High Spatial Resolution Strain Measurements Within Bulk Materials by Slit-Imaging View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1999

AUTHORS

U. Lienert, R. Martins, S. Grigull, M. Pinkerton, H.F. Poulsen, Å. Kvick

ABSTRACT

ABSTRACT High energy synchrotron radiation is employed for residual strain measurements from local gauge volumes within the bulk of polycrystalline materials. The longitudinal spatial resolution is defined by placing a narrow imaging slit behind the sample and recording the intensity distribution on a position sensitive detector. It is shown that the sample to slit distance can be increased without sacrificing longitudinal resolution by applying a reconstruction technique. Hence, space is provided for large samples and sample environments. The reconstruction technique is described and validated by measuring the residual strain profile of a shot-peened Al sample. A longitudinal gauge length of 95 üm is achieved at 52 keV with a sample to slit distance of 10 cm. More... »

PAGES

241

Identifiers

URI

http://scigraph.springernature.com/pub.10.1557/proc-590-241

DOI

http://dx.doi.org/10.1557/proc-590-241

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1067946831


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