A study of distributed dielectric bragg reflectors for vertically emitting lasers of the near-IR range View Full Text


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Article Info

DATE

2016-10

AUTHORS

S. A. Blokhin, M. A. Bobrov, A. G. Kuzmenkov, A. A. Blokhin, A. P. Vasil’ev, Yu. A. Guseva, M. M. Kulagina, I. O. Karpovsky, Yu. M. Zadiranov, S. I. Troshkov, N. D. Prasolov, P. N. Brunkov, V. S. Levitsky, V. Lisak, N. A. Maleev, V. M. Ustinov

ABSTRACT

Studies aimed at optimization of the design of a dielectric distributed Bragg reflector (DBR) produced by the reactive magnetron sputtering method for applications in near-IR vertical-cavity surface-emitting lasers with intracavity contacts (ICC-VCSELs) are carried out. It is shown that the reflectivity of the dielectric DBRs based on SiO2/TiO2 decreases due to the polycrystalline structure of the TiO2 layers, which causes diffusive scattering of light. In contrast, amorphous Ta2O5 layers is characterized by a low surface roughness and low fluctuation in the refractive index. Single-mode ICC-VCSELs in the 980-nm spectral range with dielectric DBR based on SiO2/Ta2O5 with a threshold current less than 0.27 mA, electric resistance of less than 200 Ω, and differential efficiency of more than 0.8 W/A are demonstrated. More... »

PAGES

1049-1053

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063785016100199

DOI

http://dx.doi.org/10.1134/s1063785016100199

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1012657423


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Blokhin", 
        "givenName": "S. A.", 
        "id": "sg:person.015244136173.28", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015244136173.28"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bobrov", 
        "givenName": "M. A.", 
        "id": "sg:person.016652543020.09", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016652543020.09"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.4886.2", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kuzmenkov", 
        "givenName": "A. G.", 
        "id": "sg:person.013204674115.84", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013204674115.84"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Blokhin", 
        "givenName": "A. A.", 
        "id": "sg:person.07355752320.43", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07355752320.43"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.4886.2", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Vasil\u2019ev", 
        "givenName": "A. P.", 
        "id": "sg:person.014334030356.12", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014334030356.12"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Guseva", 
        "givenName": "Yu. A.", 
        "id": "sg:person.010014017535.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010014017535.87"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kulagina", 
        "givenName": "M. M.", 
        "id": "sg:person.07410421673.58", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07410421673.58"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "St. Petersburg State Electrotechnical University (LETI), 197376, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.15447.33", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "St. Petersburg State Electrotechnical University (LETI), 197376, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Karpovsky", 
        "givenName": "I. O.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Zadiranov", 
        "givenName": "Yu. M.", 
        "id": "sg:person.014121041567.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014121041567.87"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Troshkov", 
        "givenName": "S. I.", 
        "id": "sg:person.01126063542.10", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01126063542.10"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35915.3b", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Prasolov", 
        "givenName": "N. D.", 
        "id": "sg:person.014305335245.24", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014305335245.24"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35915.3b", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Brunkov", 
        "givenName": "P. N.", 
        "id": "sg:person.011771360023.05", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011771360023.05"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Scientific and Technological Center of Thin-Film Technologies in Power Engineering, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Scientific and Technological Center of Thin-Film Technologies in Power Engineering, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Levitsky", 
        "givenName": "V. S.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35915.3b", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lisak", 
        "givenName": "V.", 
        "id": "sg:person.013323614154.02", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013323614154.02"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Maleev", 
        "givenName": "N. A.", 
        "id": "sg:person.011317077151.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011317077151.34"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.4886.2", 
          "name": [
            "Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ustinov", 
        "givenName": "V. M.", 
        "id": "sg:person.012211352412.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012211352412.34"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/s1063783413030293", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1046346977", 
          "https://doi.org/10.1134/s1063783413030293"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/978-3-642-24986-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1038785038", 
          "https://doi.org/10.1007/978-3-642-24986-0"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063782613070166", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1044532107", 
          "https://doi.org/10.1134/s1063782613070166"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2016-10", 
    "datePublishedReg": "2016-10-01", 
    "description": "Studies aimed at optimization of the design of a dielectric distributed Bragg reflector (DBR) produced by the reactive magnetron sputtering method for applications in near-IR vertical-cavity surface-emitting lasers with intracavity contacts (ICC-VCSELs) are carried out. It is shown that the reflectivity of the dielectric DBRs based on SiO2/TiO2 decreases due to the polycrystalline structure of the TiO2 layers, which causes diffusive scattering of light. In contrast, amorphous Ta2O5 layers is characterized by a low surface roughness and low fluctuation in the refractive index. Single-mode ICC-VCSELs in the 980-nm spectral range with dielectric DBR based on SiO2/Ta2O5 with a threshold current less than 0.27 mA, electric resistance of less than 200 \u03a9, and differential efficiency of more than 0.8 W/A are demonstrated.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063785016100199", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136630", 
        "issn": [
          "0320-0116", 
          "0360-120X"
        ], 
        "name": "Technical Physics Letters", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "10", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "42"
      }
    ], 
    "keywords": [
      "SiO2/TiO2", 
      "near-IR range", 
      "reactive magnetron sputtering method", 
      "TiO2 layer", 
      "SiO2/Ta2O5", 
      "low surface roughness", 
      "polycrystalline structure", 
      "Bragg reflectors", 
      "magnetron sputtering method", 
      "vertical-cavity surface-emitting lasers", 
      "sputtering method", 
      "surface-emitting lasers", 
      "dielectric DBR", 
      "surface roughness", 
      "spectral range", 
      "refractive index", 
      "electric resistance", 
      "dielectric Bragg reflectors", 
      "TiO2", 
      "Ta2O5 layer", 
      "study", 
      "intracavity contacts", 
      "diffusive scattering", 
      "Ta2O5", 
      "layer", 
      "differential efficiency", 
      "dielectric", 
      "laser", 
      "index", 
      "range", 
      "DBR", 
      "structure", 
      "scattering", 
      "roughness", 
      "contrast", 
      "reflector", 
      "resistance", 
      "threshold", 
      "applications", 
      "reflectivity", 
      "efficiency", 
      "contact", 
      "light", 
      "method", 
      "low fluctuations", 
      "fluctuations", 
      "optimization", 
      "design", 
      "IR vertical-cavity surface-emitting lasers", 
      "amorphous Ta2O5 layers", 
      "Single-mode ICC-VCSELs", 
      "ICC-VCSELs"
    ], 
    "name": "A study of distributed dielectric bragg reflectors for vertically emitting lasers of the near-IR range", 
    "pagination": "1049-1053", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1012657423"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063785016100199"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063785016100199", 
      "https://app.dimensions.ai/details/publication/pub.1012657423"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-01-01T18:42", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220101/entities/gbq_results/article/article_710.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063785016100199"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

240 TRIPLES      22 PREDICATES      81 URIs      70 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063785016100199 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N50e1a17487a44a33809626fd09e33cda
4 schema:citation sg:pub.10.1007/978-3-642-24986-0
5 sg:pub.10.1134/s1063782613070166
6 sg:pub.10.1134/s1063783413030293
7 schema:datePublished 2016-10
8 schema:datePublishedReg 2016-10-01
9 schema:description Studies aimed at optimization of the design of a dielectric distributed Bragg reflector (DBR) produced by the reactive magnetron sputtering method for applications in near-IR vertical-cavity surface-emitting lasers with intracavity contacts (ICC-VCSELs) are carried out. It is shown that the reflectivity of the dielectric DBRs based on SiO2/TiO2 decreases due to the polycrystalline structure of the TiO2 layers, which causes diffusive scattering of light. In contrast, amorphous Ta2O5 layers is characterized by a low surface roughness and low fluctuation in the refractive index. Single-mode ICC-VCSELs in the 980-nm spectral range with dielectric DBR based on SiO2/Ta2O5 with a threshold current less than 0.27 mA, electric resistance of less than 200 Ω, and differential efficiency of more than 0.8 W/A are demonstrated.
10 schema:genre article
11 schema:inLanguage en
12 schema:isAccessibleForFree false
13 schema:isPartOf N3a4093e93ab34f6b81cf9d2d563a7e51
14 N5b8ca053670143c590d7670d08ec577b
15 sg:journal.1136630
16 schema:keywords Bragg reflectors
17 DBR
18 ICC-VCSELs
19 IR vertical-cavity surface-emitting lasers
20 SiO2/Ta2O5
21 SiO2/TiO2
22 Single-mode ICC-VCSELs
23 Ta2O5
24 Ta2O5 layer
25 TiO2
26 TiO2 layer
27 amorphous Ta2O5 layers
28 applications
29 contact
30 contrast
31 design
32 dielectric
33 dielectric Bragg reflectors
34 dielectric DBR
35 differential efficiency
36 diffusive scattering
37 efficiency
38 electric resistance
39 fluctuations
40 index
41 intracavity contacts
42 laser
43 layer
44 light
45 low fluctuations
46 low surface roughness
47 magnetron sputtering method
48 method
49 near-IR range
50 optimization
51 polycrystalline structure
52 range
53 reactive magnetron sputtering method
54 reflectivity
55 reflector
56 refractive index
57 resistance
58 roughness
59 scattering
60 spectral range
61 sputtering method
62 structure
63 study
64 surface roughness
65 surface-emitting lasers
66 threshold
67 vertical-cavity surface-emitting lasers
68 schema:name A study of distributed dielectric bragg reflectors for vertically emitting lasers of the near-IR range
69 schema:pagination 1049-1053
70 schema:productId N09b3f01b04804838b02d31a03e2434f9
71 Nf70b6db8f1974842adef89f7d80624c9
72 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012657423
73 https://doi.org/10.1134/s1063785016100199
74 schema:sdDatePublished 2022-01-01T18:42
75 schema:sdLicense https://scigraph.springernature.com/explorer/license/
76 schema:sdPublisher N15a7e980e0cd474aaac7b3dc963bf69b
77 schema:url https://doi.org/10.1134/s1063785016100199
78 sgo:license sg:explorer/license/
79 sgo:sdDataset articles
80 rdf:type schema:ScholarlyArticle
81 N09b3f01b04804838b02d31a03e2434f9 schema:name dimensions_id
82 schema:value pub.1012657423
83 rdf:type schema:PropertyValue
84 N0f7b6c9aed7048f6bbec51ca0ba710c0 rdf:first sg:person.013204674115.84
85 rdf:rest N9c71b5a03c7f4679b39b84d91be9d134
86 N15a7e980e0cd474aaac7b3dc963bf69b schema:name Springer Nature - SN SciGraph project
87 rdf:type schema:Organization
88 N1e73b972be6d4075b64040bb705cc2dc rdf:first Nd16fb36e42fd433c93983e9f1150b6c7
89 rdf:rest Nfc1e96fa5ba24c6b992af7889554f959
90 N2ca86319767f448bae86a15a57b9e557 rdf:first sg:person.012211352412.34
91 rdf:rest rdf:nil
92 N3a4093e93ab34f6b81cf9d2d563a7e51 schema:volumeNumber 42
93 rdf:type schema:PublicationVolume
94 N50e1a17487a44a33809626fd09e33cda rdf:first sg:person.015244136173.28
95 rdf:rest N7455f42f3c2543d2908dfba444c9ba44
96 N5b8ca053670143c590d7670d08ec577b schema:issueNumber 10
97 rdf:type schema:PublicationIssue
98 N5bc8ef45233a4e5baf46fe0216294348 rdf:first sg:person.014305335245.24
99 rdf:rest Nc235fc8700c540d2bc32cc130a20f04b
100 N6c6cd94fb97c4f788169014b33b416d4 rdf:first sg:person.010014017535.87
101 rdf:rest N6f7cb656ee7c4d9eb11d3a5e9fd4996f
102 N6f7cb656ee7c4d9eb11d3a5e9fd4996f rdf:first sg:person.07410421673.58
103 rdf:rest N9a426e4d0e36412cb8b9ed9bc824fba1
104 N7455f42f3c2543d2908dfba444c9ba44 rdf:first sg:person.016652543020.09
105 rdf:rest N0f7b6c9aed7048f6bbec51ca0ba710c0
106 N84d081aee09845249ff62b5df3f1dea4 rdf:first sg:person.01126063542.10
107 rdf:rest N5bc8ef45233a4e5baf46fe0216294348
108 N8d1a9933a5a44b8eadfb99cde7ddbc8d rdf:first sg:person.014334030356.12
109 rdf:rest N6c6cd94fb97c4f788169014b33b416d4
110 N9a426e4d0e36412cb8b9ed9bc824fba1 rdf:first Ne7a05b272bd7431288cf3de1326a1658
111 rdf:rest Nb3c18f66c78340fa9278d8cdb21cdd24
112 N9c71b5a03c7f4679b39b84d91be9d134 rdf:first sg:person.07355752320.43
113 rdf:rest N8d1a9933a5a44b8eadfb99cde7ddbc8d
114 Nb3c18f66c78340fa9278d8cdb21cdd24 rdf:first sg:person.014121041567.87
115 rdf:rest N84d081aee09845249ff62b5df3f1dea4
116 Nc235fc8700c540d2bc32cc130a20f04b rdf:first sg:person.011771360023.05
117 rdf:rest N1e73b972be6d4075b64040bb705cc2dc
118 Nd16fb36e42fd433c93983e9f1150b6c7 schema:affiliation grid-institutes:None
119 schema:familyName Levitsky
120 schema:givenName V. S.
121 rdf:type schema:Person
122 Ne7a05b272bd7431288cf3de1326a1658 schema:affiliation grid-institutes:grid.15447.33
123 schema:familyName Karpovsky
124 schema:givenName I. O.
125 rdf:type schema:Person
126 Nf11829f240974e9a9673292a1e88b5c6 rdf:first sg:person.011317077151.34
127 rdf:rest N2ca86319767f448bae86a15a57b9e557
128 Nf70b6db8f1974842adef89f7d80624c9 schema:name doi
129 schema:value 10.1134/s1063785016100199
130 rdf:type schema:PropertyValue
131 Nfc1e96fa5ba24c6b992af7889554f959 rdf:first sg:person.013323614154.02
132 rdf:rest Nf11829f240974e9a9673292a1e88b5c6
133 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
134 schema:name Physical Sciences
135 rdf:type schema:DefinedTerm
136 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
137 schema:name Other Physical Sciences
138 rdf:type schema:DefinedTerm
139 sg:journal.1136630 schema:issn 0320-0116
140 0360-120X
141 schema:name Technical Physics Letters
142 schema:publisher Pleiades Publishing
143 rdf:type schema:Periodical
144 sg:person.010014017535.87 schema:affiliation grid-institutes:grid.423485.c
145 schema:familyName Guseva
146 schema:givenName Yu. A.
147 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010014017535.87
148 rdf:type schema:Person
149 sg:person.01126063542.10 schema:affiliation grid-institutes:grid.423485.c
150 schema:familyName Troshkov
151 schema:givenName S. I.
152 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01126063542.10
153 rdf:type schema:Person
154 sg:person.011317077151.34 schema:affiliation grid-institutes:grid.423485.c
155 schema:familyName Maleev
156 schema:givenName N. A.
157 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011317077151.34
158 rdf:type schema:Person
159 sg:person.011771360023.05 schema:affiliation grid-institutes:grid.35915.3b
160 schema:familyName Brunkov
161 schema:givenName P. N.
162 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011771360023.05
163 rdf:type schema:Person
164 sg:person.012211352412.34 schema:affiliation grid-institutes:grid.4886.2
165 schema:familyName Ustinov
166 schema:givenName V. M.
167 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012211352412.34
168 rdf:type schema:Person
169 sg:person.013204674115.84 schema:affiliation grid-institutes:grid.4886.2
170 schema:familyName Kuzmenkov
171 schema:givenName A. G.
172 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013204674115.84
173 rdf:type schema:Person
174 sg:person.013323614154.02 schema:affiliation grid-institutes:grid.35915.3b
175 schema:familyName Lisak
176 schema:givenName V.
177 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013323614154.02
178 rdf:type schema:Person
179 sg:person.014121041567.87 schema:affiliation grid-institutes:grid.423485.c
180 schema:familyName Zadiranov
181 schema:givenName Yu. M.
182 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014121041567.87
183 rdf:type schema:Person
184 sg:person.014305335245.24 schema:affiliation grid-institutes:grid.35915.3b
185 schema:familyName Prasolov
186 schema:givenName N. D.
187 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014305335245.24
188 rdf:type schema:Person
189 sg:person.014334030356.12 schema:affiliation grid-institutes:grid.4886.2
190 schema:familyName Vasil’ev
191 schema:givenName A. P.
192 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014334030356.12
193 rdf:type schema:Person
194 sg:person.015244136173.28 schema:affiliation grid-institutes:grid.423485.c
195 schema:familyName Blokhin
196 schema:givenName S. A.
197 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015244136173.28
198 rdf:type schema:Person
199 sg:person.016652543020.09 schema:affiliation grid-institutes:grid.423485.c
200 schema:familyName Bobrov
201 schema:givenName M. A.
202 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016652543020.09
203 rdf:type schema:Person
204 sg:person.07355752320.43 schema:affiliation grid-institutes:grid.423485.c
205 schema:familyName Blokhin
206 schema:givenName A. A.
207 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07355752320.43
208 rdf:type schema:Person
209 sg:person.07410421673.58 schema:affiliation grid-institutes:grid.423485.c
210 schema:familyName Kulagina
211 schema:givenName M. M.
212 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07410421673.58
213 rdf:type schema:Person
214 sg:pub.10.1007/978-3-642-24986-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1038785038
215 https://doi.org/10.1007/978-3-642-24986-0
216 rdf:type schema:CreativeWork
217 sg:pub.10.1134/s1063782613070166 schema:sameAs https://app.dimensions.ai/details/publication/pub.1044532107
218 https://doi.org/10.1134/s1063782613070166
219 rdf:type schema:CreativeWork
220 sg:pub.10.1134/s1063783413030293 schema:sameAs https://app.dimensions.ai/details/publication/pub.1046346977
221 https://doi.org/10.1134/s1063783413030293
222 rdf:type schema:CreativeWork
223 grid-institutes:None schema:alternateName Scientific and Technological Center of Thin-Film Technologies in Power Engineering, 194021, St. Petersburg, Russia
224 schema:name Scientific and Technological Center of Thin-Film Technologies in Power Engineering, 194021, St. Petersburg, Russia
225 rdf:type schema:Organization
226 grid-institutes:grid.15447.33 schema:alternateName St. Petersburg State Electrotechnical University (LETI), 197376, St. Petersburg, Russia
227 schema:name Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
228 St. Petersburg State Electrotechnical University (LETI), 197376, St. Petersburg, Russia
229 rdf:type schema:Organization
230 grid-institutes:grid.35915.3b schema:alternateName St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia
231 schema:name Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
232 St. Petersburg ITMO National Research University of Information Technologies, Mechanics, and Optics (ITMO University), 197101, St. Petersburg, Russia
233 rdf:type schema:Organization
234 grid-institutes:grid.423485.c schema:alternateName Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
235 schema:name Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
236 rdf:type schema:Organization
237 grid-institutes:grid.4886.2 schema:alternateName Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia
238 schema:name Ioffe Physical Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
239 Scientific and Technological Center of Microelectronics and Submicron Heterostructures, Russian Academy of Sciences, 194021, St. Petersburg, Russia
240 rdf:type schema:Organization
 




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