Ontology type: schema:ScholarlyArticle
2005-11
AUTHORSS. Soriano, T. Gourieux, A. Stunault, K. Dumesnil, C. Dufour
ABSTRACT.In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film. More... »
PAGES167-171
http://scigraph.springernature.com/pub.10.1140/epjb/e2005-00400-4
DOIhttp://dx.doi.org/10.1140/epjb/e2005-00400-4
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