A time-resolved x-ray diffraction study of Ti5Si3 product formation during combustion synthesis View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1997-12

AUTHORS

C. R. Kachelmyer, I. O. Khomenko, A. S. Rogachev, A. Varma

ABSTRACT

Time-resolved x-ray diffraction (TRXRD) was performed during Ti 5 Si 3 synthesis by the self-propagating high-temperature synthesis mode for different Ti size fractions. It was determined that the time for product formation (ca. 15 s) was independent of Ti particle size. However, the formation of Ti 5 Si 4 phase occurred when relatively large titanium particles were used. A simultaneous measurement of the temperature and TRXRD allowed us to attribute the shifting of XRD peaks at high temperature to thermal expansion of the Ti 5 Si 3 product. The thermal expansion coefficients differ for different crystal planes, and their numerical values compare well with those reported previously in the literature. More... »

PAGES

3230-3240

Identifiers

URI

http://scigraph.springernature.com/pub.10.1557/jmr.1997.0423

DOI

http://dx.doi.org/10.1557/jmr.1997.0423

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1024223687


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