Determination of the specific ion erosion of the vacuum arc cathode by measuring the total ion current from the discharge ... View Full Text


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Article Info

DATE

2006-10

AUTHORS

A. Anders, E. M. Oks, G. Yu. Yushkov, K. P. Savkin, Y. Brown, A. G. Nikolaev

ABSTRACT

The specific ion erosion γi of cathodes made of C, Mg, Al, Ti, Co, Cu, Y, Mo, Cd, Sm, Ta, W, Pt, Pb, and Bi is determined by measuring the total ion current from the vacuum arc plasma. It is demonstrated that the ratio of the total ion current to the discharge current, αi in a vacuum arc varies from 5 to 19%, depending on the cathode material. It is found experimentally that the ion current fraction αi is inversely proportional to the atomic bond energy of the cathode material. It is shown that an increase in the total ion current extracted from the discharge plasma when applying an external magnetic field to the cathode region of the discharge is related solely to the appearance of ions with higher charge numbers in the plasma, while the magnitude of the specific ion erosion γi remains unchanged. More... »

PAGES

1311-1315

References to SciGraph publications

  • 2002. Cohesive Energy Rule for Vacuum Arcs in EMERGING APPLICATIONS OF VACUUM-ARC-PRODUCED PLASMA, ION AND ELECTRON BEAMS
  • Identifiers

    URI

    http://scigraph.springernature.com/pub.10.1134/s1063784206100082

    DOI

    http://dx.doi.org/10.1134/s1063784206100082

    DIMENSIONS

    https://app.dimensions.ai/details/publication/pub.1013168340


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    [
      {
        "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
        "about": [
          {
            "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0202", 
            "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
            "name": "Atomic, Molecular, Nuclear, Particle and Plasma Physics", 
            "type": "DefinedTerm"
          }, 
          {
            "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
            "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
            "name": "Physical Sciences", 
            "type": "DefinedTerm"
          }
        ], 
        "author": [
          {
            "affiliation": {
              "alternateName": "Lawrence Berkeley National Laboratory", 
              "id": "https://www.grid.ac/institutes/grid.184769.5", 
              "name": [
                "Lawrence Berkeley National Laboratory, University of California, Berkeley, California, USA"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Anders", 
            "givenName": "A.", 
            "id": "sg:person.0663645411.05", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0663645411.05"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Institute of High Current Electronics", 
              "id": "https://www.grid.ac/institutes/grid.465280.d", 
              "name": [
                "Institute of High-Current Electronics, Siberian Division, Russian Academy of Sciences, Akademicheski\u012d pr. 4, 634055, Tomsk, Russia"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Oks", 
            "givenName": "E. M.", 
            "id": "sg:person.01150713152.97", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01150713152.97"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Institute of High Current Electronics", 
              "id": "https://www.grid.ac/institutes/grid.465280.d", 
              "name": [
                "Institute of High-Current Electronics, Siberian Division, Russian Academy of Sciences, Akademicheski\u012d pr. 4, 634055, Tomsk, Russia"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Yushkov", 
            "givenName": "G. Yu.", 
            "id": "sg:person.01042471647.94", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01042471647.94"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Institute of High Current Electronics", 
              "id": "https://www.grid.ac/institutes/grid.465280.d", 
              "name": [
                "Institute of High-Current Electronics, Siberian Division, Russian Academy of Sciences, Akademicheski\u012d pr. 4, 634055, Tomsk, Russia"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Savkin", 
            "givenName": "K. P.", 
            "id": "sg:person.0726243247.19", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0726243247.19"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Lawrence Berkeley National Laboratory", 
              "id": "https://www.grid.ac/institutes/grid.184769.5", 
              "name": [
                "Lawrence Berkeley National Laboratory, University of California, Berkeley, California, USA"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Brown", 
            "givenName": "Y.", 
            "id": "sg:person.010346423153.84", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010346423153.84"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Institute of High Current Electronics", 
              "id": "https://www.grid.ac/institutes/grid.465280.d", 
              "name": [
                "Institute of High-Current Electronics, Siberian Division, Russian Academy of Sciences, Akademicheski\u012d pr. 4, 634055, Tomsk, Russia"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Nikolaev", 
            "givenName": "A. G.", 
            "id": "sg:person.015023324273.69", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015023324273.69"
            ], 
            "type": "Person"
          }
        ], 
        "citation": [
          {
            "id": "https://doi.org/10.1088/0022-3727/8/14/009", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1013835238"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-94-010-0277-6_1", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1048122639", 
              "https://doi.org/10.1007/978-94-010-0277-6_1"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/978-94-010-0277-6_1", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1048122639", 
              "https://doi.org/10.1007/978-94-010-0277-6_1"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1063/1.1468271", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1057709653"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1063/1.1662710", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1057741062"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.1063/1.322043", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1057920180"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "https://doi.org/10.3367/ufnr.0172.200210a.1113", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1071219910"
            ], 
            "type": "CreativeWork"
          }
        ], 
        "datePublished": "2006-10", 
        "datePublishedReg": "2006-10-01", 
        "description": "The specific ion erosion \u03b3i of cathodes made of C, Mg, Al, Ti, Co, Cu, Y, Mo, Cd, Sm, Ta, W, Pt, Pb, and Bi is determined by measuring the total ion current from the vacuum arc plasma. It is demonstrated that the ratio of the total ion current to the discharge current, \u03b1i in a vacuum arc varies from 5 to 19%, depending on the cathode material. It is found experimentally that the ion current fraction \u03b1i is inversely proportional to the atomic bond energy of the cathode material. It is shown that an increase in the total ion current extracted from the discharge plasma when applying an external magnetic field to the cathode region of the discharge is related solely to the appearance of ions with higher charge numbers in the plasma, while the magnitude of the specific ion erosion \u03b3i remains unchanged.", 
        "genre": "research_article", 
        "id": "sg:pub.10.1134/s1063784206100082", 
        "inLanguage": [
          "en"
        ], 
        "isAccessibleForFree": false, 
        "isPartOf": [
          {
            "id": "sg:journal.1136240", 
            "issn": [
              "0038-5662", 
              "0044-4642"
            ], 
            "name": "Technical Physics", 
            "type": "Periodical"
          }, 
          {
            "issueNumber": "10", 
            "type": "PublicationIssue"
          }, 
          {
            "type": "PublicationVolume", 
            "volumeNumber": "51"
          }
        ], 
        "name": "Determination of the specific ion erosion of the vacuum arc cathode by measuring the total ion current from the discharge plasma", 
        "pagination": "1311-1315", 
        "productId": [
          {
            "name": "readcube_id", 
            "type": "PropertyValue", 
            "value": [
              "3ebaed7dcca4f95d69d798ccb1f5aabb8a1f711439dd23b51d7905d62a49b097"
            ]
          }, 
          {
            "name": "doi", 
            "type": "PropertyValue", 
            "value": [
              "10.1134/s1063784206100082"
            ]
          }, 
          {
            "name": "dimensions_id", 
            "type": "PropertyValue", 
            "value": [
              "pub.1013168340"
            ]
          }
        ], 
        "sameAs": [
          "https://doi.org/10.1134/s1063784206100082", 
          "https://app.dimensions.ai/details/publication/pub.1013168340"
        ], 
        "sdDataset": "articles", 
        "sdDatePublished": "2019-04-10T14:59", 
        "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
        "sdPublisher": {
          "name": "Springer Nature - SN SciGraph project", 
          "type": "Organization"
        }, 
        "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8663_00000504.jsonl", 
        "type": "ScholarlyArticle", 
        "url": "http://link.springer.com/10.1134%2FS1063784206100082"
      }
    ]
     

    Download the RDF metadata as:  json-ld nt turtle xml License info

    HOW TO GET THIS DATA PROGRAMMATICALLY:

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    curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1134/s1063784206100082'

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    This table displays all metadata directly associated to this object as RDF triples.

    118 TRIPLES      21 PREDICATES      33 URIs      19 LITERALS      7 BLANK NODES

    Subject Predicate Object
    1 sg:pub.10.1134/s1063784206100082 schema:about anzsrc-for:02
    2 anzsrc-for:0202
    3 schema:author Nd5a730d2f3d544ba9e8371c2784826fb
    4 schema:citation sg:pub.10.1007/978-94-010-0277-6_1
    5 https://doi.org/10.1063/1.1468271
    6 https://doi.org/10.1063/1.1662710
    7 https://doi.org/10.1063/1.322043
    8 https://doi.org/10.1088/0022-3727/8/14/009
    9 https://doi.org/10.3367/ufnr.0172.200210a.1113
    10 schema:datePublished 2006-10
    11 schema:datePublishedReg 2006-10-01
    12 schema:description The specific ion erosion γi of cathodes made of C, Mg, Al, Ti, Co, Cu, Y, Mo, Cd, Sm, Ta, W, Pt, Pb, and Bi is determined by measuring the total ion current from the vacuum arc plasma. It is demonstrated that the ratio of the total ion current to the discharge current, αi in a vacuum arc varies from 5 to 19%, depending on the cathode material. It is found experimentally that the ion current fraction αi is inversely proportional to the atomic bond energy of the cathode material. It is shown that an increase in the total ion current extracted from the discharge plasma when applying an external magnetic field to the cathode region of the discharge is related solely to the appearance of ions with higher charge numbers in the plasma, while the magnitude of the specific ion erosion γi remains unchanged.
    13 schema:genre research_article
    14 schema:inLanguage en
    15 schema:isAccessibleForFree false
    16 schema:isPartOf N0e4565eed8dd4577aabb5c42c8efe19e
    17 N52befe69a9c04cc1afc9fbad417e53d6
    18 sg:journal.1136240
    19 schema:name Determination of the specific ion erosion of the vacuum arc cathode by measuring the total ion current from the discharge plasma
    20 schema:pagination 1311-1315
    21 schema:productId N6407ac8778e64872b8b19679a4c188f3
    22 N80b5c560ff1e468e9cb9cf8eaf88b572
    23 N9481c077d5034d3e8df2ef8bf3c50441
    24 schema:sameAs https://app.dimensions.ai/details/publication/pub.1013168340
    25 https://doi.org/10.1134/s1063784206100082
    26 schema:sdDatePublished 2019-04-10T14:59
    27 schema:sdLicense https://scigraph.springernature.com/explorer/license/
    28 schema:sdPublisher N60667db8c77043ec8bb1e8cbf991679e
    29 schema:url http://link.springer.com/10.1134%2FS1063784206100082
    30 sgo:license sg:explorer/license/
    31 sgo:sdDataset articles
    32 rdf:type schema:ScholarlyArticle
    33 N0e4565eed8dd4577aabb5c42c8efe19e schema:volumeNumber 51
    34 rdf:type schema:PublicationVolume
    35 N10e9c4543ba04527b5ef8c00f3bcfc46 rdf:first sg:person.01150713152.97
    36 rdf:rest Neddbb83bfc78430d938baaa6532324c6
    37 N28784e3b805748caa281567602e9f415 rdf:first sg:person.0726243247.19
    38 rdf:rest N39aaf4a65df5497f983ba5a29d0ec13d
    39 N39aaf4a65df5497f983ba5a29d0ec13d rdf:first sg:person.010346423153.84
    40 rdf:rest Ndb98eaab4433440c86f1c9be0b2a5bb4
    41 N52befe69a9c04cc1afc9fbad417e53d6 schema:issueNumber 10
    42 rdf:type schema:PublicationIssue
    43 N60667db8c77043ec8bb1e8cbf991679e schema:name Springer Nature - SN SciGraph project
    44 rdf:type schema:Organization
    45 N6407ac8778e64872b8b19679a4c188f3 schema:name readcube_id
    46 schema:value 3ebaed7dcca4f95d69d798ccb1f5aabb8a1f711439dd23b51d7905d62a49b097
    47 rdf:type schema:PropertyValue
    48 N80b5c560ff1e468e9cb9cf8eaf88b572 schema:name doi
    49 schema:value 10.1134/s1063784206100082
    50 rdf:type schema:PropertyValue
    51 N9481c077d5034d3e8df2ef8bf3c50441 schema:name dimensions_id
    52 schema:value pub.1013168340
    53 rdf:type schema:PropertyValue
    54 Nd5a730d2f3d544ba9e8371c2784826fb rdf:first sg:person.0663645411.05
    55 rdf:rest N10e9c4543ba04527b5ef8c00f3bcfc46
    56 Ndb98eaab4433440c86f1c9be0b2a5bb4 rdf:first sg:person.015023324273.69
    57 rdf:rest rdf:nil
    58 Neddbb83bfc78430d938baaa6532324c6 rdf:first sg:person.01042471647.94
    59 rdf:rest N28784e3b805748caa281567602e9f415
    60 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
    61 schema:name Physical Sciences
    62 rdf:type schema:DefinedTerm
    63 anzsrc-for:0202 schema:inDefinedTermSet anzsrc-for:
    64 schema:name Atomic, Molecular, Nuclear, Particle and Plasma Physics
    65 rdf:type schema:DefinedTerm
    66 sg:journal.1136240 schema:issn 0038-5662
    67 0044-4642
    68 schema:name Technical Physics
    69 rdf:type schema:Periodical
    70 sg:person.010346423153.84 schema:affiliation https://www.grid.ac/institutes/grid.184769.5
    71 schema:familyName Brown
    72 schema:givenName Y.
    73 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010346423153.84
    74 rdf:type schema:Person
    75 sg:person.01042471647.94 schema:affiliation https://www.grid.ac/institutes/grid.465280.d
    76 schema:familyName Yushkov
    77 schema:givenName G. Yu.
    78 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01042471647.94
    79 rdf:type schema:Person
    80 sg:person.01150713152.97 schema:affiliation https://www.grid.ac/institutes/grid.465280.d
    81 schema:familyName Oks
    82 schema:givenName E. M.
    83 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01150713152.97
    84 rdf:type schema:Person
    85 sg:person.015023324273.69 schema:affiliation https://www.grid.ac/institutes/grid.465280.d
    86 schema:familyName Nikolaev
    87 schema:givenName A. G.
    88 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015023324273.69
    89 rdf:type schema:Person
    90 sg:person.0663645411.05 schema:affiliation https://www.grid.ac/institutes/grid.184769.5
    91 schema:familyName Anders
    92 schema:givenName A.
    93 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0663645411.05
    94 rdf:type schema:Person
    95 sg:person.0726243247.19 schema:affiliation https://www.grid.ac/institutes/grid.465280.d
    96 schema:familyName Savkin
    97 schema:givenName K. P.
    98 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0726243247.19
    99 rdf:type schema:Person
    100 sg:pub.10.1007/978-94-010-0277-6_1 schema:sameAs https://app.dimensions.ai/details/publication/pub.1048122639
    101 https://doi.org/10.1007/978-94-010-0277-6_1
    102 rdf:type schema:CreativeWork
    103 https://doi.org/10.1063/1.1468271 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057709653
    104 rdf:type schema:CreativeWork
    105 https://doi.org/10.1063/1.1662710 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057741062
    106 rdf:type schema:CreativeWork
    107 https://doi.org/10.1063/1.322043 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057920180
    108 rdf:type schema:CreativeWork
    109 https://doi.org/10.1088/0022-3727/8/14/009 schema:sameAs https://app.dimensions.ai/details/publication/pub.1013835238
    110 rdf:type schema:CreativeWork
    111 https://doi.org/10.3367/ufnr.0172.200210a.1113 schema:sameAs https://app.dimensions.ai/details/publication/pub.1071219910
    112 rdf:type schema:CreativeWork
    113 https://www.grid.ac/institutes/grid.184769.5 schema:alternateName Lawrence Berkeley National Laboratory
    114 schema:name Lawrence Berkeley National Laboratory, University of California, Berkeley, California, USA
    115 rdf:type schema:Organization
    116 https://www.grid.ac/institutes/grid.465280.d schema:alternateName Institute of High Current Electronics
    117 schema:name Institute of High-Current Electronics, Siberian Division, Russian Academy of Sciences, Akademicheskiĭ pr. 4, 634055, Tomsk, Russia
    118 rdf:type schema:Organization
     




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