The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction View Full Text


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Article Info

DATE

2014-10

AUTHORS

R. N. Kyutt, S. V. Ivanov

ABSTRACT

Three-beam X-ray diffraction (XRD) has been measured using the Renninger scheme in epitaxial ZnO layers with various thicknesses and degrees of crystal perfection. The integral intensity of three-beam XRD reflections has been analyzed and compared to that of two-beam reflections in the Bragg and Laue geometry. It is established that, for thin ZnO layers grown in the presence of excess oxygen, the integral intensity of three-beam diffraction peaks and Laue reflections is much smaller than that for layers of the same thickness grown in the presence of excess zinc. This fact is explained by the formation of a textured sublayer in the former case. More... »

PAGES

894-896

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s106378501410023x

DOI

http://dx.doi.org/10.1134/s106378501410023x

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1041680295


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