Ontology type: schema:ScholarlyArticle
2016-07
AUTHORSS. A. Poluyanov, F. V. Tuzikov, Yu. V. Larichev, S. V. Tsybulya
ABSTRACTNew approaches to the analysis of small-angle X-ray scattering data from nanoscale systems based on the optimization and direct multiple shooting methods are presented. A program is developed, which bears on these new approaches and allows a user to model small-angle X-ray diffraction data, introduce collimation corrections, and analyze dispersions in the samples. The program results for a number of typical nanosized systems (sols, catalysts) are reported and the comparison with currently available programs for small-angle data processing is presented. More... »
PAGES771-776
http://scigraph.springernature.com/pub.10.1134/s0022476616040211
DOIhttp://dx.doi.org/10.1134/s0022476616040211
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