Using atomic-step-structured 6H-SiC(0001) surfaces for the calibration of nanotranslations in scanning probe microscopy View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2009-01

AUTHORS

M. S. Dunaevskii, I. V. Makarenko, V. N. Petrov, A. A. Lebedev, S. P. Lebedev, A. N. Titkov

ABSTRACT

The silicon surfaces of 6H-SiC(0001) single crystals subjected to stepwise high-temperature annealing in vacuum have been studied by atomic force microscopy and scanning tunneling microscopy techniques. A special annealing procedure is proposed that yields a structured surface featuring regular atomicsmooth steps with heights of 0.75 and 1.5 nm. We propose using these structured crystal surfaces for calibrating vertical translations in scanning probe microscopes. More... »

PAGES

47-49

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063785009010143

DOI

http://dx.doi.org/10.1134/s1063785009010143

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1043407056


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