Method for studying the light-induced degradation of α-Si:H/μc-Si:H tandem photovoltaic converters under increased illuminance View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2013-10-12

AUTHORS

O. I. Chesta, G. M. Ablayev, A. A. Blatov, A. V. Bobyl, V. M. Emelyanov, D. L. Orekhov, E. I. Terukov, N. Kh. Timoshina, M. Z. Shvarts

ABSTRACT

An experimental installation and the procedure for its use in accelerated tests of thin-film α-Si:H/μc-Si:H photovoltaic converters with dimensions of up to 100 × 100 mm on light-induced degradation under an increased illumination level (up to 10 kW/m2) are described. Estimates of the levels of photoinduced degradation of photovoltaic converters, obtained by conventional and developed procedures, are compared and it is demonstrated that the procedure for studying the photoinduced degradation at an increased illumination level can make the test duration 100 times shorter while providing fully adequate assessment of the stability of photovoltaic converters based on amorphous and microcrystalline silicon. More... »

PAGES

1376-1381

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1063782613100060

DOI

http://dx.doi.org/10.1134/s1063782613100060

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1008120808


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0204", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Condensed Matter Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0206", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Quantum Physics", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Chesta", 
        "givenName": "O. I.", 
        "id": "sg:person.010010372366.85", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010010372366.85"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Saint-Petersburg Academic University, Nanotechnology Research and Education Center, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35135.31", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "Saint-Petersburg Academic University, Nanotechnology Research and Education Center, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ablayev", 
        "givenName": "G. M.", 
        "id": "sg:person.012052004555.41", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012052004555.41"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "National University of Science and Technology MISIS, 119049, Moscow, Russia", 
          "id": "http://www.grid.ac/institutes/grid.35043.31", 
          "name": [
            "National University of Science and Technology MISIS, 119049, Moscow, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Blatov", 
        "givenName": "A. A.", 
        "id": "sg:person.012410232507.29", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012410232507.29"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bobyl", 
        "givenName": "A. V.", 
        "id": "sg:person.01112735762.54", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01112735762.54"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Emelyanov", 
        "givenName": "V. M.", 
        "id": "sg:person.013577330372.24", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013577330372.24"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Orekhov", 
        "givenName": "D. L.", 
        "id": "sg:person.016362233051.86", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016362233051.86"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Terukov", 
        "givenName": "E. I.", 
        "id": "sg:person.010654066166.61", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010654066166.61"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Timoshina", 
        "givenName": "N. Kh.", 
        "id": "sg:person.013705471175.43", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013705471175.43"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia", 
          "id": "http://www.grid.ac/institutes/grid.423485.c", 
          "name": [
            "Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia", 
            "OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Shvarts", 
        "givenName": "M. Z.", 
        "id": "sg:person.016332220465.73", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016332220465.73"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1134/s1063782613050102", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1048382040", 
          "https://doi.org/10.1134/s1063782613050102"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1557/proc-467-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1067938487", 
          "https://doi.org/10.1557/proc-467-7"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1557/proc-336-699", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1067927755", 
          "https://doi.org/10.1557/proc-336-699"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2013-10-12", 
    "datePublishedReg": "2013-10-12", 
    "description": "An experimental installation and the procedure for its use in accelerated tests of thin-film \u03b1-Si:H/\u03bcc-Si:H photovoltaic converters with dimensions of up to 100 \u00d7 100 mm on light-induced degradation under an increased illumination level (up to 10 kW/m2) are described. Estimates of the levels of photoinduced degradation of photovoltaic converters, obtained by conventional and developed procedures, are compared and it is demonstrated that the procedure for studying the photoinduced degradation at an increased illumination level can make the test duration 100 times shorter while providing fully adequate assessment of the stability of photovoltaic converters based on amorphous and microcrystalline silicon.", 
    "genre": "article", 
    "id": "sg:pub.10.1134/s1063782613100060", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136692", 
        "issn": [
          "1063-7826", 
          "1090-6479"
        ], 
        "name": "Semiconductors", 
        "publisher": "Pleiades Publishing", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "10", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "47"
      }
    ], 
    "keywords": [
      "photovoltaic converters", 
      "\u03bcc-Si", 
      "light-induced degradation", 
      "microcrystalline silicon", 
      "experimental installation", 
      "converter", 
      "accelerated tests", 
      "illumination levels", 
      "Si", 
      "developed procedure", 
      "degradation", 
      "silicon", 
      "installation", 
      "stability", 
      "procedure", 
      "method", 
      "illuminance", 
      "test", 
      "time", 
      "dimensions", 
      "use", 
      "estimates", 
      "levels", 
      "assessment", 
      "adequate assessment"
    ], 
    "name": "Method for studying the light-induced degradation of \u03b1-Si:H/\u03bcc-Si:H tandem photovoltaic converters under increased illuminance", 
    "pagination": "1376-1381", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1008120808"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1134/s1063782613100060"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1134/s1063782613100060", 
      "https://app.dimensions.ai/details/publication/pub.1008120808"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-05-10T10:06", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220509/entities/gbq_results/article/article_596.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1134/s1063782613100060"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1134/s1063782613100060'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1134/s1063782613100060'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1134/s1063782613100060'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1134/s1063782613100060'


 

This table displays all metadata directly associated to this object as RDF triples.

164 TRIPLES      22 PREDICATES      54 URIs      42 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1134/s1063782613100060 schema:about anzsrc-for:02
2 anzsrc-for:0204
3 anzsrc-for:0206
4 schema:author N0778b093d52c4b4f9b7de9c488a9ec2b
5 schema:citation sg:pub.10.1134/s1063782613050102
6 sg:pub.10.1557/proc-336-699
7 sg:pub.10.1557/proc-467-7
8 schema:datePublished 2013-10-12
9 schema:datePublishedReg 2013-10-12
10 schema:description An experimental installation and the procedure for its use in accelerated tests of thin-film α-Si:H/μc-Si:H photovoltaic converters with dimensions of up to 100 × 100 mm on light-induced degradation under an increased illumination level (up to 10 kW/m2) are described. Estimates of the levels of photoinduced degradation of photovoltaic converters, obtained by conventional and developed procedures, are compared and it is demonstrated that the procedure for studying the photoinduced degradation at an increased illumination level can make the test duration 100 times shorter while providing fully adequate assessment of the stability of photovoltaic converters based on amorphous and microcrystalline silicon.
11 schema:genre article
12 schema:inLanguage en
13 schema:isAccessibleForFree false
14 schema:isPartOf N17d08b6ce7484a6a993a8ed112fd2e23
15 Ne9c44d3932ad494293775aec8c4a9690
16 sg:journal.1136692
17 schema:keywords Si
18 accelerated tests
19 adequate assessment
20 assessment
21 converter
22 degradation
23 developed procedure
24 dimensions
25 estimates
26 experimental installation
27 illuminance
28 illumination levels
29 installation
30 levels
31 light-induced degradation
32 method
33 microcrystalline silicon
34 photovoltaic converters
35 procedure
36 silicon
37 stability
38 test
39 time
40 use
41 μc-Si
42 schema:name Method for studying the light-induced degradation of α-Si:H/μc-Si:H tandem photovoltaic converters under increased illuminance
43 schema:pagination 1376-1381
44 schema:productId N3b4e23c948884c3bad61f95623ffc450
45 N79fac79f48d94bffaca839ab821a2299
46 schema:sameAs https://app.dimensions.ai/details/publication/pub.1008120808
47 https://doi.org/10.1134/s1063782613100060
48 schema:sdDatePublished 2022-05-10T10:06
49 schema:sdLicense https://scigraph.springernature.com/explorer/license/
50 schema:sdPublisher Na6755bd2895c436eae87ffd52d13d606
51 schema:url https://doi.org/10.1134/s1063782613100060
52 sgo:license sg:explorer/license/
53 sgo:sdDataset articles
54 rdf:type schema:ScholarlyArticle
55 N0778b093d52c4b4f9b7de9c488a9ec2b rdf:first sg:person.010010372366.85
56 rdf:rest N70eb75cc5d3b405bad3718cc19880b9e
57 N170feedede994a18827ff379fe439031 rdf:first sg:person.010654066166.61
58 rdf:rest N172d617a3b8540c783058ffcc4a795d3
59 N172d617a3b8540c783058ffcc4a795d3 rdf:first sg:person.013705471175.43
60 rdf:rest N47fbbc38a120444fbe6f3e100dbc4164
61 N17d08b6ce7484a6a993a8ed112fd2e23 schema:volumeNumber 47
62 rdf:type schema:PublicationVolume
63 N324d38fce1614a5a81234f88f7c38111 rdf:first sg:person.01112735762.54
64 rdf:rest N9d181993334a4ed19e9fe05c6916e18a
65 N3b4e23c948884c3bad61f95623ffc450 schema:name doi
66 schema:value 10.1134/s1063782613100060
67 rdf:type schema:PropertyValue
68 N47fbbc38a120444fbe6f3e100dbc4164 rdf:first sg:person.016332220465.73
69 rdf:rest rdf:nil
70 N70eb75cc5d3b405bad3718cc19880b9e rdf:first sg:person.012052004555.41
71 rdf:rest N97c3391ff0174e47901c1ef475c7c5c1
72 N79fac79f48d94bffaca839ab821a2299 schema:name dimensions_id
73 schema:value pub.1008120808
74 rdf:type schema:PropertyValue
75 N97c3391ff0174e47901c1ef475c7c5c1 rdf:first sg:person.012410232507.29
76 rdf:rest N324d38fce1614a5a81234f88f7c38111
77 N9d181993334a4ed19e9fe05c6916e18a rdf:first sg:person.013577330372.24
78 rdf:rest Ncf047bca8e8d4cfdae66b81f11a9fcb2
79 Na6755bd2895c436eae87ffd52d13d606 schema:name Springer Nature - SN SciGraph project
80 rdf:type schema:Organization
81 Ncf047bca8e8d4cfdae66b81f11a9fcb2 rdf:first sg:person.016362233051.86
82 rdf:rest N170feedede994a18827ff379fe439031
83 Ne9c44d3932ad494293775aec8c4a9690 schema:issueNumber 10
84 rdf:type schema:PublicationIssue
85 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
86 schema:name Physical Sciences
87 rdf:type schema:DefinedTerm
88 anzsrc-for:0204 schema:inDefinedTermSet anzsrc-for:
89 schema:name Condensed Matter Physics
90 rdf:type schema:DefinedTerm
91 anzsrc-for:0206 schema:inDefinedTermSet anzsrc-for:
92 schema:name Quantum Physics
93 rdf:type schema:DefinedTerm
94 sg:journal.1136692 schema:issn 1063-7826
95 1090-6479
96 schema:name Semiconductors
97 schema:publisher Pleiades Publishing
98 rdf:type schema:Periodical
99 sg:person.010010372366.85 schema:affiliation grid-institutes:grid.423485.c
100 schema:familyName Chesta
101 schema:givenName O. I.
102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010010372366.85
103 rdf:type schema:Person
104 sg:person.010654066166.61 schema:affiliation grid-institutes:grid.423485.c
105 schema:familyName Terukov
106 schema:givenName E. I.
107 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010654066166.61
108 rdf:type schema:Person
109 sg:person.01112735762.54 schema:affiliation grid-institutes:grid.423485.c
110 schema:familyName Bobyl
111 schema:givenName A. V.
112 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01112735762.54
113 rdf:type schema:Person
114 sg:person.012052004555.41 schema:affiliation grid-institutes:grid.35135.31
115 schema:familyName Ablayev
116 schema:givenName G. M.
117 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012052004555.41
118 rdf:type schema:Person
119 sg:person.012410232507.29 schema:affiliation grid-institutes:grid.35043.31
120 schema:familyName Blatov
121 schema:givenName A. A.
122 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012410232507.29
123 rdf:type schema:Person
124 sg:person.013577330372.24 schema:affiliation grid-institutes:grid.423485.c
125 schema:familyName Emelyanov
126 schema:givenName V. M.
127 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013577330372.24
128 rdf:type schema:Person
129 sg:person.013705471175.43 schema:affiliation grid-institutes:grid.423485.c
130 schema:familyName Timoshina
131 schema:givenName N. Kh.
132 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013705471175.43
133 rdf:type schema:Person
134 sg:person.016332220465.73 schema:affiliation grid-institutes:grid.423485.c
135 schema:familyName Shvarts
136 schema:givenName M. Z.
137 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016332220465.73
138 rdf:type schema:Person
139 sg:person.016362233051.86 schema:affiliation grid-institutes:grid.423485.c
140 schema:familyName Orekhov
141 schema:givenName D. L.
142 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016362233051.86
143 rdf:type schema:Person
144 sg:pub.10.1134/s1063782613050102 schema:sameAs https://app.dimensions.ai/details/publication/pub.1048382040
145 https://doi.org/10.1134/s1063782613050102
146 rdf:type schema:CreativeWork
147 sg:pub.10.1557/proc-336-699 schema:sameAs https://app.dimensions.ai/details/publication/pub.1067927755
148 https://doi.org/10.1557/proc-336-699
149 rdf:type schema:CreativeWork
150 sg:pub.10.1557/proc-467-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1067938487
151 https://doi.org/10.1557/proc-467-7
152 rdf:type schema:CreativeWork
153 grid-institutes:grid.35043.31 schema:alternateName National University of Science and Technology MISIS, 119049, Moscow, Russia
154 schema:name National University of Science and Technology MISIS, 119049, Moscow, Russia
155 rdf:type schema:Organization
156 grid-institutes:grid.35135.31 schema:alternateName Saint-Petersburg Academic University, Nanotechnology Research and Education Center, Russian Academy of Sciences, 194021, St. Petersburg, Russia
157 schema:name Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
158 Saint-Petersburg Academic University, Nanotechnology Research and Education Center, Russian Academy of Sciences, 194021, St. Petersburg, Russia
159 rdf:type schema:Organization
160 grid-institutes:grid.423485.c schema:alternateName Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
161 OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia
162 schema:name Ioffe Physical-Technical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia
163 OOO R&D Center of Thin Film Technologies in Energetics under Ioffe Physical-Technical Institute, 194064, St. Petersburg, Russia
164 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...