Growth and structure of Mg(Fe0.8Ga0.2)2O4 − δ films View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2011-09

AUTHORS

A. V. Trukhanov, A. I. Stognij, N. N. Novitskii, S. V. Trukhanov, V. A. Ketsko

ABSTRACT

Films 150–200 nm in thickness, with the nominal composition Mg(Fe0.8Ga0.2)2O4 − δ have been grown on (100) single-crystal silicon substrates by ion-beam sputtering in vacuum. The effect of growth and annealing conditions on the crystal structure and morphology of the films has been studied, and the thermal conditions for the growth of spinel-structure films have been optimized. More... »

PAGES

1025

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/s0020168511090226

DOI

http://dx.doi.org/10.1134/s0020168511090226

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1045414457


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