Optical properties of thin epitaxial Ba0.8Sr0.2TiO3 films View Full Text


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Article Info

DATE

2012-07-17

AUTHORS

V. B. Shirokov, Yu. I. Golovko, V. M. Mukhortov

ABSTRACT

The properties of nanodimensional (Ba0.8, Sr0.2)TiO3 films on single-crystal magnesia substrates are studied. The films are applied by rf sputtering and grow in the layer-by-layer mode. The lattice parameters are measured by the X-ray diffraction method. The transmission of the films with different thicknesses is studied in the wavelength range 190–1100 nm. When analyzing experimental optical parameters, additional relaxation parameters depicting a final lifetime of the oscillator are used to characterize the refractive index and absorption factor in the dispersion relation. Such an approach allows a more accurate approximation of experimental data. More... »

PAGES

975-980

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063784212070195

DOI

http://dx.doi.org/10.1134/s1063784212070195

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1007090102


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Southern Federal University, ul. Zorge 5, 344090, Rostov-on-Don, Russia", 
          "id": "http://www.grid.ac/institutes/grid.182798.d", 
          "name": [
            "Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia", 
            "Southern Federal University, ul. Zorge 5, 344090, Rostov-on-Don, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Shirokov", 
        "givenName": "V. B.", 
        "id": "sg:person.010257455245.19", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010257455245.19"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia", 
          "id": "http://www.grid.ac/institutes/grid.465325.3", 
          "name": [
            "Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Golovko", 
        "givenName": "Yu. I.", 
        "id": "sg:person.010264502162.46", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010264502162.46"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia", 
          "id": "http://www.grid.ac/institutes/grid.465325.3", 
          "name": [
            "Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Mukhortov", 
        "givenName": "V. M.", 
        "id": "sg:person.015506643423.75", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015506643423.75"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1007/s00340-003-1292-6", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1033119132", 
          "https://doi.org/10.1007/s00340-003-1292-6"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2012-07-17", 
    "datePublishedReg": "2012-07-17", 
    "description": "The properties of nanodimensional (Ba0.8, Sr0.2)TiO3 films on single-crystal magnesia substrates are studied. The films are applied by rf sputtering and grow in the layer-by-layer mode. The lattice parameters are measured by the X-ray diffraction method. The transmission of the films with different thicknesses is studied in the wavelength range 190\u20131100 nm. When analyzing experimental optical parameters, additional relaxation parameters depicting a final lifetime of the oscillator are used to characterize the refractive index and absorption factor in the dispersion relation. Such an approach allows a more accurate approximation of experimental data.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063784212070195", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136240", 
        "issn": [
          "1063-7842", 
          "1090-6525"
        ], 
        "name": "Technical Physics", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "7", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "57"
      }
    ], 
    "keywords": [
      "experimental optical parameters", 
      "wavelength range 190", 
      "optical parameters", 
      "refractive index", 
      "optical properties", 
      "dispersion relation", 
      "magnesia substrates", 
      "RF sputtering", 
      "range 190", 
      "layer mode", 
      "X-ray diffraction methods", 
      "accurate approximation", 
      "absorption factor", 
      "films", 
      "lattice parameters", 
      "different thicknesses", 
      "diffraction methods", 
      "relaxation parameters", 
      "experimental data", 
      "final lifetime", 
      "sputtering", 
      "oscillator", 
      "approximation", 
      "parameters", 
      "lifetime", 
      "properties", 
      "mode", 
      "substrate", 
      "thickness", 
      "layer", 
      "transmission", 
      "approach", 
      "method", 
      "relation", 
      "index", 
      "data", 
      "factors"
    ], 
    "name": "Optical properties of thin epitaxial Ba0.8Sr0.2TiO3 films", 
    "pagination": "975-980", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1007090102"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063784212070195"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063784212070195", 
      "https://app.dimensions.ai/details/publication/pub.1007090102"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-11-24T20:55", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20221124/entities/gbq_results/article/article_562.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063784212070195"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

112 TRIPLES      21 PREDICATES      61 URIs      53 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063784212070195 schema:about anzsrc-for:02
2 schema:author Nca80c2bf357f46a6b69f84895f923e8c
3 schema:citation sg:pub.10.1007/s00340-003-1292-6
4 schema:datePublished 2012-07-17
5 schema:datePublishedReg 2012-07-17
6 schema:description The properties of nanodimensional (Ba0.8, Sr0.2)TiO3 films on single-crystal magnesia substrates are studied. The films are applied by rf sputtering and grow in the layer-by-layer mode. The lattice parameters are measured by the X-ray diffraction method. The transmission of the films with different thicknesses is studied in the wavelength range 190–1100 nm. When analyzing experimental optical parameters, additional relaxation parameters depicting a final lifetime of the oscillator are used to characterize the refractive index and absorption factor in the dispersion relation. Such an approach allows a more accurate approximation of experimental data.
7 schema:genre article
8 schema:isAccessibleForFree false
9 schema:isPartOf Na5987235a0474cb886014af6a2083a5a
10 Ndc835f412fbf4eed8a8401cb82ad387c
11 sg:journal.1136240
12 schema:keywords RF sputtering
13 X-ray diffraction methods
14 absorption factor
15 accurate approximation
16 approach
17 approximation
18 data
19 different thicknesses
20 diffraction methods
21 dispersion relation
22 experimental data
23 experimental optical parameters
24 factors
25 films
26 final lifetime
27 index
28 lattice parameters
29 layer
30 layer mode
31 lifetime
32 magnesia substrates
33 method
34 mode
35 optical parameters
36 optical properties
37 oscillator
38 parameters
39 properties
40 range 190
41 refractive index
42 relation
43 relaxation parameters
44 sputtering
45 substrate
46 thickness
47 transmission
48 wavelength range 190
49 schema:name Optical properties of thin epitaxial Ba0.8Sr0.2TiO3 films
50 schema:pagination 975-980
51 schema:productId N38f352586bdf462e8a9fbb385dd21bfc
52 Nf763b84ccd8046f0b96e62978b5d96a1
53 schema:sameAs https://app.dimensions.ai/details/publication/pub.1007090102
54 https://doi.org/10.1134/s1063784212070195
55 schema:sdDatePublished 2022-11-24T20:55
56 schema:sdLicense https://scigraph.springernature.com/explorer/license/
57 schema:sdPublisher N3eed21fe3b7b493fb7d9a4e2cab7a201
58 schema:url https://doi.org/10.1134/s1063784212070195
59 sgo:license sg:explorer/license/
60 sgo:sdDataset articles
61 rdf:type schema:ScholarlyArticle
62 N2590e69af0e149c28325c3c335858a6a rdf:first sg:person.010264502162.46
63 rdf:rest Nf83f02f238f14d21a28653a0bed6c9ca
64 N38f352586bdf462e8a9fbb385dd21bfc schema:name doi
65 schema:value 10.1134/s1063784212070195
66 rdf:type schema:PropertyValue
67 N3eed21fe3b7b493fb7d9a4e2cab7a201 schema:name Springer Nature - SN SciGraph project
68 rdf:type schema:Organization
69 Na5987235a0474cb886014af6a2083a5a schema:volumeNumber 57
70 rdf:type schema:PublicationVolume
71 Nca80c2bf357f46a6b69f84895f923e8c rdf:first sg:person.010257455245.19
72 rdf:rest N2590e69af0e149c28325c3c335858a6a
73 Ndc835f412fbf4eed8a8401cb82ad387c schema:issueNumber 7
74 rdf:type schema:PublicationIssue
75 Nf763b84ccd8046f0b96e62978b5d96a1 schema:name dimensions_id
76 schema:value pub.1007090102
77 rdf:type schema:PropertyValue
78 Nf83f02f238f14d21a28653a0bed6c9ca rdf:first sg:person.015506643423.75
79 rdf:rest rdf:nil
80 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
81 schema:name Physical Sciences
82 rdf:type schema:DefinedTerm
83 sg:journal.1136240 schema:issn 1063-7842
84 1090-6525
85 schema:name Technical Physics
86 schema:publisher Pleiades Publishing
87 rdf:type schema:Periodical
88 sg:person.010257455245.19 schema:affiliation grid-institutes:grid.182798.d
89 schema:familyName Shirokov
90 schema:givenName V. B.
91 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010257455245.19
92 rdf:type schema:Person
93 sg:person.010264502162.46 schema:affiliation grid-institutes:grid.465325.3
94 schema:familyName Golovko
95 schema:givenName Yu. I.
96 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010264502162.46
97 rdf:type schema:Person
98 sg:person.015506643423.75 schema:affiliation grid-institutes:grid.465325.3
99 schema:familyName Mukhortov
100 schema:givenName V. M.
101 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015506643423.75
102 rdf:type schema:Person
103 sg:pub.10.1007/s00340-003-1292-6 schema:sameAs https://app.dimensions.ai/details/publication/pub.1033119132
104 https://doi.org/10.1007/s00340-003-1292-6
105 rdf:type schema:CreativeWork
106 grid-institutes:grid.182798.d schema:alternateName Southern Federal University, ul. Zorge 5, 344090, Rostov-on-Don, Russia
107 schema:name Southern Federal University, ul. Zorge 5, 344090, Rostov-on-Don, Russia
108 Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia
109 rdf:type schema:Organization
110 grid-institutes:grid.465325.3 schema:alternateName Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia
111 schema:name Southern Scientific Center, Russian Academy of Sciences, ul. Chekhova 41, 344006, Rostov-on-Don, Russia
112 rdf:type schema:Organization
 




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