A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2005-11

AUTHORS

S. Soriano, T. Gourieux, A. Stunault, K. Dumesnil, C. Dufour

ABSTRACT

.In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film. More... »

PAGES

167-171

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1140/epjb/e2005-00400-4

DOI

http://dx.doi.org/10.1140/epjb/e2005-00400-4

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1038801619


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