Spatial redistribution of radiation in flip-chip photodiodes based on InAsSbP/InAs double heterostructures View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2017-02-10

AUTHORS

A. L. Zakgeim, N. D. Il’inskaya, S. A. Karandashev, A. A. Lavrov, B. A. Matveev, M. A. Remennyy, N. M. Stus’, A. A. Usikova, A. E. Cherniakov

ABSTRACT

The spatial distribution of equilibrium and nonequilibrium (including luminescent) IR (infrared) radiation in flip-chip photodiodes based on InAsSbP/InAs double heterostructures (λmax = 3.4 μm) is measured and analyzed; the structural features of the photodiodes, including the reflective properties of the ohmic contacts, are taken into account. Optical area enhancement due to multiple internal reflection in photodiodes with different geometric characteristics is estimated. More... »

PAGES

260-266

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063782617020269

DOI

http://dx.doi.org/10.1134/s1063782617020269

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1083760505


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Scientific and Technological Center for Microelectronics, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.4886.2", 
          "name": [
            "Scientific and Technological Center for Microelectronics, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Zakgeim", 
        "givenName": "A. L.", 
        "id": "sg:person.013407777511.05", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013407777511.05"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Il\u2019inskaya", 
        "givenName": "N. D.", 
        "id": "sg:person.010015773715.60", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010015773715.60"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Karandashev", 
        "givenName": "S. A.", 
        "id": "sg:person.011410734715.80", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011410734715.80"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Open Company \u201cIoffeLED\u201d, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "Open Company \u201cIoffeLED\u201d, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lavrov", 
        "givenName": "A. A.", 
        "id": "sg:person.07540535643.36", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07540535643.36"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Matveev", 
        "givenName": "B. A.", 
        "id": "sg:person.014376636715.56", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014376636715.56"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Remennyy", 
        "givenName": "M. A.", 
        "id": "sg:person.014604304715.02", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014604304715.02"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Stus\u2019", 
        "givenName": "N. M.", 
        "id": "sg:person.016561444345.82", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016561444345.82"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Usikova", 
        "givenName": "A. A.", 
        "id": "sg:person.015514341643.20", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015514341643.20"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Scientific and Technological Center for Microelectronics, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.4886.2", 
          "name": [
            "Scientific and Technological Center for Microelectronics, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Cherniakov", 
        "givenName": "A. E.", 
        "id": "sg:person.07606633053.65", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07606633053.65"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/1.1755879", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1015856340", 
          "https://doi.org/10.1134/1.1755879"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063782609030257", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1003526299", 
          "https://doi.org/10.1134/s1063782609030257"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063782607110188", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1025922313", 
          "https://doi.org/10.1134/s1063782607110188"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2017-02-10", 
    "datePublishedReg": "2017-02-10", 
    "description": "The spatial distribution of equilibrium and nonequilibrium (including luminescent) IR (infrared) radiation in flip-chip photodiodes based on InAsSbP/InAs double heterostructures (\u03bbmax = 3.4 \u03bcm) is measured and analyzed; the structural features of the photodiodes, including the reflective properties of the ohmic contacts, are taken into account. Optical area enhancement due to multiple internal reflection in photodiodes with different geometric characteristics is estimated.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063782617020269", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136692", 
        "issn": [
          "1063-7826", 
          "1090-6479"
        ], 
        "name": "Semiconductors", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "2", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "51"
      }
    ], 
    "keywords": [
      "double heterostructures", 
      "different geometric characteristics", 
      "ohmic contacts", 
      "multiple internal reflections", 
      "area enhancement", 
      "photodiodes", 
      "geometric characteristics", 
      "reflective properties", 
      "heterostructures", 
      "internal reflection", 
      "IR radiation", 
      "spatial distribution", 
      "spatial redistribution", 
      "properties", 
      "radiation", 
      "enhancement", 
      "contact", 
      "characteristics", 
      "structural features", 
      "distribution", 
      "redistribution", 
      "account", 
      "equilibrium", 
      "features", 
      "reflection"
    ], 
    "name": "Spatial redistribution of radiation in flip-chip photodiodes based on InAsSbP/InAs double heterostructures", 
    "pagination": "260-266", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1083760505"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063782617020269"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063782617020269", 
      "https://app.dimensions.ai/details/publication/pub.1083760505"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-05-20T07:33", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220519/entities/gbq_results/article/article_730.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063782617020269"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1134/s1063782617020269'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1134/s1063782617020269'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1134/s1063782617020269'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1134/s1063782617020269'


 

This table displays all metadata directly associated to this object as RDF triples.

158 TRIPLES      22 PREDICATES      53 URIs      42 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063782617020269 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N657605e895434532be986f35f3c235e8
4 schema:citation sg:pub.10.1134/1.1755879
5 sg:pub.10.1134/s1063782607110188
6 sg:pub.10.1134/s1063782609030257
7 schema:datePublished 2017-02-10
8 schema:datePublishedReg 2017-02-10
9 schema:description The spatial distribution of equilibrium and nonequilibrium (including luminescent) IR (infrared) radiation in flip-chip photodiodes based on InAsSbP/InAs double heterostructures (λmax = 3.4 μm) is measured and analyzed; the structural features of the photodiodes, including the reflective properties of the ohmic contacts, are taken into account. Optical area enhancement due to multiple internal reflection in photodiodes with different geometric characteristics is estimated.
10 schema:genre article
11 schema:inLanguage en
12 schema:isAccessibleForFree false
13 schema:isPartOf N3aeac3bb33aa46b7b05b7b2d754b561b
14 N596e989e07884cf68c750741e7b6144a
15 sg:journal.1136692
16 schema:keywords IR radiation
17 account
18 area enhancement
19 characteristics
20 contact
21 different geometric characteristics
22 distribution
23 double heterostructures
24 enhancement
25 equilibrium
26 features
27 geometric characteristics
28 heterostructures
29 internal reflection
30 multiple internal reflections
31 ohmic contacts
32 photodiodes
33 properties
34 radiation
35 redistribution
36 reflection
37 reflective properties
38 spatial distribution
39 spatial redistribution
40 structural features
41 schema:name Spatial redistribution of radiation in flip-chip photodiodes based on InAsSbP/InAs double heterostructures
42 schema:pagination 260-266
43 schema:productId N557551d4264b45e7b07ff4d2f2584d0a
44 N8686007e31504695baeff9c6db078f27
45 schema:sameAs https://app.dimensions.ai/details/publication/pub.1083760505
46 https://doi.org/10.1134/s1063782617020269
47 schema:sdDatePublished 2022-05-20T07:33
48 schema:sdLicense https://scigraph.springernature.com/explorer/license/
49 schema:sdPublisher Nf0843da80d0f4cbaafc8843a63eff4a0
50 schema:url https://doi.org/10.1134/s1063782617020269
51 sgo:license sg:explorer/license/
52 sgo:sdDataset articles
53 rdf:type schema:ScholarlyArticle
54 N04c58842b80e456e9ccd4d24ca722ce0 rdf:first sg:person.015514341643.20
55 rdf:rest Nffca0bfb590148c993e8d526a4c5b3f6
56 N067fea6db51547b49e1cf234421486d3 rdf:first sg:person.011410734715.80
57 rdf:rest Nbbfcdbd6ea5f46c1af75b5f6e76a087a
58 N3aeac3bb33aa46b7b05b7b2d754b561b schema:issueNumber 2
59 rdf:type schema:PublicationIssue
60 N557551d4264b45e7b07ff4d2f2584d0a schema:name dimensions_id
61 schema:value pub.1083760505
62 rdf:type schema:PropertyValue
63 N596e989e07884cf68c750741e7b6144a schema:volumeNumber 51
64 rdf:type schema:PublicationVolume
65 N657605e895434532be986f35f3c235e8 rdf:first sg:person.013407777511.05
66 rdf:rest N6b28009a728945c9adee1108fce487a4
67 N6b28009a728945c9adee1108fce487a4 rdf:first sg:person.010015773715.60
68 rdf:rest N067fea6db51547b49e1cf234421486d3
69 N7d66ab35b5d14dbf972d3bc0d222d829 rdf:first sg:person.014604304715.02
70 rdf:rest Ncd6d5b1014db4d67bd92407e8a75384b
71 N8686007e31504695baeff9c6db078f27 schema:name doi
72 schema:value 10.1134/s1063782617020269
73 rdf:type schema:PropertyValue
74 Nad3b48d50766468ba33d5775da320fed rdf:first sg:person.014376636715.56
75 rdf:rest N7d66ab35b5d14dbf972d3bc0d222d829
76 Nbbfcdbd6ea5f46c1af75b5f6e76a087a rdf:first sg:person.07540535643.36
77 rdf:rest Nad3b48d50766468ba33d5775da320fed
78 Ncd6d5b1014db4d67bd92407e8a75384b rdf:first sg:person.016561444345.82
79 rdf:rest N04c58842b80e456e9ccd4d24ca722ce0
80 Nf0843da80d0f4cbaafc8843a63eff4a0 schema:name Springer Nature - SN SciGraph project
81 rdf:type schema:Organization
82 Nffca0bfb590148c993e8d526a4c5b3f6 rdf:first sg:person.07606633053.65
83 rdf:rest rdf:nil
84 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
85 schema:name Physical Sciences
86 rdf:type schema:DefinedTerm
87 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
88 schema:name Other Physical Sciences
89 rdf:type schema:DefinedTerm
90 sg:journal.1136692 schema:issn 1063-7826
91 1090-6479
92 schema:name Semiconductors
93 schema:publisher Pleiades Publishing
94 rdf:type schema:Periodical
95 sg:person.010015773715.60 schema:affiliation grid-institutes:grid.423485.c
96 schema:familyName Il’inskaya
97 schema:givenName N. D.
98 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010015773715.60
99 rdf:type schema:Person
100 sg:person.011410734715.80 schema:affiliation grid-institutes:grid.423485.c
101 schema:familyName Karandashev
102 schema:givenName S. A.
103 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011410734715.80
104 rdf:type schema:Person
105 sg:person.013407777511.05 schema:affiliation grid-institutes:grid.4886.2
106 schema:familyName Zakgeim
107 schema:givenName A. L.
108 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013407777511.05
109 rdf:type schema:Person
110 sg:person.014376636715.56 schema:affiliation grid-institutes:grid.423485.c
111 schema:familyName Matveev
112 schema:givenName B. A.
113 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014376636715.56
114 rdf:type schema:Person
115 sg:person.014604304715.02 schema:affiliation grid-institutes:grid.423485.c
116 schema:familyName Remennyy
117 schema:givenName M. A.
118 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014604304715.02
119 rdf:type schema:Person
120 sg:person.015514341643.20 schema:affiliation grid-institutes:grid.423485.c
121 schema:familyName Usikova
122 schema:givenName A. A.
123 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015514341643.20
124 rdf:type schema:Person
125 sg:person.016561444345.82 schema:affiliation grid-institutes:grid.423485.c
126 schema:familyName Stus’
127 schema:givenName N. M.
128 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016561444345.82
129 rdf:type schema:Person
130 sg:person.07540535643.36 schema:affiliation grid-institutes:None
131 schema:familyName Lavrov
132 schema:givenName A. A.
133 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07540535643.36
134 rdf:type schema:Person
135 sg:person.07606633053.65 schema:affiliation grid-institutes:grid.4886.2
136 schema:familyName Cherniakov
137 schema:givenName A. E.
138 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07606633053.65
139 rdf:type schema:Person
140 sg:pub.10.1134/1.1755879 schema:sameAs https://app.dimensions.ai/details/publication/pub.1015856340
141 https://doi.org/10.1134/1.1755879
142 rdf:type schema:CreativeWork
143 sg:pub.10.1134/s1063782607110188 schema:sameAs https://app.dimensions.ai/details/publication/pub.1025922313
144 https://doi.org/10.1134/s1063782607110188
145 rdf:type schema:CreativeWork
146 sg:pub.10.1134/s1063782609030257 schema:sameAs https://app.dimensions.ai/details/publication/pub.1003526299
147 https://doi.org/10.1134/s1063782609030257
148 rdf:type schema:CreativeWork
149 grid-institutes:None schema:alternateName Open Company “IoffeLED”, 194021, St. Petersburg, Russia
150 schema:name Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
151 Open Company “IoffeLED”, 194021, St. Petersburg, Russia
152 rdf:type schema:Organization
153 grid-institutes:grid.423485.c schema:alternateName Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
154 schema:name Ioffe Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
155 rdf:type schema:Organization
156 grid-institutes:grid.4886.2 schema:alternateName Scientific and Technological Center for Microelectronics, Russian Academy of Sciences, 194021, St. Petersburg, Russia
157 schema:name Scientific and Technological Center for Microelectronics, Russian Academy of Sciences, 194021, St. Petersburg, Russia
158 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...