X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers View Full Text


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Article Info

DATE

2014-12-02

AUTHORS

R. N. Kyutt, S. V. Ivanov

ABSTRACT

The three-wave diffraction in epitaxial layers of an AlxGa1 − xN solid solution has been measured using the Renninger scheme. From a comparison with similar diagrams measured earlier for GaN and AlN layers, it follows that the curves for the solid solution have a significantly higher intensity in the range of azimuthal angles outside the three-wave peaks. This indicates the existence of the two-wave Bragg reflection 0001 forbidden for wurtzite structures. It has been shown that the appearance of this reflection is due to a partial ordering of the solid solution in AlxGa1 − xN layers. From the measured structure factor F(0001) of the layers with various Al concentrations, it follows that the degree of ordering (an Al excess in one cation AlGa plane and an Al deficit in another plane) of the given series of samples is almost independent of the solid solution layer composition. More... »

PAGES

2390-2392

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s106378341412021x

DOI

http://dx.doi.org/10.1134/s106378341412021x

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1030332492


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0203", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Classical Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0204", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Condensed Matter Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0206", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Quantum Physics", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "St. Petersburg State University, Universitetskaya nab. 7-9, 199034, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.15447.33", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
            "St. Petersburg State University, Universitetskaya nab. 7-9, 199034, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kyutt", 
        "givenName": "R. N.", 
        "id": "sg:person.011264372143.83", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011264372143.83"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ivanov", 
        "givenName": "S. V.", 
        "id": "sg:person.01064304443.31", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01064304443.31"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/s1063785010080031", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023730910", 
          "https://doi.org/10.1134/s1063785010080031"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063784211050203", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1018570988", 
          "https://doi.org/10.1134/s1063784211050203"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2014-12-02", 
    "datePublishedReg": "2014-12-02", 
    "description": "The three-wave diffraction in epitaxial layers of an AlxGa1 \u2212 xN solid solution has been measured using the Renninger scheme. From a comparison with similar diagrams measured earlier for GaN and AlN layers, it follows that the curves for the solid solution have a significantly higher intensity in the range of azimuthal angles outside the three-wave peaks. This indicates the existence of the two-wave Bragg reflection 0001 forbidden for wurtzite structures. It has been shown that the appearance of this reflection is due to a partial ordering of the solid solution in AlxGa1 \u2212 xN layers. From the measured structure factor F(0001) of the layers with various Al concentrations, it follows that the degree of ordering (an Al excess in one cation AlGa plane and an Al deficit in another plane) of the given series of samples is almost independent of the solid solution layer composition.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s106378341412021x", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136591", 
        "issn": [
          "0367-3294", 
          "1063-7834"
        ], 
        "name": "Physics of the Solid State", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "12", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "56"
      }
    ], 
    "keywords": [
      "solid solution", 
      "AlN layer", 
      "epitaxial layers", 
      "AlGaN layer", 
      "xN layers", 
      "layer composition", 
      "layer", 
      "wurtzite structure", 
      "degree of ordering", 
      "series of samples", 
      "AlxGa1", 
      "solution", 
      "Al concentration", 
      "GaN", 
      "diffraction", 
      "azimuthal angle", 
      "angle", 
      "high intensity", 
      "similar diagrams", 
      "structure", 
      "diagram", 
      "range", 
      "ray diffraction determination", 
      "curves", 
      "composition", 
      "scheme", 
      "degree", 
      "three-wave diffraction", 
      "comparison", 
      "peak", 
      "ordering", 
      "diffraction determination", 
      "determination", 
      "concentration", 
      "intensity", 
      "reflection", 
      "structure factor", 
      "samples", 
      "series", 
      "existence", 
      "appearance", 
      "factors", 
      "partial ordering", 
      "measured structure factor", 
      "Renninger scheme", 
      "three-wave peaks", 
      "two-wave Bragg reflection 0001", 
      "Bragg reflection 0001", 
      "reflection 0001", 
      "solid solution layer composition", 
      "solution layer composition", 
      "epitaxial AlGaN layers"
    ], 
    "name": "X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers", 
    "pagination": "2390-2392", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1030332492"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s106378341412021x"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s106378341412021x", 
      "https://app.dimensions.ai/details/publication/pub.1030332492"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2021-12-01T19:31", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20211201/entities/gbq_results/article/article_620.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s106378341412021x"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

137 TRIPLES      22 PREDICATES      81 URIs      69 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s106378341412021x schema:about anzsrc-for:02
2 anzsrc-for:0203
3 anzsrc-for:0204
4 anzsrc-for:0206
5 schema:author N8295a71124854f9c90505e5d8a58106a
6 schema:citation sg:pub.10.1134/s1063784211050203
7 sg:pub.10.1134/s1063785010080031
8 schema:datePublished 2014-12-02
9 schema:datePublishedReg 2014-12-02
10 schema:description The three-wave diffraction in epitaxial layers of an AlxGa1 − xN solid solution has been measured using the Renninger scheme. From a comparison with similar diagrams measured earlier for GaN and AlN layers, it follows that the curves for the solid solution have a significantly higher intensity in the range of azimuthal angles outside the three-wave peaks. This indicates the existence of the two-wave Bragg reflection 0001 forbidden for wurtzite structures. It has been shown that the appearance of this reflection is due to a partial ordering of the solid solution in AlxGa1 − xN layers. From the measured structure factor F(0001) of the layers with various Al concentrations, it follows that the degree of ordering (an Al excess in one cation AlGa plane and an Al deficit in another plane) of the given series of samples is almost independent of the solid solution layer composition.
11 schema:genre article
12 schema:inLanguage en
13 schema:isAccessibleForFree false
14 schema:isPartOf N1368356f025441f7895500ec43102bfb
15 Nbcb1b953294e402497b30f11967e3dab
16 sg:journal.1136591
17 schema:keywords Al concentration
18 AlGaN layer
19 AlN layer
20 AlxGa1
21 Bragg reflection 0001
22 GaN
23 Renninger scheme
24 angle
25 appearance
26 azimuthal angle
27 comparison
28 composition
29 concentration
30 curves
31 degree
32 degree of ordering
33 determination
34 diagram
35 diffraction
36 diffraction determination
37 epitaxial AlGaN layers
38 epitaxial layers
39 existence
40 factors
41 high intensity
42 intensity
43 layer
44 layer composition
45 measured structure factor
46 ordering
47 partial ordering
48 peak
49 range
50 ray diffraction determination
51 reflection
52 reflection 0001
53 samples
54 scheme
55 series
56 series of samples
57 similar diagrams
58 solid solution
59 solid solution layer composition
60 solution
61 solution layer composition
62 structure
63 structure factor
64 three-wave diffraction
65 three-wave peaks
66 two-wave Bragg reflection 0001
67 wurtzite structure
68 xN layers
69 schema:name X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers
70 schema:pagination 2390-2392
71 schema:productId Na6b3dc493ac5415f8977452898d2cde0
72 Nad3e4f4885b347d89ea189130873fe94
73 schema:sameAs https://app.dimensions.ai/details/publication/pub.1030332492
74 https://doi.org/10.1134/s106378341412021x
75 schema:sdDatePublished 2021-12-01T19:31
76 schema:sdLicense https://scigraph.springernature.com/explorer/license/
77 schema:sdPublisher N30c58411d0f14d218c5c7ad76c9891b8
78 schema:url https://doi.org/10.1134/s106378341412021x
79 sgo:license sg:explorer/license/
80 sgo:sdDataset articles
81 rdf:type schema:ScholarlyArticle
82 N1368356f025441f7895500ec43102bfb schema:issueNumber 12
83 rdf:type schema:PublicationIssue
84 N30c58411d0f14d218c5c7ad76c9891b8 schema:name Springer Nature - SN SciGraph project
85 rdf:type schema:Organization
86 N8295a71124854f9c90505e5d8a58106a rdf:first sg:person.011264372143.83
87 rdf:rest Nffaf360c5fa0408fae64d792d3c89050
88 Na6b3dc493ac5415f8977452898d2cde0 schema:name dimensions_id
89 schema:value pub.1030332492
90 rdf:type schema:PropertyValue
91 Nad3e4f4885b347d89ea189130873fe94 schema:name doi
92 schema:value 10.1134/s106378341412021x
93 rdf:type schema:PropertyValue
94 Nbcb1b953294e402497b30f11967e3dab schema:volumeNumber 56
95 rdf:type schema:PublicationVolume
96 Nffaf360c5fa0408fae64d792d3c89050 rdf:first sg:person.01064304443.31
97 rdf:rest rdf:nil
98 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
99 schema:name Physical Sciences
100 rdf:type schema:DefinedTerm
101 anzsrc-for:0203 schema:inDefinedTermSet anzsrc-for:
102 schema:name Classical Physics
103 rdf:type schema:DefinedTerm
104 anzsrc-for:0204 schema:inDefinedTermSet anzsrc-for:
105 schema:name Condensed Matter Physics
106 rdf:type schema:DefinedTerm
107 anzsrc-for:0206 schema:inDefinedTermSet anzsrc-for:
108 schema:name Quantum Physics
109 rdf:type schema:DefinedTerm
110 sg:journal.1136591 schema:issn 0367-3294
111 1063-7834
112 schema:name Physics of the Solid State
113 schema:publisher Pleiades Publishing
114 rdf:type schema:Periodical
115 sg:person.01064304443.31 schema:affiliation grid-institutes:grid.423485.c
116 schema:familyName Ivanov
117 schema:givenName S. V.
118 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01064304443.31
119 rdf:type schema:Person
120 sg:person.011264372143.83 schema:affiliation grid-institutes:grid.15447.33
121 schema:familyName Kyutt
122 schema:givenName R. N.
123 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011264372143.83
124 rdf:type schema:Person
125 sg:pub.10.1134/s1063784211050203 schema:sameAs https://app.dimensions.ai/details/publication/pub.1018570988
126 https://doi.org/10.1134/s1063784211050203
127 rdf:type schema:CreativeWork
128 sg:pub.10.1134/s1063785010080031 schema:sameAs https://app.dimensions.ai/details/publication/pub.1023730910
129 https://doi.org/10.1134/s1063785010080031
130 rdf:type schema:CreativeWork
131 grid-institutes:grid.15447.33 schema:alternateName St. Petersburg State University, Universitetskaya nab. 7-9, 199034, St. Petersburg, Russia
132 schema:name Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia
133 St. Petersburg State University, Universitetskaya nab. 7-9, 199034, St. Petersburg, Russia
134 rdf:type schema:Organization
135 grid-institutes:grid.423485.c schema:alternateName Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia
136 schema:name Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, 194021, St. Petersburg, Russia
137 rdf:type schema:Organization
 




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