Surface morphology and Raman spectroscopy of thin layers of antimony and bismuth chalcogenides View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2016-07-26

AUTHORS

L. N. Luk’yanova, A. Yu. Bibik, V. A. Aseev, O. A. Usov, I. V. Makarenko, V. N. Petrov, N. V. Nikonorov, V. A. Kutasov

ABSTRACT

The phonon spectra in thin layers of bismuth telluride and solid solutions of Bi2–xSbxTe3–ySey of different composition, belonging to three-dimensional topological insulators, have been investigated by micro-Raman spectroscopy, and the morphology of an interlayer van der Waals (0001) surface in them has been studied by semicontact atomic force microscopy at room temperature. The analysis of the Raman spectra and the intensity ratio of active and inactive longitudinal optical modes depending on the composition, morphology of the interlayer surface, and thickness of the layers enabled the estimation of the effect of topological surface states of Dirac fermions, associated with the strengthening of the electron–phonon interaction as a result of resonance Raman scattering, and the identification of the compositions, in which the contribution of topological surface states becomes dominant. More... »

PAGES

1440-1447

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063783416070258

DOI

http://dx.doi.org/10.1134/s1063783416070258

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1019272498


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Luk\u2019yanova", 
        "givenName": "L. N.", 
        "id": "sg:person.014617550477.07", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014617550477.07"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35915.3b", 
          "name": [
            "National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bibik", 
        "givenName": "A. Yu.", 
        "id": "sg:person.011734446010.46", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011734446010.46"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35915.3b", 
          "name": [
            "National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Aseev", 
        "givenName": "V. A.", 
        "id": "sg:person.012435542611.68", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012435542611.68"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Usov", 
        "givenName": "O. A.", 
        "id": "sg:person.013245001417.06", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013245001417.06"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Makarenko", 
        "givenName": "I. V.", 
        "id": "sg:person.010312170702.01", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010312170702.01"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Petrov", 
        "givenName": "V. N.", 
        "id": "sg:person.010547461051.73", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010547461051.73"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35915.3b", 
          "name": [
            "National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Nikonorov", 
        "givenName": "N. V.", 
        "id": "sg:person.013351015377.20", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013351015377.20"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kutasov", 
        "givenName": "V. A.", 
        "id": "sg:person.012353624611.93", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012353624611.93"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/s1063783414020152", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1050931409", 
          "https://doi.org/10.1134/s1063783414020152"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1038/nnano.2013.134", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1043891141", 
          "https://doi.org/10.1038/nnano.2013.134"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063783414050163", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049017382", 
          "https://doi.org/10.1134/s1063783414050163"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2016-07-26", 
    "datePublishedReg": "2016-07-26", 
    "description": "The phonon spectra in thin layers of bismuth telluride and solid solutions of Bi2\u2013xSbxTe3\u2013ySey of different composition, belonging to three-dimensional topological insulators, have been investigated by micro-Raman spectroscopy, and the morphology of an interlayer van der Waals (0001) surface in them has been studied by semicontact atomic force microscopy at room temperature. The analysis of the Raman spectra and the intensity ratio of active and inactive longitudinal optical modes depending on the composition, morphology of the interlayer surface, and thickness of the layers enabled the estimation of the effect of topological surface states of Dirac fermions, associated with the strengthening of the electron\u2013phonon interaction as a result of resonance Raman scattering, and the identification of the compositions, in which the contribution of topological surface states becomes dominant.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063783416070258", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136591", 
        "issn": [
          "0367-3294", 
          "1063-7834"
        ], 
        "name": "Physics of the Solid State", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "7", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "58"
      }
    ], 
    "keywords": [
      "topological surface states", 
      "surface states", 
      "three-dimensional topological insulators", 
      "longitudinal optical modes", 
      "Raman spectroscopy", 
      "electron-phonon interaction", 
      "atomic force microscopy", 
      "resonance Raman scattering", 
      "topological insulators", 
      "optical modes", 
      "Dirac fermions", 
      "thin layer", 
      "van der Waals surface", 
      "force microscopy", 
      "Raman scattering", 
      "phonon spectrum", 
      "Bi2-xSbxTe3", 
      "intensity ratio", 
      "bismuth chalcogenides", 
      "surface morphology", 
      "Raman spectra", 
      "room temperature", 
      "bismuth telluride", 
      "spectroscopy", 
      "spectra", 
      "morphology", 
      "fermions", 
      "insulator", 
      "interlayer surface", 
      "scattering", 
      "layer", 
      "ySey", 
      "solid solution", 
      "chalcogenides", 
      "different compositions", 
      "state", 
      "surface", 
      "microscopy", 
      "telluride", 
      "mode", 
      "thickness", 
      "temperature", 
      "composition", 
      "antimony", 
      "interaction", 
      "solution", 
      "contribution", 
      "ratio", 
      "effect", 
      "results", 
      "estimation", 
      "analysis", 
      "identification", 
      "strengthening"
    ], 
    "name": "Surface morphology and Raman spectroscopy of thin layers of antimony and bismuth chalcogenides", 
    "pagination": "1440-1447", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1019272498"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063783416070258"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063783416070258", 
      "https://app.dimensions.ai/details/publication/pub.1019272498"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-05-20T07:31", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220519/entities/gbq_results/article/article_683.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063783416070258"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

176 TRIPLES      22 PREDICATES      82 URIs      71 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063783416070258 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N6864b4269bb6410180f0846205c2bf94
4 schema:citation sg:pub.10.1038/nnano.2013.134
5 sg:pub.10.1134/s1063783414020152
6 sg:pub.10.1134/s1063783414050163
7 schema:datePublished 2016-07-26
8 schema:datePublishedReg 2016-07-26
9 schema:description The phonon spectra in thin layers of bismuth telluride and solid solutions of Bi2–xSbxTe3–ySey of different composition, belonging to three-dimensional topological insulators, have been investigated by micro-Raman spectroscopy, and the morphology of an interlayer van der Waals (0001) surface in them has been studied by semicontact atomic force microscopy at room temperature. The analysis of the Raman spectra and the intensity ratio of active and inactive longitudinal optical modes depending on the composition, morphology of the interlayer surface, and thickness of the layers enabled the estimation of the effect of topological surface states of Dirac fermions, associated with the strengthening of the electron–phonon interaction as a result of resonance Raman scattering, and the identification of the compositions, in which the contribution of topological surface states becomes dominant.
10 schema:genre article
11 schema:inLanguage en
12 schema:isAccessibleForFree false
13 schema:isPartOf N8389aa030de84b6abb1802b1618feb2f
14 Nfd003cdd03824e3dadfa4376c4829d61
15 sg:journal.1136591
16 schema:keywords Bi2-xSbxTe3
17 Dirac fermions
18 Raman scattering
19 Raman spectra
20 Raman spectroscopy
21 analysis
22 antimony
23 atomic force microscopy
24 bismuth chalcogenides
25 bismuth telluride
26 chalcogenides
27 composition
28 contribution
29 different compositions
30 effect
31 electron-phonon interaction
32 estimation
33 fermions
34 force microscopy
35 identification
36 insulator
37 intensity ratio
38 interaction
39 interlayer surface
40 layer
41 longitudinal optical modes
42 microscopy
43 mode
44 morphology
45 optical modes
46 phonon spectrum
47 ratio
48 resonance Raman scattering
49 results
50 room temperature
51 scattering
52 solid solution
53 solution
54 spectra
55 spectroscopy
56 state
57 strengthening
58 surface
59 surface morphology
60 surface states
61 telluride
62 temperature
63 thickness
64 thin layer
65 three-dimensional topological insulators
66 topological insulators
67 topological surface states
68 van der Waals surface
69 ySey
70 schema:name Surface morphology and Raman spectroscopy of thin layers of antimony and bismuth chalcogenides
71 schema:pagination 1440-1447
72 schema:productId N94821bce834c43269ac547a509d99fee
73 Nf97f49b62cfd48ebaf8d79a351772c37
74 schema:sameAs https://app.dimensions.ai/details/publication/pub.1019272498
75 https://doi.org/10.1134/s1063783416070258
76 schema:sdDatePublished 2022-05-20T07:31
77 schema:sdLicense https://scigraph.springernature.com/explorer/license/
78 schema:sdPublisher N784953d68e47409eb48a7d644286b89b
79 schema:url https://doi.org/10.1134/s1063783416070258
80 sgo:license sg:explorer/license/
81 sgo:sdDataset articles
82 rdf:type schema:ScholarlyArticle
83 N41798475721c405e90ad786754dfe4a1 rdf:first sg:person.012435542611.68
84 rdf:rest N8776e08a3cac4191aff485ec263f2fff
85 N42c1e2110847440689cfef0c2ad7940e rdf:first sg:person.013351015377.20
86 rdf:rest N6eef7978cae04e848ec2274f2d973540
87 N473e68d6f0b7480ba0e5b73f5a58eca1 rdf:first sg:person.011734446010.46
88 rdf:rest N41798475721c405e90ad786754dfe4a1
89 N4f225e19e1bb4040ad0bab8d3a790650 rdf:first sg:person.010312170702.01
90 rdf:rest N7c0b3a1f262444c8b0ab1696d7a1ece0
91 N6864b4269bb6410180f0846205c2bf94 rdf:first sg:person.014617550477.07
92 rdf:rest N473e68d6f0b7480ba0e5b73f5a58eca1
93 N6eef7978cae04e848ec2274f2d973540 rdf:first sg:person.012353624611.93
94 rdf:rest rdf:nil
95 N784953d68e47409eb48a7d644286b89b schema:name Springer Nature - SN SciGraph project
96 rdf:type schema:Organization
97 N7c0b3a1f262444c8b0ab1696d7a1ece0 rdf:first sg:person.010547461051.73
98 rdf:rest N42c1e2110847440689cfef0c2ad7940e
99 N8389aa030de84b6abb1802b1618feb2f schema:volumeNumber 58
100 rdf:type schema:PublicationVolume
101 N8776e08a3cac4191aff485ec263f2fff rdf:first sg:person.013245001417.06
102 rdf:rest N4f225e19e1bb4040ad0bab8d3a790650
103 N94821bce834c43269ac547a509d99fee schema:name dimensions_id
104 schema:value pub.1019272498
105 rdf:type schema:PropertyValue
106 Nf97f49b62cfd48ebaf8d79a351772c37 schema:name doi
107 schema:value 10.1134/s1063783416070258
108 rdf:type schema:PropertyValue
109 Nfd003cdd03824e3dadfa4376c4829d61 schema:issueNumber 7
110 rdf:type schema:PublicationIssue
111 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
112 schema:name Physical Sciences
113 rdf:type schema:DefinedTerm
114 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
115 schema:name Other Physical Sciences
116 rdf:type schema:DefinedTerm
117 sg:journal.1136591 schema:issn 0367-3294
118 1063-7834
119 schema:name Physics of the Solid State
120 schema:publisher Pleiades Publishing
121 rdf:type schema:Periodical
122 sg:person.010312170702.01 schema:affiliation grid-institutes:grid.423485.c
123 schema:familyName Makarenko
124 schema:givenName I. V.
125 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010312170702.01
126 rdf:type schema:Person
127 sg:person.010547461051.73 schema:affiliation grid-institutes:grid.423485.c
128 schema:familyName Petrov
129 schema:givenName V. N.
130 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010547461051.73
131 rdf:type schema:Person
132 sg:person.011734446010.46 schema:affiliation grid-institutes:grid.35915.3b
133 schema:familyName Bibik
134 schema:givenName A. Yu.
135 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011734446010.46
136 rdf:type schema:Person
137 sg:person.012353624611.93 schema:affiliation grid-institutes:grid.423485.c
138 schema:familyName Kutasov
139 schema:givenName V. A.
140 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012353624611.93
141 rdf:type schema:Person
142 sg:person.012435542611.68 schema:affiliation grid-institutes:grid.35915.3b
143 schema:familyName Aseev
144 schema:givenName V. A.
145 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012435542611.68
146 rdf:type schema:Person
147 sg:person.013245001417.06 schema:affiliation grid-institutes:grid.423485.c
148 schema:familyName Usov
149 schema:givenName O. A.
150 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013245001417.06
151 rdf:type schema:Person
152 sg:person.013351015377.20 schema:affiliation grid-institutes:grid.35915.3b
153 schema:familyName Nikonorov
154 schema:givenName N. V.
155 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013351015377.20
156 rdf:type schema:Person
157 sg:person.014617550477.07 schema:affiliation grid-institutes:grid.423485.c
158 schema:familyName Luk’yanova
159 schema:givenName L. N.
160 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014617550477.07
161 rdf:type schema:Person
162 sg:pub.10.1038/nnano.2013.134 schema:sameAs https://app.dimensions.ai/details/publication/pub.1043891141
163 https://doi.org/10.1038/nnano.2013.134
164 rdf:type schema:CreativeWork
165 sg:pub.10.1134/s1063783414020152 schema:sameAs https://app.dimensions.ai/details/publication/pub.1050931409
166 https://doi.org/10.1134/s1063783414020152
167 rdf:type schema:CreativeWork
168 sg:pub.10.1134/s1063783414050163 schema:sameAs https://app.dimensions.ai/details/publication/pub.1049017382
169 https://doi.org/10.1134/s1063783414050163
170 rdf:type schema:CreativeWork
171 grid-institutes:grid.35915.3b schema:alternateName National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia
172 schema:name National Research University of Information Technologies, Mechanics, and Optics, Kronverkskii pr. 49, 197101, St. Petersburg, Russia
173 rdf:type schema:Organization
174 grid-institutes:grid.423485.c schema:alternateName Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia
175 schema:name Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia
176 rdf:type schema:Organization
 




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