Specific features of the electronic and atomic structures of silicon single crystals in the aluminum matrix View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2014-12-02

AUTHORS

V. A. Terekhov, S. K. Lazaruk, D. S. Usol’tseva, A. A. Leshok, P. S. Katsuba, I. E. Zanin, D. E. Spirin, A. A. Stepanova, S. Yu. Turishchev

ABSTRACT

Films of Al-Si nanocomposites produced by magnetron evaporation of a complex target onto a silicon substrate have been investigated using scanning electron microscopy, X-ray diffraction, ultrasoft X-ray emission spectroscopy, and X-ray absorption near edge structure spectroscopy. It has been found that silicon inclusions are nanocrystals with the mean size of 20–25 nm, with the surface covered by an amorphous silicon layer. The presence of the aluminum matrix in the initial films changes their band structures, in particular, near the bottom of the valence band. After the removal of aluminum, the structure of the valence band becomes identical to that in the bulk material and the structure of the conduction band indicates the presence of a disordered surface layer with a thickness of ∼5 nm. More... »

PAGES

2543-2547

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063783414120336

DOI

http://dx.doi.org/10.1134/s1063783414120336

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1029819285


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0203", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Classical Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0204", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Condensed Matter Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0206", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Quantum Physics", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia", 
          "id": "http://www.grid.ac/institutes/grid.20567.36", 
          "name": [
            "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Terekhov", 
        "givenName": "V. A.", 
        "id": "sg:person.011732071035.61", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011732071035.61"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus", 
          "id": "http://www.grid.ac/institutes/grid.78074.3c", 
          "name": [
            "Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lazaruk", 
        "givenName": "S. K.", 
        "id": "sg:person.016547135452.16", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016547135452.16"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia", 
          "id": "http://www.grid.ac/institutes/grid.20567.36", 
          "name": [
            "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Usol\u2019tseva", 
        "givenName": "D. S.", 
        "id": "sg:person.010641444652.30", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010641444652.30"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus", 
          "id": "http://www.grid.ac/institutes/grid.78074.3c", 
          "name": [
            "Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Leshok", 
        "givenName": "A. A.", 
        "id": "sg:person.014100515003.96", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014100515003.96"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus", 
          "id": "http://www.grid.ac/institutes/grid.78074.3c", 
          "name": [
            "Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Katsuba", 
        "givenName": "P. S.", 
        "id": "sg:person.011354171255.16", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011354171255.16"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia", 
          "id": "http://www.grid.ac/institutes/grid.20567.36", 
          "name": [
            "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Zanin", 
        "givenName": "I. E.", 
        "id": "sg:person.012621767417.88", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012621767417.88"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia", 
          "id": "http://www.grid.ac/institutes/grid.20567.36", 
          "name": [
            "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Spirin", 
        "givenName": "D. E.", 
        "id": "sg:person.0761462724.18", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0761462724.18"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia", 
          "id": "http://www.grid.ac/institutes/grid.20567.36", 
          "name": [
            "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Stepanova", 
        "givenName": "A. A.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia", 
          "id": "http://www.grid.ac/institutes/grid.20567.36", 
          "name": [
            "Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Turishchev", 
        "givenName": "S. Yu.", 
        "id": "sg:person.012122734373.05", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012122734373.05"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/1.1385719", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1018584973", 
          "https://doi.org/10.1134/1.1385719"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063782607090163", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1042095545", 
          "https://doi.org/10.1134/s1063782607090163"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/978-1-4757-0118-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1027478199", 
          "https://doi.org/10.1007/978-1-4757-0118-0"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2014-12-02", 
    "datePublishedReg": "2014-12-02", 
    "description": "Films of Al-Si nanocomposites produced by magnetron evaporation of a complex target onto a silicon substrate have been investigated using scanning electron microscopy, X-ray diffraction, ultrasoft X-ray emission spectroscopy, and X-ray absorption near edge structure spectroscopy. It has been found that silicon inclusions are nanocrystals with the mean size of 20\u201325 nm, with the surface covered by an amorphous silicon layer. The presence of the aluminum matrix in the initial films changes their band structures, in particular, near the bottom of the valence band. After the removal of aluminum, the structure of the valence band becomes identical to that in the bulk material and the structure of the conduction band indicates the presence of a disordered surface layer with a thickness of \u223c5 nm.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063783414120336", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136591", 
        "issn": [
          "0367-3294", 
          "1063-7834"
        ], 
        "name": "Physics of the Solid State", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "12", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "56"
      }
    ], 
    "keywords": [
      "aluminum matrix", 
      "Al\u2013Si nanocomposites", 
      "amorphous silicon layers", 
      "silicon layer", 
      "silicon substrate", 
      "removal of aluminum", 
      "silicon inclusions", 
      "bulk material", 
      "silicon single crystals", 
      "surface layer", 
      "initial film", 
      "ray diffraction", 
      "films", 
      "electron microscopy", 
      "layer", 
      "valence band", 
      "band structure", 
      "conduction band", 
      "nanocomposites", 
      "ray emission spectroscopy", 
      "aluminum", 
      "matrix", 
      "mean size", 
      "structure", 
      "thickness", 
      "evaporation", 
      "emission spectroscopy", 
      "nanocrystals", 
      "single crystals", 
      "atomic structure", 
      "edge structure (XANES) spectroscopy", 
      "materials", 
      "surface", 
      "diffraction", 
      "ray absorption", 
      "structure spectroscopy", 
      "bottom", 
      "substrate", 
      "spectroscopy", 
      "microscopy", 
      "specific features", 
      "band", 
      "removal", 
      "complex targets", 
      "absorption", 
      "size", 
      "crystals", 
      "presence", 
      "inclusion", 
      "features", 
      "target", 
      "magnetron evaporation"
    ], 
    "name": "Specific features of the electronic and atomic structures of silicon single crystals in the aluminum matrix", 
    "pagination": "2543-2547", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1029819285"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063783414120336"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063783414120336", 
      "https://app.dimensions.ai/details/publication/pub.1029819285"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2021-11-01T18:23", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20211101/entities/gbq_results/article/article_636.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063783414120336"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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This table displays all metadata directly associated to this object as RDF triples.

188 TRIPLES      22 PREDICATES      82 URIs      69 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063783414120336 schema:about anzsrc-for:02
2 anzsrc-for:0203
3 anzsrc-for:0204
4 anzsrc-for:0206
5 schema:author Nc17a112a375043f4b2a0177b2558ea17
6 schema:citation sg:pub.10.1007/978-1-4757-0118-0
7 sg:pub.10.1134/1.1385719
8 sg:pub.10.1134/s1063782607090163
9 schema:datePublished 2014-12-02
10 schema:datePublishedReg 2014-12-02
11 schema:description Films of Al-Si nanocomposites produced by magnetron evaporation of a complex target onto a silicon substrate have been investigated using scanning electron microscopy, X-ray diffraction, ultrasoft X-ray emission spectroscopy, and X-ray absorption near edge structure spectroscopy. It has been found that silicon inclusions are nanocrystals with the mean size of 20–25 nm, with the surface covered by an amorphous silicon layer. The presence of the aluminum matrix in the initial films changes their band structures, in particular, near the bottom of the valence band. After the removal of aluminum, the structure of the valence band becomes identical to that in the bulk material and the structure of the conduction band indicates the presence of a disordered surface layer with a thickness of ∼5 nm.
12 schema:genre article
13 schema:inLanguage en
14 schema:isAccessibleForFree false
15 schema:isPartOf N7464f4ffb1484da99cf4eb90da4e2df0
16 Nba3760085a8940e3a32b373679d45629
17 sg:journal.1136591
18 schema:keywords Al–Si nanocomposites
19 absorption
20 aluminum
21 aluminum matrix
22 amorphous silicon layers
23 atomic structure
24 band
25 band structure
26 bottom
27 bulk material
28 complex targets
29 conduction band
30 crystals
31 diffraction
32 edge structure (XANES) spectroscopy
33 electron microscopy
34 emission spectroscopy
35 evaporation
36 features
37 films
38 inclusion
39 initial film
40 layer
41 magnetron evaporation
42 materials
43 matrix
44 mean size
45 microscopy
46 nanocomposites
47 nanocrystals
48 presence
49 ray absorption
50 ray diffraction
51 ray emission spectroscopy
52 removal
53 removal of aluminum
54 silicon inclusions
55 silicon layer
56 silicon single crystals
57 silicon substrate
58 single crystals
59 size
60 specific features
61 spectroscopy
62 structure
63 structure spectroscopy
64 substrate
65 surface
66 surface layer
67 target
68 thickness
69 valence band
70 schema:name Specific features of the electronic and atomic structures of silicon single crystals in the aluminum matrix
71 schema:pagination 2543-2547
72 schema:productId Na3d001ac4312441fa06c1cc81b01477f
73 Nae9d8402347045b88516cffed38013c5
74 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029819285
75 https://doi.org/10.1134/s1063783414120336
76 schema:sdDatePublished 2021-11-01T18:23
77 schema:sdLicense https://scigraph.springernature.com/explorer/license/
78 schema:sdPublisher N42297fddba3441009587139c6385d13c
79 schema:url https://doi.org/10.1134/s1063783414120336
80 sgo:license sg:explorer/license/
81 sgo:sdDataset articles
82 rdf:type schema:ScholarlyArticle
83 N0f83d8e4b6454f9dab997919f1f57256 rdf:first sg:person.011354171255.16
84 rdf:rest N6fa020e2f48341c2a45669f2b6279aef
85 N2f4b33e51e5d44618f938ebba56fc3fe rdf:first sg:person.016547135452.16
86 rdf:rest N643b6ae4fcd044a4b6bb194be65b1824
87 N42297fddba3441009587139c6385d13c schema:name Springer Nature - SN SciGraph project
88 rdf:type schema:Organization
89 N4c01b87d0c684cd3a7664ff933e8fdc3 rdf:first sg:person.0761462724.18
90 rdf:rest Nbaf7f5d8b5284792a811ea0f763bc268
91 N643b6ae4fcd044a4b6bb194be65b1824 rdf:first sg:person.010641444652.30
92 rdf:rest N76cdb81d3e064251a1e59ba7df23c2df
93 N6fa020e2f48341c2a45669f2b6279aef rdf:first sg:person.012621767417.88
94 rdf:rest N4c01b87d0c684cd3a7664ff933e8fdc3
95 N7464f4ffb1484da99cf4eb90da4e2df0 schema:volumeNumber 56
96 rdf:type schema:PublicationVolume
97 N76cdb81d3e064251a1e59ba7df23c2df rdf:first sg:person.014100515003.96
98 rdf:rest N0f83d8e4b6454f9dab997919f1f57256
99 Na3d001ac4312441fa06c1cc81b01477f schema:name doi
100 schema:value 10.1134/s1063783414120336
101 rdf:type schema:PropertyValue
102 Nae9d8402347045b88516cffed38013c5 schema:name dimensions_id
103 schema:value pub.1029819285
104 rdf:type schema:PropertyValue
105 Nba3760085a8940e3a32b373679d45629 schema:issueNumber 12
106 rdf:type schema:PublicationIssue
107 Nbaf7f5d8b5284792a811ea0f763bc268 rdf:first Nf1a1278b8e49408c915b65aebf77170d
108 rdf:rest Ne1a073919aca4431a229ac20266c122e
109 Nc17a112a375043f4b2a0177b2558ea17 rdf:first sg:person.011732071035.61
110 rdf:rest N2f4b33e51e5d44618f938ebba56fc3fe
111 Ne1a073919aca4431a229ac20266c122e rdf:first sg:person.012122734373.05
112 rdf:rest rdf:nil
113 Nf1a1278b8e49408c915b65aebf77170d schema:affiliation grid-institutes:grid.20567.36
114 schema:familyName Stepanova
115 schema:givenName A. A.
116 rdf:type schema:Person
117 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
118 schema:name Physical Sciences
119 rdf:type schema:DefinedTerm
120 anzsrc-for:0203 schema:inDefinedTermSet anzsrc-for:
121 schema:name Classical Physics
122 rdf:type schema:DefinedTerm
123 anzsrc-for:0204 schema:inDefinedTermSet anzsrc-for:
124 schema:name Condensed Matter Physics
125 rdf:type schema:DefinedTerm
126 anzsrc-for:0206 schema:inDefinedTermSet anzsrc-for:
127 schema:name Quantum Physics
128 rdf:type schema:DefinedTerm
129 sg:journal.1136591 schema:issn 0367-3294
130 1063-7834
131 schema:name Physics of the Solid State
132 schema:publisher Pleiades Publishing
133 rdf:type schema:Periodical
134 sg:person.010641444652.30 schema:affiliation grid-institutes:grid.20567.36
135 schema:familyName Usol’tseva
136 schema:givenName D. S.
137 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010641444652.30
138 rdf:type schema:Person
139 sg:person.011354171255.16 schema:affiliation grid-institutes:grid.78074.3c
140 schema:familyName Katsuba
141 schema:givenName P. S.
142 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011354171255.16
143 rdf:type schema:Person
144 sg:person.011732071035.61 schema:affiliation grid-institutes:grid.20567.36
145 schema:familyName Terekhov
146 schema:givenName V. A.
147 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011732071035.61
148 rdf:type schema:Person
149 sg:person.012122734373.05 schema:affiliation grid-institutes:grid.20567.36
150 schema:familyName Turishchev
151 schema:givenName S. Yu.
152 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012122734373.05
153 rdf:type schema:Person
154 sg:person.012621767417.88 schema:affiliation grid-institutes:grid.20567.36
155 schema:familyName Zanin
156 schema:givenName I. E.
157 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012621767417.88
158 rdf:type schema:Person
159 sg:person.014100515003.96 schema:affiliation grid-institutes:grid.78074.3c
160 schema:familyName Leshok
161 schema:givenName A. A.
162 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014100515003.96
163 rdf:type schema:Person
164 sg:person.016547135452.16 schema:affiliation grid-institutes:grid.78074.3c
165 schema:familyName Lazaruk
166 schema:givenName S. K.
167 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016547135452.16
168 rdf:type schema:Person
169 sg:person.0761462724.18 schema:affiliation grid-institutes:grid.20567.36
170 schema:familyName Spirin
171 schema:givenName D. E.
172 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0761462724.18
173 rdf:type schema:Person
174 sg:pub.10.1007/978-1-4757-0118-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1027478199
175 https://doi.org/10.1007/978-1-4757-0118-0
176 rdf:type schema:CreativeWork
177 sg:pub.10.1134/1.1385719 schema:sameAs https://app.dimensions.ai/details/publication/pub.1018584973
178 https://doi.org/10.1134/1.1385719
179 rdf:type schema:CreativeWork
180 sg:pub.10.1134/s1063782607090163 schema:sameAs https://app.dimensions.ai/details/publication/pub.1042095545
181 https://doi.org/10.1134/s1063782607090163
182 rdf:type schema:CreativeWork
183 grid-institutes:grid.20567.36 schema:alternateName Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia
184 schema:name Voronezh State University, Universitetskaya pl. 1, 394006, Voronezh, Russia
185 rdf:type schema:Organization
186 grid-institutes:grid.78074.3c schema:alternateName Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus
187 schema:name Belarusian State University of Informatics and Radioelectronics, ul. P. Brovki 6, 220013, Minsk, Belarus
188 rdf:type schema:Organization
 




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