A new technique to measure the phase characteristics of laser mirrors based on semiconductor heterostructures View Full Text


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Article Info

DATE

2007-04

AUTHORS

A. A. Kovalyov, O. P. Pchelyakov, V. V. Preobrazhenskii, M. A. Putyato, N. N. Rubtsova

ABSTRACT

A reflection interferometer based on a thin metal film is proposed to measure the phase of the reflection spectrum of laser mirrors. The device is applied to the study of the phase characteristics of the all-semiconductor mirror which combines the functions of the saturable absorber and the dispersion compensator (all-in-one) in the Nd3+:KGd(WO4)2 laser operating in the ultrashort-pulse regime. The method provides improvement of spectral resolutions and an increase in the accuracy in the measurement of the phase characteristics. More... »

PAGES

478-481

References to SciGraph publications

Journal

TITLE

Laser Physics

ISSUE

4

VOLUME

17

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s1054660x07040275

DOI

http://dx.doi.org/10.1134/s1054660x07040275

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1045702500


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