Photoinduced Paramagnetic Defects in Amorphous Silicon Dioxide View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1985

AUTHORS

J. H. Stathis, M. A. Kastner

ABSTRACT

ABSTRACT Several paramagnetic defects are created by exposure of amorphous SiO 2 to sub-band-gap light. The spectra of the dominant centers can be isolated by using their annealing, microwave power, and excitation-photonenergy dependence. The results are discussed in terms of specific models for the intrinsic defects in a-SiO 2 .

PAGES

161

Identifiers

URI

http://scigraph.springernature.com/pub.10.1557/proc-61-161

DOI

http://dx.doi.org/10.1557/proc-61-161

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1067948365


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TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139", 
          "id": "http://www.grid.ac/institutes/grid.116068.8", 
          "name": [
            "Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Stathis", 
        "givenName": "J. H.", 
        "id": "sg:person.014127134375.15", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014127134375.15"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139", 
          "id": "http://www.grid.ac/institutes/grid.116068.8", 
          "name": [
            "Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kastner", 
        "givenName": "M. A.", 
        "id": "sg:person.011522436652.55", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011522436652.55"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "1985", 
    "datePublishedReg": "1985-01-01", 
    "description": "ABSTRACT  Several paramagnetic defects are created by exposure of amorphous SiO 2 to sub-band-gap light. The spectra of the dominant centers can be isolated by using their annealing, microwave power, and excitation-photonenergy dependence. The results are discussed in terms of specific models for the intrinsic defects in a-SiO 2 . ", 
    "genre": "article", 
    "id": "sg:pub.10.1557/proc-61-161", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1297379", 
        "issn": [
          "0272-9172", 
          "2059-8521"
        ], 
        "name": "MRS Advances", 
        "publisher": "Springer Nature", 
        "type": "Periodical"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "61"
      }
    ], 
    "keywords": [
      "SiO 2", 
      "amorphous SiO 2", 
      "silicon dioxide", 
      "amorphous silicon dioxide", 
      "microwave power", 
      "paramagnetic defects", 
      "gap light", 
      "annealing", 
      "intrinsic defects", 
      "defects", 
      "dioxide", 
      "power", 
      "specific model", 
      "dependence", 
      "model", 
      "results", 
      "terms", 
      "light", 
      "spectra", 
      "Abstract", 
      "center", 
      "exposure", 
      "dominant center", 
      "excitation-photonenergy dependence"
    ], 
    "name": "Photoinduced Paramagnetic Defects in Amorphous Silicon Dioxide", 
    "pagination": "161", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1067948365"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1557/proc-61-161"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1557/proc-61-161", 
      "https://app.dimensions.ai/details/publication/pub.1067948365"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-01-01T18:04", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220101/entities/gbq_results/article/article_217.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1557/proc-61-161"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

86 TRIPLES      21 PREDICATES      49 URIs      41 LITERALS      5 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1557/proc-61-161 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author N8c51200782f849fb898648bf32368c4c
4 schema:datePublished 1985
5 schema:datePublishedReg 1985-01-01
6 schema:description ABSTRACT Several paramagnetic defects are created by exposure of amorphous SiO 2 to sub-band-gap light. The spectra of the dominant centers can be isolated by using their annealing, microwave power, and excitation-photonenergy dependence. The results are discussed in terms of specific models for the intrinsic defects in a-SiO 2 .
7 schema:genre article
8 schema:inLanguage en
9 schema:isAccessibleForFree false
10 schema:isPartOf N2068131246b74d3586ce4f8fc3271a66
11 sg:journal.1297379
12 schema:keywords Abstract
13 SiO 2
14 amorphous SiO 2
15 amorphous silicon dioxide
16 annealing
17 center
18 defects
19 dependence
20 dioxide
21 dominant center
22 excitation-photonenergy dependence
23 exposure
24 gap light
25 intrinsic defects
26 light
27 microwave power
28 model
29 paramagnetic defects
30 power
31 results
32 silicon dioxide
33 specific model
34 spectra
35 terms
36 schema:name Photoinduced Paramagnetic Defects in Amorphous Silicon Dioxide
37 schema:pagination 161
38 schema:productId Ne8d8e71a569441bc9ccc8dec77707009
39 Nee1c3feaff894f15b9a3f70d6888ccfd
40 schema:sameAs https://app.dimensions.ai/details/publication/pub.1067948365
41 https://doi.org/10.1557/proc-61-161
42 schema:sdDatePublished 2022-01-01T18:04
43 schema:sdLicense https://scigraph.springernature.com/explorer/license/
44 schema:sdPublisher N9ea0a0015d054b01a5f3bf5b7e678432
45 schema:url https://doi.org/10.1557/proc-61-161
46 sgo:license sg:explorer/license/
47 sgo:sdDataset articles
48 rdf:type schema:ScholarlyArticle
49 N134f67c2fe984618827d80e18e6f18af rdf:first sg:person.011522436652.55
50 rdf:rest rdf:nil
51 N2068131246b74d3586ce4f8fc3271a66 schema:volumeNumber 61
52 rdf:type schema:PublicationVolume
53 N8c51200782f849fb898648bf32368c4c rdf:first sg:person.014127134375.15
54 rdf:rest N134f67c2fe984618827d80e18e6f18af
55 N9ea0a0015d054b01a5f3bf5b7e678432 schema:name Springer Nature - SN SciGraph project
56 rdf:type schema:Organization
57 Ne8d8e71a569441bc9ccc8dec77707009 schema:name doi
58 schema:value 10.1557/proc-61-161
59 rdf:type schema:PropertyValue
60 Nee1c3feaff894f15b9a3f70d6888ccfd schema:name dimensions_id
61 schema:value pub.1067948365
62 rdf:type schema:PropertyValue
63 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
64 schema:name Engineering
65 rdf:type schema:DefinedTerm
66 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
67 schema:name Materials Engineering
68 rdf:type schema:DefinedTerm
69 sg:journal.1297379 schema:issn 0272-9172
70 2059-8521
71 schema:name MRS Advances
72 schema:publisher Springer Nature
73 rdf:type schema:Periodical
74 sg:person.011522436652.55 schema:affiliation grid-institutes:grid.116068.8
75 schema:familyName Kastner
76 schema:givenName M. A.
77 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011522436652.55
78 rdf:type schema:Person
79 sg:person.014127134375.15 schema:affiliation grid-institutes:grid.116068.8
80 schema:familyName Stathis
81 schema:givenName J. H.
82 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014127134375.15
83 rdf:type schema:Person
84 grid-institutes:grid.116068.8 schema:alternateName Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139
85 schema:name Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139
86 rdf:type schema:Organization
 




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