Complete information acquisition in dynamic force microscopy View Full Text


Ontology type: schema:ScholarlyArticle      Open Access: True


Article Info

DATE

2015-12

AUTHORS

Alexei Belianinov, Sergei V. Kalinin, Stephen Jesse

ABSTRACT

Scanning probe microscopy has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of scanning probe measurements is the information transfer from the tip-surface junction to the measurement system. This process reduces responses at multiple degrees of freedom of the probe to relatively few parameters recorded as images. Similarly, details of dynamic cantilever response at sub-microsecond time scales, higher-order eigenmodes and harmonics are lost by transitioning to the millisecond time scale of pixel acquisition. Hence, information accessible to the operator is severely limited, and its selection is biased by data processing methods. Here we report a fundamentally new approach for dynamic Atomic Force Microscopy imaging based on information-theory analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material's properties and their mutual interactions, and imaging at the information channel capacity limit. More... »

PAGES

6550

References to SciGraph publications

  • 2006-10. How the doors to the nanoworld were opened in NATURE NANOTECHNOLOGY
  • 1985. Scanning Tunneling Microscopy in PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS
  • 2010-02. New modes for subsurface atomic force microscopy through nanomechanical coupling in NATURE NANOTECHNOLOGY
  • Identifiers

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    http://scigraph.springernature.com/pub.10.1038/ncomms7550

    DOI

    http://dx.doi.org/10.1038/ncomms7550

    DIMENSIONS

    https://app.dimensions.ai/details/publication/pub.1044250976

    PUBMED

    https://www.ncbi.nlm.nih.gov/pubmed/25766370


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