Elastic strains and delocalized optical phonons in AlN/GaN superlattices View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2016-08-02

AUTHORS

D. V. Pankin, M. B. Smirnov, V. Yu. Davydov, A. N. Smirnov, E. E. Zavarin, W. V. Lundin

ABSTRACT

In the context of the dielectric continuum model, a correlation is established between the frequencies of delocalized A(TO) and E(LO) phonons in the Raman spectra of short-period AlN/GaN superlattices and the ratio between the layer thicknesses in the structure. It is shown that elastic strains produced in the materials of the layer during superlattice growth only slightly influence the correlation dependence of the frequencies of A(TO) and E(LO) modes with high intensities in the Raman spectra on the structural parameter defining the ratios between the layer thicknesses. The results of calculations of the phonon frequencies are in good agreement with available experimental data and can be used for spectroscopic diagnostics of AlN/GaN superlattices. More... »

PAGES

1043-1048

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063782616080169

DOI

http://dx.doi.org/10.1134/s1063782616080169

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1036567944


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0204", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Condensed Matter Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0206", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Quantum Physics", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Resource Center for Optical and Laser Materials Research, St. Petersburg State University, 199034, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.15447.33", 
          "name": [
            "St. Petersburg State University, 199034, St. Petersburg, Russia", 
            "Resource Center for Optical and Laser Materials Research, St. Petersburg State University, 199034, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Pankin", 
        "givenName": "D. V.", 
        "id": "sg:person.010405112163.01", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010405112163.01"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "St. Petersburg State University, 199034, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.15447.33", 
          "name": [
            "St. Petersburg State University, 199034, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Smirnov", 
        "givenName": "M. B.", 
        "id": "sg:person.011343357147.33", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011343357147.33"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Davydov", 
        "givenName": "V. Yu.", 
        "id": "sg:person.011312702323.51", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011312702323.51"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Smirnov", 
        "givenName": "A. N.", 
        "id": "sg:person.014243650571.24", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014243650571.24"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Zavarin", 
        "givenName": "E. E.", 
        "id": "sg:person.015451372144.61", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015451372144.61"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical\u2013Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lundin", 
        "givenName": "W. V.", 
        "id": "sg:person.013543521751.29", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013543521751.29"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/1.1913991", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1040575314", 
          "https://doi.org/10.1134/1.1913991"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/s1063774513070109", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1014552072", 
          "https://doi.org/10.1134/s1063774513070109"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2016-08-02", 
    "datePublishedReg": "2016-08-02", 
    "description": "In the context of the dielectric continuum model, a correlation is established between the frequencies of delocalized A(TO) and E(LO) phonons in the Raman spectra of short-period AlN/GaN superlattices and the ratio between the layer thicknesses in the structure. It is shown that elastic strains produced in the materials of the layer during superlattice growth only slightly influence the correlation dependence of the frequencies of A(TO) and E(LO) modes with high intensities in the Raman spectra on the structural parameter defining the ratios between the layer thicknesses. The results of calculations of the phonon frequencies are in good agreement with available experimental data and can be used for spectroscopic diagnostics of AlN/GaN superlattices.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063782616080169", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136692", 
        "issn": [
          "1063-7826", 
          "1090-6479"
        ], 
        "name": "Semiconductors", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "8", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "50"
      }
    ], 
    "keywords": [
      "AlN/GaN superlattices", 
      "GaN superlattices", 
      "short-period AlN/GaN superlattices", 
      "dielectric continuum model", 
      "spectroscopic diagnostics", 
      "optical phonons", 
      "Raman spectra", 
      "superlattice growth", 
      "available experimental data", 
      "results of calculations", 
      "phonon frequencies", 
      "layer thickness", 
      "superlattices", 
      "phonons", 
      "high intensity", 
      "good agreement", 
      "experimental data", 
      "elastic strain", 
      "spectra", 
      "structural parameters", 
      "continuum model", 
      "thickness", 
      "calculations", 
      "frequency", 
      "diagnostics", 
      "dependence", 
      "intensity", 
      "correlation dependence", 
      "agreement", 
      "layer", 
      "mode", 
      "structure", 
      "ratio", 
      "materials", 
      "parameters", 
      "correlation", 
      "model", 
      "results", 
      "data", 
      "growth", 
      "strains", 
      "context"
    ], 
    "name": "Elastic strains and delocalized optical phonons in AlN/GaN superlattices", 
    "pagination": "1043-1048", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1036567944"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063782616080169"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063782616080169", 
      "https://app.dimensions.ai/details/publication/pub.1036567944"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2021-12-01T19:36", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20211201/entities/gbq_results/article/article_694.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063782616080169"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1134/s1063782616080169'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1134/s1063782616080169'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1134/s1063782616080169'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1134/s1063782616080169'


 

This table displays all metadata directly associated to this object as RDF triples.

152 TRIPLES      22 PREDICATES      70 URIs      59 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063782616080169 schema:about anzsrc-for:02
2 anzsrc-for:0204
3 anzsrc-for:0206
4 schema:author Nf2547b8d722d457e950bfff1b99f363e
5 schema:citation sg:pub.10.1134/1.1913991
6 sg:pub.10.1134/s1063774513070109
7 schema:datePublished 2016-08-02
8 schema:datePublishedReg 2016-08-02
9 schema:description In the context of the dielectric continuum model, a correlation is established between the frequencies of delocalized A(TO) and E(LO) phonons in the Raman spectra of short-period AlN/GaN superlattices and the ratio between the layer thicknesses in the structure. It is shown that elastic strains produced in the materials of the layer during superlattice growth only slightly influence the correlation dependence of the frequencies of A(TO) and E(LO) modes with high intensities in the Raman spectra on the structural parameter defining the ratios between the layer thicknesses. The results of calculations of the phonon frequencies are in good agreement with available experimental data and can be used for spectroscopic diagnostics of AlN/GaN superlattices.
10 schema:genre article
11 schema:inLanguage en
12 schema:isAccessibleForFree false
13 schema:isPartOf N3f4de440251c4a2d9032e7cee8ad3f8f
14 Nd6e38280b9d14a80860053ec13b6ba2a
15 sg:journal.1136692
16 schema:keywords AlN/GaN superlattices
17 GaN superlattices
18 Raman spectra
19 agreement
20 available experimental data
21 calculations
22 context
23 continuum model
24 correlation
25 correlation dependence
26 data
27 dependence
28 diagnostics
29 dielectric continuum model
30 elastic strain
31 experimental data
32 frequency
33 good agreement
34 growth
35 high intensity
36 intensity
37 layer
38 layer thickness
39 materials
40 mode
41 model
42 optical phonons
43 parameters
44 phonon frequencies
45 phonons
46 ratio
47 results
48 results of calculations
49 short-period AlN/GaN superlattices
50 spectra
51 spectroscopic diagnostics
52 strains
53 structural parameters
54 structure
55 superlattice growth
56 superlattices
57 thickness
58 schema:name Elastic strains and delocalized optical phonons in AlN/GaN superlattices
59 schema:pagination 1043-1048
60 schema:productId N61ee193bcb0846f093216d6be57953df
61 N90a7a6e8d3524f9ea3c82853eee2dc9d
62 schema:sameAs https://app.dimensions.ai/details/publication/pub.1036567944
63 https://doi.org/10.1134/s1063782616080169
64 schema:sdDatePublished 2021-12-01T19:36
65 schema:sdLicense https://scigraph.springernature.com/explorer/license/
66 schema:sdPublisher N42e9f6edeaf6486fb9d9cd2c30ba8915
67 schema:url https://doi.org/10.1134/s1063782616080169
68 sgo:license sg:explorer/license/
69 sgo:sdDataset articles
70 rdf:type schema:ScholarlyArticle
71 N3c19522df4a948408d3926aa15f1b4bf rdf:first sg:person.014243650571.24
72 rdf:rest N4991f5f25f034fdfb450fb04d7142d89
73 N3f4de440251c4a2d9032e7cee8ad3f8f schema:issueNumber 8
74 rdf:type schema:PublicationIssue
75 N42e9f6edeaf6486fb9d9cd2c30ba8915 schema:name Springer Nature - SN SciGraph project
76 rdf:type schema:Organization
77 N4991f5f25f034fdfb450fb04d7142d89 rdf:first sg:person.015451372144.61
78 rdf:rest Nb2d49cffbff34d59b9166590f606d8f0
79 N61ee193bcb0846f093216d6be57953df schema:name doi
80 schema:value 10.1134/s1063782616080169
81 rdf:type schema:PropertyValue
82 N90a7a6e8d3524f9ea3c82853eee2dc9d schema:name dimensions_id
83 schema:value pub.1036567944
84 rdf:type schema:PropertyValue
85 Nad1399df4c4f4a55ae01e8dffc6c2562 rdf:first sg:person.011343357147.33
86 rdf:rest Nb3bec952de6745fb824467e08ecf2940
87 Nb2d49cffbff34d59b9166590f606d8f0 rdf:first sg:person.013543521751.29
88 rdf:rest rdf:nil
89 Nb3bec952de6745fb824467e08ecf2940 rdf:first sg:person.011312702323.51
90 rdf:rest N3c19522df4a948408d3926aa15f1b4bf
91 Nd6e38280b9d14a80860053ec13b6ba2a schema:volumeNumber 50
92 rdf:type schema:PublicationVolume
93 Nf2547b8d722d457e950bfff1b99f363e rdf:first sg:person.010405112163.01
94 rdf:rest Nad1399df4c4f4a55ae01e8dffc6c2562
95 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
96 schema:name Physical Sciences
97 rdf:type schema:DefinedTerm
98 anzsrc-for:0204 schema:inDefinedTermSet anzsrc-for:
99 schema:name Condensed Matter Physics
100 rdf:type schema:DefinedTerm
101 anzsrc-for:0206 schema:inDefinedTermSet anzsrc-for:
102 schema:name Quantum Physics
103 rdf:type schema:DefinedTerm
104 sg:journal.1136692 schema:issn 1063-7826
105 1090-6479
106 schema:name Semiconductors
107 schema:publisher Pleiades Publishing
108 rdf:type schema:Periodical
109 sg:person.010405112163.01 schema:affiliation grid-institutes:grid.15447.33
110 schema:familyName Pankin
111 schema:givenName D. V.
112 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010405112163.01
113 rdf:type schema:Person
114 sg:person.011312702323.51 schema:affiliation grid-institutes:grid.423485.c
115 schema:familyName Davydov
116 schema:givenName V. Yu.
117 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011312702323.51
118 rdf:type schema:Person
119 sg:person.011343357147.33 schema:affiliation grid-institutes:grid.15447.33
120 schema:familyName Smirnov
121 schema:givenName M. B.
122 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011343357147.33
123 rdf:type schema:Person
124 sg:person.013543521751.29 schema:affiliation grid-institutes:grid.423485.c
125 schema:familyName Lundin
126 schema:givenName W. V.
127 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013543521751.29
128 rdf:type schema:Person
129 sg:person.014243650571.24 schema:affiliation grid-institutes:grid.423485.c
130 schema:familyName Smirnov
131 schema:givenName A. N.
132 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014243650571.24
133 rdf:type schema:Person
134 sg:person.015451372144.61 schema:affiliation grid-institutes:grid.423485.c
135 schema:familyName Zavarin
136 schema:givenName E. E.
137 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015451372144.61
138 rdf:type schema:Person
139 sg:pub.10.1134/1.1913991 schema:sameAs https://app.dimensions.ai/details/publication/pub.1040575314
140 https://doi.org/10.1134/1.1913991
141 rdf:type schema:CreativeWork
142 sg:pub.10.1134/s1063774513070109 schema:sameAs https://app.dimensions.ai/details/publication/pub.1014552072
143 https://doi.org/10.1134/s1063774513070109
144 rdf:type schema:CreativeWork
145 grid-institutes:grid.15447.33 schema:alternateName Resource Center for Optical and Laser Materials Research, St. Petersburg State University, 199034, St. Petersburg, Russia
146 St. Petersburg State University, 199034, St. Petersburg, Russia
147 schema:name Resource Center for Optical and Laser Materials Research, St. Petersburg State University, 199034, St. Petersburg, Russia
148 St. Petersburg State University, 199034, St. Petersburg, Russia
149 rdf:type schema:Organization
150 grid-institutes:grid.423485.c schema:alternateName Ioffe Physical–Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
151 schema:name Ioffe Physical–Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
152 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...