Ontology type: schema:ScholarlyArticle
2007-04
AUTHORSA. A. Kovalyov, O. P. Pchelyakov, V. V. Preobrazhenskii, M. A. Putyato, N. N. Rubtsova
ABSTRACTA reflection interferometer based on a thin metal film is proposed to measure the phase of the reflection spectrum of laser mirrors. The device is applied to the study of the phase characteristics of the all-semiconductor mirror which combines the functions of the saturable absorber and the dispersion compensator (all-in-one) in the Nd3+:KGd(WO4)2 laser operating in the ultrashort-pulse regime. The method provides improvement of spectral resolutions and an increase in the accuracy in the measurement of the phase characteristics. More... »
PAGES478-481
http://scigraph.springernature.com/pub.10.1134/s1054660x07040275
DOIhttp://dx.doi.org/10.1134/s1054660x07040275
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