Comparison of Thin Films of Titanium Dioxide Deposited by Sputtering and Sol–Gel Methods for Waveguiding Applications View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2022-03

AUTHORS

M. Brella, A. Taabouche, B. Gharbi, R. Gheriani, Y. Bouachiba, A. Bouabellou, H. Serrar, S. Touil, K. Laggoune, M. Boudissa

ABSTRACT

In this work, TiO2 thin films were deposited onto glass substrate by two different techniques: sol–gel dip-coating (SG) and reactive DC magnetron sputtering (Sput). The prepared samples have been characterized by means of micro-Raman, differential scanning calorimetry (DSC), thermogravimetric analysis (TGA) measurements, scanning electron microscopy (SEM), UV-Visible spectrophotometry, and M-Lines spectroscopy (MLS). The micro-Raman results showed an amorphous TiO2-SG phase and the vibrational mode of TiO2-Sput is anatase phase. DSC-TGA analysis was used to investigate the thermal properties of the TiO2 material. SEM spectroscopy has shown that TiO2-SG has a disordered and more porous surface, TiO2-Sput sample is homogeneous and shows uniform distribution of densely packed well-defined grains. The obtained films have an optical transmittance varying from 60 to 88% in the visible region. The optical band gaps deduced from the transmittance are 3.48 and 3.53 eV for TiO2-SG and TiO2-Sput, respectively. The optical waveguiding measurements carried out on TiO2-SG and TiO2-Sput films show single guided modes behavior (TE0 and TM0). These measurements have allowed deducing the refractive index and thickness values that are 2.06 at 216 nm for TiO2-SG and 2.26 at 204 nm for TiO2-Sput thin films. The analysis of waveguiding properties indicates that amorphous TiO2 may prove to be more efficient in photonic device as compared to crystalline TiO2. More... »

PAGES

234-239

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s106378262106004x

DOI

http://dx.doi.org/10.1134/s106378262106004x

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1148738448


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0204", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Condensed Matter Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0206", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Quantum Physics", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Universit\u00e9 Kasdi Merbah, 30000, Ouargla, Algeria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Universit\u00e9 Kasdi Merbah, 30000, Ouargla, Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Brella", 
        "givenName": "M.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000, Ouargla, Algeria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Thin Films and Interfaces Laboratory, University of Fr\u00e9res Mentouri Constantine, 25000, Constantine, Algeria", 
            "Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000, Ouargla, Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Taabouche", 
        "givenName": "A.", 
        "id": "sg:person.012342717537.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012342717537.34"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000, Ouargla, Algeria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Universit\u00e9 Kasdi Merbah, 30000, Ouargla, Algeria", 
            "Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000, Ouargla, Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Gharbi", 
        "givenName": "B.", 
        "id": "sg:person.012325410243.00", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012325410243.00"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Universit\u00e9 Kasdi Merbah, 30000, Ouargla, Algeria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Universit\u00e9 Kasdi Merbah, 30000, Ouargla, Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Gheriani", 
        "givenName": "R.", 
        "id": "sg:person.014567706143.24", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014567706143.24"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Laboratoire Technologie des Mat\u00e9riaux Avanc\u00e9s, Ecole Nationale Polytechnique de Constantine Malek BENNABI, BP 75A RP, Ali Mendjeli\u2014Constantine, Algerie", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Laboratoire Technologie des Mat\u00e9riaux Avanc\u00e9s, Ecole Nationale Polytechnique de Constantine Malek BENNABI, BP 75A RP, Ali Mendjeli\u2014Constantine, Algerie"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bouachiba", 
        "givenName": "Y.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Thin Films and Interfaces Laboratory, University of Fr\u00e9res Mentouri Constantine, 25000, Constantine, Algeria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Thin Films and Interfaces Laboratory, University of Fr\u00e9res Mentouri Constantine, 25000, Constantine, Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bouabellou", 
        "givenName": "A.", 
        "id": "sg:person.015330621537.35", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015330621537.35"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Research Center in Industrial Technologies (CRTI), BP 64, Cheraga (Alger), Algeria", 
          "id": "http://www.grid.ac/institutes/grid.510494.d", 
          "name": [
            "Research Center in Industrial Technologies (CRTI), BP 64, Cheraga (Alger), Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Serrar", 
        "givenName": "H.", 
        "id": "sg:person.016222776413.25", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016222776413.25"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Laboratoire Technologie des Mat\u00e9riaux Avanc\u00e9s, Ecole Nationale Polytechnique de Constantine Malek BENNABI, BP 75A RP, Ali Mendjeli\u2014Constantine, Algerie", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Laboratoire Technologie des Mat\u00e9riaux Avanc\u00e9s, Ecole Nationale Polytechnique de Constantine Malek BENNABI, BP 75A RP, Ali Mendjeli\u2014Constantine, Algerie"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Touil", 
        "givenName": "S.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Research Center in Industrial Technologies (CRTI), BP 64, Cheraga (Alger), Algeria", 
          "id": "http://www.grid.ac/institutes/grid.510494.d", 
          "name": [
            "Research Center in Industrial Technologies (CRTI), BP 64, Cheraga (Alger), Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Laggoune", 
        "givenName": "K.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "ENMC Laboratory, Department of Physics, Faculty of Sciences, University Ferhat Abbas, 19000, Setif, Algeria", 
          "id": "http://www.grid.ac/institutes/grid.411305.2", 
          "name": [
            "ENMC Laboratory, Department of Physics, Faculty of Sciences, University Ferhat Abbas, 19000, Setif, Algeria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Boudissa", 
        "givenName": "M.", 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/s1063782620020086", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1125340310", 
          "https://doi.org/10.1134/s1063782620020086"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1186/s11671-017-1875-5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1083688174", 
          "https://doi.org/10.1186/s11671-017-1875-5"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s10853-010-5113-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1001927763", 
          "https://doi.org/10.1007/s10853-010-5113-0"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/978-1-4615-8705-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1003306072", 
          "https://doi.org/10.1007/978-1-4615-8705-7"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2022-03", 
    "datePublishedReg": "2022-03-01", 
    "description": "In this work, TiO2 thin films were deposited onto glass substrate by two different techniques: sol\u2013gel dip-coating (SG) and reactive DC magnetron sputtering (Sput). The prepared samples have been characterized by means of micro-Raman, differential scanning calorimetry (DSC), thermogravimetric analysis (TGA) measurements, scanning electron microscopy (SEM), UV-Visible spectrophotometry, and M-Lines spectroscopy (MLS). The micro-Raman results showed an amorphous TiO2-SG phase and the vibrational mode of TiO2-Sput is anatase phase. DSC-TGA analysis was used to investigate the thermal properties of the TiO2 material. SEM spectroscopy has shown that TiO2-SG has a disordered and more porous surface, TiO2-Sput sample is homogeneous and shows uniform distribution of densely packed well-defined grains. The obtained films have an optical transmittance varying from 60 to 88% in the visible region. The optical band gaps deduced from the transmittance are 3.48 and 3.53 eV for TiO2-SG and TiO2-Sput, respectively. The optical waveguiding measurements carried out on TiO2-SG and TiO2-Sput films show single guided modes behavior (TE0 and TM0). These measurements have allowed deducing the refractive index and thickness values that are 2.06 at 216 nm for TiO2-SG and 2.26 at 204 nm for TiO2-Sput thin films. The analysis of waveguiding properties indicates that amorphous TiO2 may prove to be more efficient in photonic device as compared to crystalline TiO2.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s106378262106004x", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136692", 
        "issn": [
          "1063-7826", 
          "1090-6479"
        ], 
        "name": "Semiconductors", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "3", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "56"
      }
    ], 
    "keywords": [
      "M-line spectroscopy", 
      "thin films", 
      "optical band gap", 
      "micro-Raman results", 
      "TiO2 thin films", 
      "TiO2-SG", 
      "photonic devices", 
      "refractive index", 
      "waveguiding applications", 
      "optical transmittance", 
      "band gap", 
      "glass substrates", 
      "differential scanning calorimetry", 
      "sol\u2013gel dip", 
      "DC magnetron", 
      "visible region", 
      "mode behavior", 
      "micro-Raman", 
      "vibrational modes", 
      "UV-visible spectrophotometry", 
      "prepared samples", 
      "films", 
      "sol-gel method", 
      "transmittance", 
      "anatase phase", 
      "thermogravimetric analysis measurements", 
      "DSC-TGA analysis", 
      "electron microscopy", 
      "spectroscopy", 
      "crystalline TiO2", 
      "SEM spectroscopy", 
      "TiO2 materials", 
      "measurements", 
      "scanning calorimetry", 
      "analysis measurements", 
      "titanium dioxide", 
      "sputtering", 
      "amorphous TiO2", 
      "eV", 
      "thickness values", 
      "magnetron", 
      "porous surface", 
      "thermal properties", 
      "TiO2", 
      "properties", 
      "microscopy", 
      "phase", 
      "dip", 
      "devices", 
      "uniform distribution", 
      "different techniques", 
      "mode", 
      "gap", 
      "substrate", 
      "surface", 
      "calorimetry", 
      "coatings", 
      "spectrophotometry", 
      "dioxide", 
      "distribution", 
      "samples", 
      "materials", 
      "region", 
      "technique", 
      "applications", 
      "grains", 
      "means", 
      "work", 
      "behavior", 
      "method", 
      "values", 
      "comparison", 
      "results", 
      "index", 
      "analysis"
    ], 
    "name": "Comparison of Thin Films of Titanium Dioxide Deposited by Sputtering and Sol\u2013Gel Methods for Waveguiding Applications", 
    "pagination": "234-239", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1148738448"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s106378262106004x"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s106378262106004x", 
      "https://app.dimensions.ai/details/publication/pub.1148738448"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-09-02T16:06", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220902/entities/gbq_results/article/article_924.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s106378262106004x"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1134/s106378262106004x'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1134/s106378262106004x'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1134/s106378262106004x'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1134/s106378262106004x'


 

This table displays all metadata directly associated to this object as RDF triples.

222 TRIPLES      21 PREDICATES      105 URIs      92 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s106378262106004x schema:about anzsrc-for:02
2 anzsrc-for:0204
3 anzsrc-for:0206
4 schema:author N01529b87e8ae4a55a8c7e128a340d679
5 schema:citation sg:pub.10.1007/978-1-4615-8705-7
6 sg:pub.10.1007/s10853-010-5113-0
7 sg:pub.10.1134/s1063782620020086
8 sg:pub.10.1186/s11671-017-1875-5
9 schema:datePublished 2022-03
10 schema:datePublishedReg 2022-03-01
11 schema:description In this work, TiO2 thin films were deposited onto glass substrate by two different techniques: sol–gel dip-coating (SG) and reactive DC magnetron sputtering (Sput). The prepared samples have been characterized by means of micro-Raman, differential scanning calorimetry (DSC), thermogravimetric analysis (TGA) measurements, scanning electron microscopy (SEM), UV-Visible spectrophotometry, and M-Lines spectroscopy (MLS). The micro-Raman results showed an amorphous TiO2-SG phase and the vibrational mode of TiO2-Sput is anatase phase. DSC-TGA analysis was used to investigate the thermal properties of the TiO2 material. SEM spectroscopy has shown that TiO2-SG has a disordered and more porous surface, TiO2-Sput sample is homogeneous and shows uniform distribution of densely packed well-defined grains. The obtained films have an optical transmittance varying from 60 to 88% in the visible region. The optical band gaps deduced from the transmittance are 3.48 and 3.53 eV for TiO2-SG and TiO2-Sput, respectively. The optical waveguiding measurements carried out on TiO2-SG and TiO2-Sput films show single guided modes behavior (TE0 and TM0). These measurements have allowed deducing the refractive index and thickness values that are 2.06 at 216 nm for TiO2-SG and 2.26 at 204 nm for TiO2-Sput thin films. The analysis of waveguiding properties indicates that amorphous TiO2 may prove to be more efficient in photonic device as compared to crystalline TiO2.
12 schema:genre article
13 schema:isAccessibleForFree false
14 schema:isPartOf N7beff87c59cc4c1e91029581557a984e
15 Naaaa5e862dc34184af352a8ab58c163e
16 sg:journal.1136692
17 schema:keywords DC magnetron
18 DSC-TGA analysis
19 M-line spectroscopy
20 SEM spectroscopy
21 TiO2
22 TiO2 materials
23 TiO2 thin films
24 TiO2-SG
25 UV-visible spectrophotometry
26 amorphous TiO2
27 analysis
28 analysis measurements
29 anatase phase
30 applications
31 band gap
32 behavior
33 calorimetry
34 coatings
35 comparison
36 crystalline TiO2
37 devices
38 different techniques
39 differential scanning calorimetry
40 dioxide
41 dip
42 distribution
43 eV
44 electron microscopy
45 films
46 gap
47 glass substrates
48 grains
49 index
50 magnetron
51 materials
52 means
53 measurements
54 method
55 micro-Raman
56 micro-Raman results
57 microscopy
58 mode
59 mode behavior
60 optical band gap
61 optical transmittance
62 phase
63 photonic devices
64 porous surface
65 prepared samples
66 properties
67 refractive index
68 region
69 results
70 samples
71 scanning calorimetry
72 sol-gel method
73 sol–gel dip
74 spectrophotometry
75 spectroscopy
76 sputtering
77 substrate
78 surface
79 technique
80 thermal properties
81 thermogravimetric analysis measurements
82 thickness values
83 thin films
84 titanium dioxide
85 transmittance
86 uniform distribution
87 values
88 vibrational modes
89 visible region
90 waveguiding applications
91 work
92 schema:name Comparison of Thin Films of Titanium Dioxide Deposited by Sputtering and Sol–Gel Methods for Waveguiding Applications
93 schema:pagination 234-239
94 schema:productId N353f261ae5bd4686a87b87df9d548543
95 Na5be618fab94480aa7db46d6299c2b7c
96 schema:sameAs https://app.dimensions.ai/details/publication/pub.1148738448
97 https://doi.org/10.1134/s106378262106004x
98 schema:sdDatePublished 2022-09-02T16:06
99 schema:sdLicense https://scigraph.springernature.com/explorer/license/
100 schema:sdPublisher N9653e69e7c9445debbb77cf4da8c3147
101 schema:url https://doi.org/10.1134/s106378262106004x
102 sgo:license sg:explorer/license/
103 sgo:sdDataset articles
104 rdf:type schema:ScholarlyArticle
105 N01529b87e8ae4a55a8c7e128a340d679 rdf:first N883fa61f958b4466bea7b65fb517eb0b
106 rdf:rest N63c74b877a5b4ccea32628e3f1fc3a4e
107 N0350f35c040c4c949c4d06f0b7e7e07d rdf:first N9edd148984ad41f2a981ffef3cddbdf9
108 rdf:rest Nc533e9f53e7a47098a385ab45c2ce4a5
109 N28bf3d89c8b54d3eaaa8dab4c68fe37d rdf:first sg:person.014567706143.24
110 rdf:rest N39a04b8890054890bca965e9be2e9cc7
111 N2a4fa82074e54ebe907db551a1a6aed8 rdf:first sg:person.015330621537.35
112 rdf:rest Nf4db3b8219a6401aa1445d5ba33342e7
113 N2e071acb88d942de90e238191cf4fe2f rdf:first sg:person.012325410243.00
114 rdf:rest N28bf3d89c8b54d3eaaa8dab4c68fe37d
115 N353f261ae5bd4686a87b87df9d548543 schema:name doi
116 schema:value 10.1134/s106378262106004x
117 rdf:type schema:PropertyValue
118 N39a04b8890054890bca965e9be2e9cc7 rdf:first N92ed5277cc774d7e9f838eb00e81b58a
119 rdf:rest N2a4fa82074e54ebe907db551a1a6aed8
120 N63c74b877a5b4ccea32628e3f1fc3a4e rdf:first sg:person.012342717537.34
121 rdf:rest N2e071acb88d942de90e238191cf4fe2f
122 N6dfa4013b04d4906b770614b27115706 rdf:first Nb75af42f970e4effa883015ba172c41e
123 rdf:rest N0350f35c040c4c949c4d06f0b7e7e07d
124 N7beff87c59cc4c1e91029581557a984e schema:issueNumber 3
125 rdf:type schema:PublicationIssue
126 N883fa61f958b4466bea7b65fb517eb0b schema:affiliation grid-institutes:None
127 schema:familyName Brella
128 schema:givenName M.
129 rdf:type schema:Person
130 N92ed5277cc774d7e9f838eb00e81b58a schema:affiliation grid-institutes:None
131 schema:familyName Bouachiba
132 schema:givenName Y.
133 rdf:type schema:Person
134 N9653e69e7c9445debbb77cf4da8c3147 schema:name Springer Nature - SN SciGraph project
135 rdf:type schema:Organization
136 N9edd148984ad41f2a981ffef3cddbdf9 schema:affiliation grid-institutes:grid.510494.d
137 schema:familyName Laggoune
138 schema:givenName K.
139 rdf:type schema:Person
140 Na5be618fab94480aa7db46d6299c2b7c schema:name dimensions_id
141 schema:value pub.1148738448
142 rdf:type schema:PropertyValue
143 Naaaa5e862dc34184af352a8ab58c163e schema:volumeNumber 56
144 rdf:type schema:PublicationVolume
145 Nb75af42f970e4effa883015ba172c41e schema:affiliation grid-institutes:None
146 schema:familyName Touil
147 schema:givenName S.
148 rdf:type schema:Person
149 Nbb6cacdb99ff44889a01b65269a2ee59 schema:affiliation grid-institutes:grid.411305.2
150 schema:familyName Boudissa
151 schema:givenName M.
152 rdf:type schema:Person
153 Nc533e9f53e7a47098a385ab45c2ce4a5 rdf:first Nbb6cacdb99ff44889a01b65269a2ee59
154 rdf:rest rdf:nil
155 Nf4db3b8219a6401aa1445d5ba33342e7 rdf:first sg:person.016222776413.25
156 rdf:rest N6dfa4013b04d4906b770614b27115706
157 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
158 schema:name Physical Sciences
159 rdf:type schema:DefinedTerm
160 anzsrc-for:0204 schema:inDefinedTermSet anzsrc-for:
161 schema:name Condensed Matter Physics
162 rdf:type schema:DefinedTerm
163 anzsrc-for:0206 schema:inDefinedTermSet anzsrc-for:
164 schema:name Quantum Physics
165 rdf:type schema:DefinedTerm
166 sg:journal.1136692 schema:issn 1063-7826
167 1090-6479
168 schema:name Semiconductors
169 schema:publisher Pleiades Publishing
170 rdf:type schema:Periodical
171 sg:person.012325410243.00 schema:affiliation grid-institutes:None
172 schema:familyName Gharbi
173 schema:givenName B.
174 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012325410243.00
175 rdf:type schema:Person
176 sg:person.012342717537.34 schema:affiliation grid-institutes:None
177 schema:familyName Taabouche
178 schema:givenName A.
179 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012342717537.34
180 rdf:type schema:Person
181 sg:person.014567706143.24 schema:affiliation grid-institutes:None
182 schema:familyName Gheriani
183 schema:givenName R.
184 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014567706143.24
185 rdf:type schema:Person
186 sg:person.015330621537.35 schema:affiliation grid-institutes:None
187 schema:familyName Bouabellou
188 schema:givenName A.
189 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015330621537.35
190 rdf:type schema:Person
191 sg:person.016222776413.25 schema:affiliation grid-institutes:grid.510494.d
192 schema:familyName Serrar
193 schema:givenName H.
194 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016222776413.25
195 rdf:type schema:Person
196 sg:pub.10.1007/978-1-4615-8705-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1003306072
197 https://doi.org/10.1007/978-1-4615-8705-7
198 rdf:type schema:CreativeWork
199 sg:pub.10.1007/s10853-010-5113-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1001927763
200 https://doi.org/10.1007/s10853-010-5113-0
201 rdf:type schema:CreativeWork
202 sg:pub.10.1134/s1063782620020086 schema:sameAs https://app.dimensions.ai/details/publication/pub.1125340310
203 https://doi.org/10.1134/s1063782620020086
204 rdf:type schema:CreativeWork
205 sg:pub.10.1186/s11671-017-1875-5 schema:sameAs https://app.dimensions.ai/details/publication/pub.1083688174
206 https://doi.org/10.1186/s11671-017-1875-5
207 rdf:type schema:CreativeWork
208 grid-institutes:None schema:alternateName Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000, Ouargla, Algeria
209 Laboratoire Technologie des Matériaux Avancés, Ecole Nationale Polytechnique de Constantine Malek BENNABI, BP 75A RP, Ali Mendjeli—Constantine, Algerie
210 Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Université Kasdi Merbah, 30000, Ouargla, Algeria
211 Thin Films and Interfaces Laboratory, University of Fréres Mentouri Constantine, 25000, Constantine, Algeria
212 schema:name Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000, Ouargla, Algeria
213 Laboratoire Technologie des Matériaux Avancés, Ecole Nationale Polytechnique de Constantine Malek BENNABI, BP 75A RP, Ali Mendjeli—Constantine, Algerie
214 Laboratoire de Rayonnement et Plasmas et Physique des Surfaces (LRPPS), Université Kasdi Merbah, 30000, Ouargla, Algeria
215 Thin Films and Interfaces Laboratory, University of Fréres Mentouri Constantine, 25000, Constantine, Algeria
216 rdf:type schema:Organization
217 grid-institutes:grid.411305.2 schema:alternateName ENMC Laboratory, Department of Physics, Faculty of Sciences, University Ferhat Abbas, 19000, Setif, Algeria
218 schema:name ENMC Laboratory, Department of Physics, Faculty of Sciences, University Ferhat Abbas, 19000, Setif, Algeria
219 rdf:type schema:Organization
220 grid-institutes:grid.510494.d schema:alternateName Research Center in Industrial Technologies (CRTI), BP 64, Cheraga (Alger), Algeria
221 schema:name Research Center in Industrial Technologies (CRTI), BP 64, Cheraga (Alger), Algeria
222 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...