On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride View Full Text


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Article Info

DATE

2017-06-04

AUTHORS

L. N. Lukyanova, A. Yu. Bibik, V. A. Aseev, O. A. Usov, I. V. Makarenko, V. N. Petrov, N. V. Nikonorov

ABSTRACT

Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of n-Bi2Te3 and solid solutions based on Bi2Te3. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions. More... »

PAGES

729-731

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063782617060197

DOI

http://dx.doi.org/10.1134/s1063782617060197

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1085749908


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