
17 LEDs emit
18 PL spectra
19 X-ray spectroscopy
20 alloy
21 atmosphere
22 bias
23 bias direction
24 changes
25 characteristic measurements
26 characteristics
27 contact
28 degradation
29 degradation process
30 devices
31 different atmospheres
32 diffusion
33 diffusion of metals
34 direction
35 dispersive X-ray spectroscopy
36 dominates
37 electroluminescence
38 emits
39 energy dispersive X-ray spectroscopy
40 evaporation
41 evaporation of Au
42 forward bias
43 full width
44 half maximum
45 hours
46 influence
47 ionic states
48 life time
49 lifetime
50 light emitting devices
51 light-emitting devices
52 maximum
53 measurements
54 mechanism
55 metal diffusion
56 metals
57 oxidation
58 oxygen
59 oxygen dominates
60 peak
61 photoluminescence
62 possible mechanism
63 present report
64 process
65 range
66 red shift
67 report
68 results
69 reverse bias
70 room temperature
71 rules
72 shape
73 shift
74 silicon light emitting devices
75 silicon light-emitting devices
76 spectra
77 spectral shape
78 spectroscopy
79 state
80 temperature
81 time
82 vacuum
83 visible range
84 voltage
85 width
86 schema:name Influence of Different Atmospheres on the Life Time of Porous Silicon Light-Emitting Devices
87 schema:pagination f8.14
88 schema:productId N109cac459383419dbb40be2cefe6e54a
89 N9b70649c7c9f49b5902c154e637d6082
90 schema:sameAs https://app.dimensions.ai/details/publication/pub.1067954467
91 https://doi.org/10.1557/proc-737-f8.14
92 schema:sdDatePublished 2022-12-01T06:23
93 schema:sdLicense https://scigraph.springernature.com/explorer/license/
94 schema:sdPublisher Nae8ae8d67063450095580a1e07b43eb3
95 schema:url https://doi.org/10.1557/proc-737-f8.14
96 sgo:license sg:explorer/license/
97 sgo:sdDataset articles
98 rdf:type schema:ScholarlyArticle
99 N053da4159d214c878f0ca80233574268 rdf:first sg:person.011760672100.97
100 rdf:rest N6ae9ec97c9974170b575e34c7703ba46
101 N109cac459383419dbb40be2cefe6e54a schema:name dimensions_id
102 schema:value pub.1067954467
103 rdf:type schema:PropertyValue
104 N6ae9ec97c9974170b575e34c7703ba46 rdf:first sg:person.01137661264.75
105 rdf:rest rdf:nil
106 N9b70649c7c9f49b5902c154e637d6082 schema:name doi
107 schema:value 10.1557/proc-737-f8.14
108 rdf:type schema:PropertyValue
109 Nae8ae8d67063450095580a1e07b43eb3 schema:name Springer Nature - SN SciGraph project
110 rdf:type schema:Organization
111 Nbbb5e44cb925478c88ec552c97ec5996 rdf:first sg:person.01336130346.19
112 rdf:rest N053da4159d214c878f0ca80233574268
113 Nbdda956a54134e108e0bc4a0de8d67af schema:volumeNumber 737
114 rdf:type schema:PublicationVolume
115 Ne6e0be198784402a886f57c325599af7 rdf:first sg:person.016537705226.25
116 rdf:rest Nbbb5e44cb925478c88ec552c97ec5996
117 anzsrc-for:03 schema:inDefinedTermSet anzsrc-for:
118 schema:name Chemical Sciences
119 rdf:type schema:DefinedTerm
120 anzsrc-for:0302 schema:inDefinedTermSet anzsrc-for:
121 schema:name Inorganic Chemistry
122 rdf:type schema:DefinedTerm
123 sg:journal.1297379 schema:issn 2059-8521
124 2731-5894
125 schema:name MRS Advances
126 schema:publisher Springer Nature
127 rdf:type schema:Periodical
128 sg:person.01137661264.75 schema:affiliation grid-institutes:grid.466789.2
129 schema:familyName Korsunska
130 schema:givenName N.E.
131 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01137661264.75
132 rdf:type schema:Person
133 sg:person.011760672100.97 schema:affiliation grid-institutes:grid.221309.b
134 schema:familyName Cheah
135 schema:givenName K.W.
136 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011760672100.97
137 rdf:type schema:Person
138 sg:person.01336130346.19 schema:affiliation grid-institutes:grid.221309.b
139 schema:familyName Tam
140 schema:givenName H.L.
141 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01336130346.19
142 rdf:type schema:Person
143 sg:person.016537705226.25 schema:affiliation grid-institutes:grid.221309.b
144 schema:familyName Jumayev
145 schema:givenName B.R.
146 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016537705226.25
147 rdf:type schema:Person
148 grid-institutes:grid.221309.b schema:alternateName Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China
149 schema:name Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China
150 rdf:type schema:Organization
151 grid-institutes:grid.466789.2 schema:alternateName Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 03028 Kiev, Ukraine
152 schema:name Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 03028 Kiev, Ukraine
153 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...