Low-energy electron mean free path in thin films of copper phthalocyanine View Full Text


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Article Info

DATE

2003-12

AUTHORS

S. A. Komolov, É. F. Lazneva, A. S. Komolov

ABSTRACT

The formation of thin organic films of copper phthalocyanine (CuPc) deposited onto the surface of gold-coated quartz crystal resonator was studied in situ under ultrahigh vacuum conditions by means of total electron-beam-induced current spectroscopy in combination with deposit thickness determination by piezocrystal microbalance technique. Variations in the fine structure of the total current spectra of CuPc layers of var-ious thicknesses in the 0–8 nm interval have been analyzed and the electron mean free path in thin CuPc films was determined as a function of the electron energy. For electron energies of 5.0, 7.2, 14.4, and 18.0 eV above the Fermi level, the mean free path is 6.4, 3.9, 2.6, and 2.3 nm. More... »

PAGES

974-976

Identifiers

URI

http://scigraph.springernature.com/pub.10.1134/1.1639446

DOI

http://dx.doi.org/10.1134/1.1639446

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1000240355


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