Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem View Full Text


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Article Info

DATE

2018-12

AUTHORS

Piotr Putek, Rick Janssen, Jan Niehof, E. Jan W. ter Maten, Roland Pulch, Bratislav Tasić, Michael Günther

ABSTRACT

The FP7 project nanoCOPS (the 7th Framework Programme project Nanoelectronic COupled Problems Solutions) derived new methods for simulation during development of designs of integrated products. It has covered advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It was inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. Due to the application of higher frequencies and the continuous down-scaling process, there is a higher probability of unforeseen interactions between different domains of a Radio Frequency Integrated Circuit (RFIC), which can lead to the variability of the output performance functions. Since these undesired phenomena ought to be investigated in the early phases of the integrated circuit (IC) design, in this work we formulate the robust optimization problem in terms of the expectation and the standard deviation values under the uncertainties of material parameters. Therein, the statistical information included in the multi-objective functional can be provided by a response surface model. For this purpose the Stochastic Collocation Method (SCM) combined with Polynomial Chaos Expansion (PCE) has been used. The reason for analyzing the variability of the Electromagnetic Interference (EMI) is, on the one hand, to quantify the uncertainty in an integrated Radio-Frequency Complementary Metal-Oxide Semi-Conductor (RFCMOS) transceiver design, and, on the other hand, to improve this design in a robust sense. We have illustrated our methodology for an integrated Radio-Frequency Complementary Metal-Oxide Semi-Conductor (RFCMOS) transceiver design. More... »

PAGES

12

References to SciGraph publications

  • 2004-04. Survey of multi-objective optimization methods for engineering in STRUCTURAL AND MULTIDISCIPLINARY OPTIMIZATION
  • 2016-12. Shape and topology optimization of a permanent-magnet machine under uncertainties in JOURNAL OF MATHEMATICS IN INDUSTRY
  • 2011. Reliability of Nanoscale Circuits and Systems, Methodologies and Circuit Architectures in NONE
  • 2018-03-21. Identification of Probabilistic Input Data for a Glue-Die-Package Problem in PROGRESS IN INDUSTRIAL MATHEMATICS AT ECMI 2016
  • 2018. Robust Optimization of an RFIC Isolation Problem Under Uncertainties in SCIENTIFIC COMPUTING IN ELECTRICAL ENGINEERING
  • 2004-02. Design for six sigma through robust optimization in STRUCTURAL AND MULTIDISCIPLINARY OPTIMIZATION
  • 2007. Adjoint Transient Sensitivity Analysis in Circuit Simulation in SCIENTIFIC COMPUTING IN ELECTRICAL ENGINEERING
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    URI

    http://scigraph.springernature.com/pub.10.1186/s13362-018-0054-3

    DOI

    http://dx.doi.org/10.1186/s13362-018-0054-3

    DIMENSIONS

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    [
      {
        "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
        "about": [
          {
            "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0801", 
            "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
            "name": "Artificial Intelligence and Image Processing", 
            "type": "DefinedTerm"
          }, 
          {
            "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/08", 
            "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
            "name": "Information and Computing Sciences", 
            "type": "DefinedTerm"
          }
        ], 
        "author": [
          {
            "affiliation": {
              "alternateName": "University of Greifswald", 
              "id": "https://www.grid.ac/institutes/grid.5603.0", 
              "name": [
                "Bergische Universit\u00e4t Wuppertal, Wuppertal, Germany", 
                "Ernst-Moritz-Arndt-Universit\u00e4t Greifswald, Greifswald, Germany"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Putek", 
            "givenName": "Piotr", 
            "id": "sg:person.012353342701.42", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012353342701.42"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "NXP (Netherlands)", 
              "id": "https://www.grid.ac/institutes/grid.5887.2", 
              "name": [
                "NXP Semiconductors, Eindhoven, The Netherlands"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Janssen", 
            "givenName": "Rick", 
            "id": "sg:person.07434563223.85", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07434563223.85"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "NXP (Netherlands)", 
              "id": "https://www.grid.ac/institutes/grid.5887.2", 
              "name": [
                "NXP Semiconductors, Eindhoven, The Netherlands"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Niehof", 
            "givenName": "Jan", 
            "id": "sg:person.015751615735.33", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015751615735.33"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "University of Wuppertal", 
              "id": "https://www.grid.ac/institutes/grid.7787.f", 
              "name": [
                "Bergische Universit\u00e4t Wuppertal, Wuppertal, Germany"
              ], 
              "type": "Organization"
            }, 
            "familyName": "ter Maten", 
            "givenName": "E. Jan W.", 
            "id": "sg:person.014305327261.88", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014305327261.88"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "University of Greifswald", 
              "id": "https://www.grid.ac/institutes/grid.5603.0", 
              "name": [
                "Ernst-Moritz-Arndt-Universit\u00e4t Greifswald, Greifswald, Germany"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Pulch", 
            "givenName": "Roland", 
            "id": "sg:person.011450741267.01", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011450741267.01"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "NXP (Netherlands)", 
              "id": "https://www.grid.ac/institutes/grid.5887.2", 
              "name": [
                "NXP Semiconductors, Eindhoven, The Netherlands"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Tasi\u0107", 
            "givenName": "Bratislav", 
            "id": "sg:person.015024273174.77", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015024273174.77"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "University of Wuppertal", 
              "id": "https://www.grid.ac/institutes/grid.7787.f", 
              "name": [
                "Bergische Universit\u00e4t Wuppertal, Wuppertal, Germany"
              ], 
              "type": "Organization"
            }, 
            "familyName": "G\u00fcnther", 
            "givenName": "Michael", 
            "id": "sg:person.015305627377.46", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015305627377.46"
            ], 
            "type": "Person"
          }
        ], 
        "citation": [
          {
            "id": "https://doi.org/10.1016/s0045-7825(02)00421-8", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1000311055"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-3-540-71980-9_18", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1004467167", 
              "https://doi.org/10.1007/978-3-540-71980-9_18"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1016/j.ress.2007.04.002", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1005177970"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1186/s13362-016-0032-6", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1007278236", 
              "https://doi.org/10.1186/s13362-016-0032-6"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1186/s13362-016-0032-6", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1007278236", 
              "https://doi.org/10.1186/s13362-016-0032-6"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1016/s1570-8659(04)13006-8", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1009085775"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1108/03321641211209771", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1009367480"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/s00158-003-0368-6", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1011264351", 
              "https://doi.org/10.1007/s00158-003-0368-6"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/s00158-003-0368-6", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1011264351", 
              "https://doi.org/10.1007/s00158-003-0368-6"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/s00158-003-0337-0", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1011739617", 
              "https://doi.org/10.1007/s00158-003-0337-0"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/s00158-003-0337-0", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1011739617", 
              "https://doi.org/10.1007/s00158-003-0337-0"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://app.dimensions.ai/details/publication/pub.1026769747", 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-1-4419-6217-1", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1026769747", 
              "https://doi.org/10.1007/978-1-4419-6217-1"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-1-4419-6217-1", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1026769747", 
              "https://doi.org/10.1007/978-1-4419-6217-1"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1016/j.matcom.2015.01.003", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1029573375"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1016/j.ifacol.2015.05.206", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1032261702"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1002/pamm.201310246", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1035994796"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1108/ec-01-2015-0007", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1037023431"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1016/j.paerosci.2011.05.001", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1037733903"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1002/(sici)1097-007x(200003/04)28:2<131::aid-cta100>3.0.co;2-w", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1047021630"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/4.494196", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1061165947"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/temc.2007.897152", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1061602325"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/tmag.2015.2479361", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1061688857"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/tmtt.2003.820905", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1061706075"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/tmtt.2005.862663", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1061706953"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/tmtt.2010.2091205", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1061709062"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1137/040615201", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1062845261"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1137/110835438", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1062864972"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.2528/pierm13082802", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1070911574"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/tmag.2017.2750485", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1092035933"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/spi.2011.5898830", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1093715415"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/isemc.2017.8077849", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1093778310"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1109/emccompo.2015.7358332", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1095644106"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.3850/9783981537079_0776", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1099252626"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.3850/9783981537079_0998", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1099252671"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-3-319-63082-3_40", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1101647486", 
              "https://doi.org/10.1007/978-3-319-63082-3_40"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-3-319-63082-3_40", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1101647486", 
              "https://doi.org/10.1007/978-3-319-63082-3_40"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-3-319-75538-0_17", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1103609197", 
              "https://doi.org/10.1007/978-3-319-75538-0_17"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://app.dimensions.ai/details/publication/pub.1109387602", 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://app.dimensions.ai/details/publication/pub.1109387602", 
            "type": "CreativeWork"
          }
        ], 
        "datePublished": "2018-12", 
        "datePublishedReg": "2018-12-01", 
        "description": "The FP7 project nanoCOPS (the 7th Framework Programme project Nanoelectronic COupled Problems Solutions) derived new methods for simulation during development of designs of integrated products. It has covered advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It was inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. Due to the application of higher frequencies and the continuous down-scaling process, there is a higher probability of unforeseen interactions between different domains of a Radio Frequency Integrated Circuit (RFIC), which can lead to the variability of the output performance functions. Since these undesired phenomena ought to be investigated in the early phases of the integrated circuit (IC) design, in this work we formulate the robust optimization problem in terms of the expectation and the standard deviation values under the uncertainties of material parameters. Therein, the statistical information included in the multi-objective functional can be provided by a response surface model. For this purpose the Stochastic Collocation Method (SCM) combined with Polynomial Chaos Expansion (PCE) has been used. The reason for analyzing the variability of the Electromagnetic Interference (EMI) is, on the one hand, to quantify the uncertainty in an integrated Radio-Frequency Complementary Metal-Oxide Semi-Conductor (RFCMOS) transceiver design, and, on the other hand, to improve this design in a robust sense. We have illustrated our methodology for an integrated Radio-Frequency Complementary Metal-Oxide Semi-Conductor (RFCMOS) transceiver design.", 
        "genre": "research_article", 
        "id": "sg:pub.10.1186/s13362-018-0054-3", 
        "inLanguage": [
          "en"
        ], 
        "isAccessibleForFree": true, 
        "isPartOf": [
          {
            "id": "sg:journal.1136389", 
            "issn": [
              "2190-5983"
            ], 
            "name": "Journal of Mathematics in Industry", 
            "type": "Periodical"
          }, 
          {
            "issueNumber": "1", 
            "type": "PublicationIssue"
          }, 
          {
            "type": "PublicationVolume", 
            "volumeNumber": "8"
          }
        ], 
        "name": "Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem", 
        "pagination": "12", 
        "productId": [
          {
            "name": "readcube_id", 
            "type": "PropertyValue", 
            "value": [
              "2f645a4948b9e9b01126e90d319116af5e44d2a2ce94741dd43d2de38595a6fd"
            ]
          }, 
          {
            "name": "doi", 
            "type": "PropertyValue", 
            "value": [
              "10.1186/s13362-018-0054-3"
            ]
          }, 
          {
            "name": "dimensions_id", 
            "type": "PropertyValue", 
            "value": [
              "pub.1110074207"
            ]
          }
        ], 
        "sameAs": [
          "https://doi.org/10.1186/s13362-018-0054-3", 
          "https://app.dimensions.ai/details/publication/pub.1110074207"
        ], 
        "sdDataset": "articles", 
        "sdDatePublished": "2019-04-11T08:10", 
        "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
        "sdPublisher": {
          "name": "Springer Nature - SN SciGraph project", 
          "type": "Organization"
        }, 
        "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000269_0000000269/records_56783_00000000.jsonl", 
        "type": "ScholarlyArticle", 
        "url": "https://link.springer.com/10.1186%2Fs13362-018-0054-3"
      }
    ]
     

    Download the RDF metadata as:  json-ld nt turtle xml License info

    HOW TO GET THIS DATA PROGRAMMATICALLY:

    JSON-LD is a popular format for linked data which is fully compatible with JSON.

    curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1186/s13362-018-0054-3'

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    curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1186/s13362-018-0054-3'

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    This table displays all metadata directly associated to this object as RDF triples.

    216 TRIPLES      21 PREDICATES      61 URIs      19 LITERALS      7 BLANK NODES

    Subject Predicate Object
    1 sg:pub.10.1186/s13362-018-0054-3 schema:about anzsrc-for:08
    2 anzsrc-for:0801
    3 schema:author N0f3257618d7f475ab990df7514e84b63
    4 schema:citation sg:pub.10.1007/978-1-4419-6217-1
    5 sg:pub.10.1007/978-3-319-63082-3_40
    6 sg:pub.10.1007/978-3-319-75538-0_17
    7 sg:pub.10.1007/978-3-540-71980-9_18
    8 sg:pub.10.1007/s00158-003-0337-0
    9 sg:pub.10.1007/s00158-003-0368-6
    10 sg:pub.10.1186/s13362-016-0032-6
    11 https://app.dimensions.ai/details/publication/pub.1026769747
    12 https://app.dimensions.ai/details/publication/pub.1109387602
    13 https://doi.org/10.1002/(sici)1097-007x(200003/04)28:2<131::aid-cta100>3.0.co;2-w
    14 https://doi.org/10.1002/pamm.201310246
    15 https://doi.org/10.1016/j.ifacol.2015.05.206
    16 https://doi.org/10.1016/j.matcom.2015.01.003
    17 https://doi.org/10.1016/j.paerosci.2011.05.001
    18 https://doi.org/10.1016/j.ress.2007.04.002
    19 https://doi.org/10.1016/s0045-7825(02)00421-8
    20 https://doi.org/10.1016/s1570-8659(04)13006-8
    21 https://doi.org/10.1108/03321641211209771
    22 https://doi.org/10.1108/ec-01-2015-0007
    23 https://doi.org/10.1109/4.494196
    24 https://doi.org/10.1109/emccompo.2015.7358332
    25 https://doi.org/10.1109/isemc.2017.8077849
    26 https://doi.org/10.1109/spi.2011.5898830
    27 https://doi.org/10.1109/temc.2007.897152
    28 https://doi.org/10.1109/tmag.2015.2479361
    29 https://doi.org/10.1109/tmag.2017.2750485
    30 https://doi.org/10.1109/tmtt.2003.820905
    31 https://doi.org/10.1109/tmtt.2005.862663
    32 https://doi.org/10.1109/tmtt.2010.2091205
    33 https://doi.org/10.1137/040615201
    34 https://doi.org/10.1137/110835438
    35 https://doi.org/10.2528/pierm13082802
    36 https://doi.org/10.3850/9783981537079_0776
    37 https://doi.org/10.3850/9783981537079_0998
    38 schema:datePublished 2018-12
    39 schema:datePublishedReg 2018-12-01
    40 schema:description The FP7 project nanoCOPS (the 7th Framework Programme project Nanoelectronic COupled Problems Solutions) derived new methods for simulation during development of designs of integrated products. It has covered advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It was inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. Due to the application of higher frequencies and the continuous down-scaling process, there is a higher probability of unforeseen interactions between different domains of a Radio Frequency Integrated Circuit (RFIC), which can lead to the variability of the output performance functions. Since these undesired phenomena ought to be investigated in the early phases of the integrated circuit (IC) design, in this work we formulate the robust optimization problem in terms of the expectation and the standard deviation values under the uncertainties of material parameters. Therein, the statistical information included in the multi-objective functional can be provided by a response surface model. For this purpose the Stochastic Collocation Method (SCM) combined with Polynomial Chaos Expansion (PCE) has been used. The reason for analyzing the variability of the Electromagnetic Interference (EMI) is, on the one hand, to quantify the uncertainty in an integrated Radio-Frequency Complementary Metal-Oxide Semi-Conductor (RFCMOS) transceiver design, and, on the other hand, to improve this design in a robust sense. We have illustrated our methodology for an integrated Radio-Frequency Complementary Metal-Oxide Semi-Conductor (RFCMOS) transceiver design.
    41 schema:genre research_article
    42 schema:inLanguage en
    43 schema:isAccessibleForFree true
    44 schema:isPartOf N5fb2a587b9674e0786a3c64a8f44eafa
    45 N66b181ad599e41769838be7abbc69409
    46 sg:journal.1136389
    47 schema:name Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem
    48 schema:pagination 12
    49 schema:productId N770963c72e7749f2b13672053e19cbb1
    50 Nc4d3dbb7020545b396dfaaa44b83ed0a
    51 Nda254cd830d04004a132ca2b34a7abce
    52 schema:sameAs https://app.dimensions.ai/details/publication/pub.1110074207
    53 https://doi.org/10.1186/s13362-018-0054-3
    54 schema:sdDatePublished 2019-04-11T08:10
    55 schema:sdLicense https://scigraph.springernature.com/explorer/license/
    56 schema:sdPublisher N5f186d92ea8e4acb91a15cd755addb3d
    57 schema:url https://link.springer.com/10.1186%2Fs13362-018-0054-3
    58 sgo:license sg:explorer/license/
    59 sgo:sdDataset articles
    60 rdf:type schema:ScholarlyArticle
    61 N0f3257618d7f475ab990df7514e84b63 rdf:first sg:person.012353342701.42
    62 rdf:rest N2fed5276307f4885bd4a1e3e02aa1ea8
    63 N2fed5276307f4885bd4a1e3e02aa1ea8 rdf:first sg:person.07434563223.85
    64 rdf:rest N573a8c7c47aa4f2297569fc3f26335dd
    65 N4df93e01703549d3aafa4928f6b9435f rdf:first sg:person.015024273174.77
    66 rdf:rest N62d7510397aa4d4787d8076089d782ea
    67 N573a8c7c47aa4f2297569fc3f26335dd rdf:first sg:person.015751615735.33
    68 rdf:rest N8886eb1be5a347e5b597fca78cb3449a
    69 N5f186d92ea8e4acb91a15cd755addb3d schema:name Springer Nature - SN SciGraph project
    70 rdf:type schema:Organization
    71 N5fb2a587b9674e0786a3c64a8f44eafa schema:issueNumber 1
    72 rdf:type schema:PublicationIssue
    73 N62d7510397aa4d4787d8076089d782ea rdf:first sg:person.015305627377.46
    74 rdf:rest rdf:nil
    75 N66b181ad599e41769838be7abbc69409 schema:volumeNumber 8
    76 rdf:type schema:PublicationVolume
    77 N770963c72e7749f2b13672053e19cbb1 schema:name dimensions_id
    78 schema:value pub.1110074207
    79 rdf:type schema:PropertyValue
    80 N8886eb1be5a347e5b597fca78cb3449a rdf:first sg:person.014305327261.88
    81 rdf:rest Nc6ff26b0304a4a5bb01fb0685a1d33dc
    82 Nc4d3dbb7020545b396dfaaa44b83ed0a schema:name doi
    83 schema:value 10.1186/s13362-018-0054-3
    84 rdf:type schema:PropertyValue
    85 Nc6ff26b0304a4a5bb01fb0685a1d33dc rdf:first sg:person.011450741267.01
    86 rdf:rest N4df93e01703549d3aafa4928f6b9435f
    87 Nda254cd830d04004a132ca2b34a7abce schema:name readcube_id
    88 schema:value 2f645a4948b9e9b01126e90d319116af5e44d2a2ce94741dd43d2de38595a6fd
    89 rdf:type schema:PropertyValue
    90 anzsrc-for:08 schema:inDefinedTermSet anzsrc-for:
    91 schema:name Information and Computing Sciences
    92 rdf:type schema:DefinedTerm
    93 anzsrc-for:0801 schema:inDefinedTermSet anzsrc-for:
    94 schema:name Artificial Intelligence and Image Processing
    95 rdf:type schema:DefinedTerm
    96 sg:journal.1136389 schema:issn 2190-5983
    97 schema:name Journal of Mathematics in Industry
    98 rdf:type schema:Periodical
    99 sg:person.011450741267.01 schema:affiliation https://www.grid.ac/institutes/grid.5603.0
    100 schema:familyName Pulch
    101 schema:givenName Roland
    102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011450741267.01
    103 rdf:type schema:Person
    104 sg:person.012353342701.42 schema:affiliation https://www.grid.ac/institutes/grid.5603.0
    105 schema:familyName Putek
    106 schema:givenName Piotr
    107 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012353342701.42
    108 rdf:type schema:Person
    109 sg:person.014305327261.88 schema:affiliation https://www.grid.ac/institutes/grid.7787.f
    110 schema:familyName ter Maten
    111 schema:givenName E. Jan W.
    112 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014305327261.88
    113 rdf:type schema:Person
    114 sg:person.015024273174.77 schema:affiliation https://www.grid.ac/institutes/grid.5887.2
    115 schema:familyName Tasić
    116 schema:givenName Bratislav
    117 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015024273174.77
    118 rdf:type schema:Person
    119 sg:person.015305627377.46 schema:affiliation https://www.grid.ac/institutes/grid.7787.f
    120 schema:familyName Günther
    121 schema:givenName Michael
    122 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015305627377.46
    123 rdf:type schema:Person
    124 sg:person.015751615735.33 schema:affiliation https://www.grid.ac/institutes/grid.5887.2
    125 schema:familyName Niehof
    126 schema:givenName Jan
    127 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015751615735.33
    128 rdf:type schema:Person
    129 sg:person.07434563223.85 schema:affiliation https://www.grid.ac/institutes/grid.5887.2
    130 schema:familyName Janssen
    131 schema:givenName Rick
    132 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07434563223.85
    133 rdf:type schema:Person
    134 sg:pub.10.1007/978-1-4419-6217-1 schema:sameAs https://app.dimensions.ai/details/publication/pub.1026769747
    135 https://doi.org/10.1007/978-1-4419-6217-1
    136 rdf:type schema:CreativeWork
    137 sg:pub.10.1007/978-3-319-63082-3_40 schema:sameAs https://app.dimensions.ai/details/publication/pub.1101647486
    138 https://doi.org/10.1007/978-3-319-63082-3_40
    139 rdf:type schema:CreativeWork
    140 sg:pub.10.1007/978-3-319-75538-0_17 schema:sameAs https://app.dimensions.ai/details/publication/pub.1103609197
    141 https://doi.org/10.1007/978-3-319-75538-0_17
    142 rdf:type schema:CreativeWork
    143 sg:pub.10.1007/978-3-540-71980-9_18 schema:sameAs https://app.dimensions.ai/details/publication/pub.1004467167
    144 https://doi.org/10.1007/978-3-540-71980-9_18
    145 rdf:type schema:CreativeWork
    146 sg:pub.10.1007/s00158-003-0337-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1011739617
    147 https://doi.org/10.1007/s00158-003-0337-0
    148 rdf:type schema:CreativeWork
    149 sg:pub.10.1007/s00158-003-0368-6 schema:sameAs https://app.dimensions.ai/details/publication/pub.1011264351
    150 https://doi.org/10.1007/s00158-003-0368-6
    151 rdf:type schema:CreativeWork
    152 sg:pub.10.1186/s13362-016-0032-6 schema:sameAs https://app.dimensions.ai/details/publication/pub.1007278236
    153 https://doi.org/10.1186/s13362-016-0032-6
    154 rdf:type schema:CreativeWork
    155 https://app.dimensions.ai/details/publication/pub.1026769747 schema:CreativeWork
    156 https://app.dimensions.ai/details/publication/pub.1109387602 schema:CreativeWork
    157 https://doi.org/10.1002/(sici)1097-007x(200003/04)28:2<131::aid-cta100>3.0.co;2-w schema:sameAs https://app.dimensions.ai/details/publication/pub.1047021630
    158 rdf:type schema:CreativeWork
    159 https://doi.org/10.1002/pamm.201310246 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035994796
    160 rdf:type schema:CreativeWork
    161 https://doi.org/10.1016/j.ifacol.2015.05.206 schema:sameAs https://app.dimensions.ai/details/publication/pub.1032261702
    162 rdf:type schema:CreativeWork
    163 https://doi.org/10.1016/j.matcom.2015.01.003 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029573375
    164 rdf:type schema:CreativeWork
    165 https://doi.org/10.1016/j.paerosci.2011.05.001 schema:sameAs https://app.dimensions.ai/details/publication/pub.1037733903
    166 rdf:type schema:CreativeWork
    167 https://doi.org/10.1016/j.ress.2007.04.002 schema:sameAs https://app.dimensions.ai/details/publication/pub.1005177970
    168 rdf:type schema:CreativeWork
    169 https://doi.org/10.1016/s0045-7825(02)00421-8 schema:sameAs https://app.dimensions.ai/details/publication/pub.1000311055
    170 rdf:type schema:CreativeWork
    171 https://doi.org/10.1016/s1570-8659(04)13006-8 schema:sameAs https://app.dimensions.ai/details/publication/pub.1009085775
    172 rdf:type schema:CreativeWork
    173 https://doi.org/10.1108/03321641211209771 schema:sameAs https://app.dimensions.ai/details/publication/pub.1009367480
    174 rdf:type schema:CreativeWork
    175 https://doi.org/10.1108/ec-01-2015-0007 schema:sameAs https://app.dimensions.ai/details/publication/pub.1037023431
    176 rdf:type schema:CreativeWork
    177 https://doi.org/10.1109/4.494196 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061165947
    178 rdf:type schema:CreativeWork
    179 https://doi.org/10.1109/emccompo.2015.7358332 schema:sameAs https://app.dimensions.ai/details/publication/pub.1095644106
    180 rdf:type schema:CreativeWork
    181 https://doi.org/10.1109/isemc.2017.8077849 schema:sameAs https://app.dimensions.ai/details/publication/pub.1093778310
    182 rdf:type schema:CreativeWork
    183 https://doi.org/10.1109/spi.2011.5898830 schema:sameAs https://app.dimensions.ai/details/publication/pub.1093715415
    184 rdf:type schema:CreativeWork
    185 https://doi.org/10.1109/temc.2007.897152 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061602325
    186 rdf:type schema:CreativeWork
    187 https://doi.org/10.1109/tmag.2015.2479361 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061688857
    188 rdf:type schema:CreativeWork
    189 https://doi.org/10.1109/tmag.2017.2750485 schema:sameAs https://app.dimensions.ai/details/publication/pub.1092035933
    190 rdf:type schema:CreativeWork
    191 https://doi.org/10.1109/tmtt.2003.820905 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061706075
    192 rdf:type schema:CreativeWork
    193 https://doi.org/10.1109/tmtt.2005.862663 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061706953
    194 rdf:type schema:CreativeWork
    195 https://doi.org/10.1109/tmtt.2010.2091205 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061709062
    196 rdf:type schema:CreativeWork
    197 https://doi.org/10.1137/040615201 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062845261
    198 rdf:type schema:CreativeWork
    199 https://doi.org/10.1137/110835438 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062864972
    200 rdf:type schema:CreativeWork
    201 https://doi.org/10.2528/pierm13082802 schema:sameAs https://app.dimensions.ai/details/publication/pub.1070911574
    202 rdf:type schema:CreativeWork
    203 https://doi.org/10.3850/9783981537079_0776 schema:sameAs https://app.dimensions.ai/details/publication/pub.1099252626
    204 rdf:type schema:CreativeWork
    205 https://doi.org/10.3850/9783981537079_0998 schema:sameAs https://app.dimensions.ai/details/publication/pub.1099252671
    206 rdf:type schema:CreativeWork
    207 https://www.grid.ac/institutes/grid.5603.0 schema:alternateName University of Greifswald
    208 schema:name Bergische Universität Wuppertal, Wuppertal, Germany
    209 Ernst-Moritz-Arndt-Universität Greifswald, Greifswald, Germany
    210 rdf:type schema:Organization
    211 https://www.grid.ac/institutes/grid.5887.2 schema:alternateName NXP (Netherlands)
    212 schema:name NXP Semiconductors, Eindhoven, The Netherlands
    213 rdf:type schema:Organization
    214 https://www.grid.ac/institutes/grid.7787.f schema:alternateName University of Wuppertal
    215 schema:name Bergische Universität Wuppertal, Wuppertal, Germany
    216 rdf:type schema:Organization
     




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