Electrical Properties of Nanocrystalline CeO2–Y2O3 Thin Films Prepared by the Sol-Gel Method View Full Text


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Article Info

DATE

2003-07

AUTHORS

H. M. Yue, Z. L. Liu, Y. Wang, K. L. Yao

ABSTRACT

The nanocrystalline ceria thin films doped with yttria of different concentrations were prepared by using the sol-gel dip-coating method. The complex impedance of the films was measured at various temperatures. It is found that the complex impedance spectroscopies of our nanocrystalline ceria-based thin films show only a residual grain boundary arc, and that the total impedance is increased with an increasing Y3+ concentration and is decreased as the operating temperature is raised. More... »

PAGES

720-724

References to SciGraph publications

  • 1999-04. Novel NO2-Sensing Properties of Sol–Gel-Derived SnO2–(Y2O3) Thin Films in JOURNAL OF MATERIALS SCIENCE LETTERS
  • 1997-01. Nonstoichiometry and Electrical Conductivity of Nanocrystalline CeO in JOURNAL OF ELECTROCERAMICS
  • 1991-07. Mechanical stability of sol-gel films in JOURNAL OF MATERIALS SCIENCE
  • Identifiers

    URI

    http://scigraph.springernature.com/pub.10.1023/a:1024591910056

    DOI

    http://dx.doi.org/10.1023/a:1024591910056

    DIMENSIONS

    https://app.dimensions.ai/details/publication/pub.1016432304


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    JSON-LD is the canonical representation for SciGraph data.

    TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

    [
      {
        "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
        "about": [
          {
            "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/03", 
            "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
            "name": "Chemical Sciences", 
            "type": "DefinedTerm"
          }, 
          {
            "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0306", 
            "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
            "name": "Physical Chemistry (incl. Structural)", 
            "type": "DefinedTerm"
          }
        ], 
        "author": [
          {
            "affiliation": {
              "alternateName": "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China", 
              "id": "http://www.grid.ac/institutes/grid.33199.31", 
              "name": [
                "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Yue", 
            "givenName": "H. M.", 
            "id": "sg:person.011717104576.05", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011717104576.05"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China", 
              "id": "http://www.grid.ac/institutes/grid.33199.31", 
              "name": [
                "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Liu", 
            "givenName": "Z. L.", 
            "id": "sg:person.011052646464.92", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011052646464.92"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China", 
              "id": "http://www.grid.ac/institutes/grid.33199.31", 
              "name": [
                "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Wang", 
            "givenName": "Y.", 
            "id": "sg:person.013312045576.91", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013312045576.91"
            ], 
            "type": "Person"
          }, 
          {
            "affiliation": {
              "alternateName": "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China", 
              "id": "http://www.grid.ac/institutes/grid.33199.31", 
              "name": [
                "Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China"
              ], 
              "type": "Organization"
            }, 
            "familyName": "Yao", 
            "givenName": "K. L.", 
            "id": "sg:person.012133406471.13", 
            "sameAs": [
              "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012133406471.13"
            ], 
            "type": "Person"
          }
        ], 
        "citation": [
          {
            "id": "sg:pub.10.1023/a:1009934829870", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1035725133", 
              "https://doi.org/10.1023/a:1009934829870"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1023/a:1006659204467", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1035860056", 
              "https://doi.org/10.1023/a:1006659204467"
            ], 
            "type": "CreativeWork"
          }, 
          {
            "id": "sg:pub.10.1007/bf01184984", 
            "sameAs": [
              "https://app.dimensions.ai/details/publication/pub.1043277019", 
              "https://doi.org/10.1007/bf01184984"
            ], 
            "type": "CreativeWork"
          }
        ], 
        "datePublished": "2003-07", 
        "datePublishedReg": "2003-07-01", 
        "description": "The nanocrystalline ceria thin films doped with yttria of different concentrations were prepared by using the sol-gel dip-coating method. The complex impedance of the films was measured at various temperatures. It is found that the complex impedance spectroscopies of our nanocrystalline ceria-based thin films show only a residual grain boundary arc, and that the total impedance is increased with an increasing Y3+ concentration and is decreased as the operating temperature is raised.", 
        "genre": "article", 
        "id": "sg:pub.10.1023/a:1024591910056", 
        "isAccessibleForFree": false, 
        "isPartOf": [
          {
            "id": "sg:journal.1297638", 
            "issn": [
              "0020-1685", 
              "1608-3172"
            ], 
            "name": "Inorganic Materials", 
            "publisher": "Springer Nature", 
            "type": "Periodical"
          }, 
          {
            "issueNumber": "7", 
            "type": "PublicationIssue"
          }, 
          {
            "type": "PublicationVolume", 
            "volumeNumber": "39"
          }
        ], 
        "keywords": [
          "thin films", 
          "nanocrystalline ceria thin films", 
          "sol\u2013gel dip-coating method", 
          "dip-coating method", 
          "grain boundary arc", 
          "ceria thin films", 
          "complex impedance spectroscopy", 
          "operating temperature", 
          "sol-gel method", 
          "electrical properties", 
          "complex impedance", 
          "total impedance", 
          "impedance spectroscopy", 
          "films", 
          "impedance", 
          "temperature", 
          "yttria", 
          "boundary arcs", 
          "different concentrations", 
          "method", 
          "properties", 
          "spectroscopy", 
          "arc", 
          "Y3", 
          "concentration"
        ], 
        "name": "Electrical Properties of Nanocrystalline CeO2\u2013Y2O3 Thin Films Prepared by the Sol-Gel Method", 
        "pagination": "720-724", 
        "productId": [
          {
            "name": "dimensions_id", 
            "type": "PropertyValue", 
            "value": [
              "pub.1016432304"
            ]
          }, 
          {
            "name": "doi", 
            "type": "PropertyValue", 
            "value": [
              "10.1023/a:1024591910056"
            ]
          }
        ], 
        "sameAs": [
          "https://doi.org/10.1023/a:1024591910056", 
          "https://app.dimensions.ai/details/publication/pub.1016432304"
        ], 
        "sdDataset": "articles", 
        "sdDatePublished": "2022-09-02T15:51", 
        "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
        "sdPublisher": {
          "name": "Springer Nature - SN SciGraph project", 
          "type": "Organization"
        }, 
        "sdSource": "s3://com-springernature-scigraph/baseset/20220902/entities/gbq_results/article/article_372.jsonl", 
        "type": "ScholarlyArticle", 
        "url": "https://doi.org/10.1023/a:1024591910056"
      }
    ]
     

    Download the RDF metadata as:  json-ld nt turtle xml License info

    HOW TO GET THIS DATA PROGRAMMATICALLY:

    JSON-LD is a popular format for linked data which is fully compatible with JSON.

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    This table displays all metadata directly associated to this object as RDF triples.

    115 TRIPLES      21 PREDICATES      53 URIs      42 LITERALS      6 BLANK NODES

    Subject Predicate Object
    1 sg:pub.10.1023/a:1024591910056 schema:about anzsrc-for:03
    2 anzsrc-for:0306
    3 schema:author Ne328f6eebe034ce08536dfdb3f690710
    4 schema:citation sg:pub.10.1007/bf01184984
    5 sg:pub.10.1023/a:1006659204467
    6 sg:pub.10.1023/a:1009934829870
    7 schema:datePublished 2003-07
    8 schema:datePublishedReg 2003-07-01
    9 schema:description The nanocrystalline ceria thin films doped with yttria of different concentrations were prepared by using the sol-gel dip-coating method. The complex impedance of the films was measured at various temperatures. It is found that the complex impedance spectroscopies of our nanocrystalline ceria-based thin films show only a residual grain boundary arc, and that the total impedance is increased with an increasing Y3+ concentration and is decreased as the operating temperature is raised.
    10 schema:genre article
    11 schema:isAccessibleForFree false
    12 schema:isPartOf N88fd19a3389744c1a7c94d8a552e0958
    13 Nacd1fdc72fbd457c912f2b53a9b3fdde
    14 sg:journal.1297638
    15 schema:keywords Y3
    16 arc
    17 boundary arcs
    18 ceria thin films
    19 complex impedance
    20 complex impedance spectroscopy
    21 concentration
    22 different concentrations
    23 dip-coating method
    24 electrical properties
    25 films
    26 grain boundary arc
    27 impedance
    28 impedance spectroscopy
    29 method
    30 nanocrystalline ceria thin films
    31 operating temperature
    32 properties
    33 sol-gel method
    34 sol–gel dip-coating method
    35 spectroscopy
    36 temperature
    37 thin films
    38 total impedance
    39 yttria
    40 schema:name Electrical Properties of Nanocrystalline CeO2–Y2O3 Thin Films Prepared by the Sol-Gel Method
    41 schema:pagination 720-724
    42 schema:productId N49fe57e53f714bb594ac10709b52e8d6
    43 Ne116eb288de4460ca754d002673809dc
    44 schema:sameAs https://app.dimensions.ai/details/publication/pub.1016432304
    45 https://doi.org/10.1023/a:1024591910056
    46 schema:sdDatePublished 2022-09-02T15:51
    47 schema:sdLicense https://scigraph.springernature.com/explorer/license/
    48 schema:sdPublisher Nc6266b0af79445bf94f9fc3a24199a1b
    49 schema:url https://doi.org/10.1023/a:1024591910056
    50 sgo:license sg:explorer/license/
    51 sgo:sdDataset articles
    52 rdf:type schema:ScholarlyArticle
    53 N49fe57e53f714bb594ac10709b52e8d6 schema:name doi
    54 schema:value 10.1023/a:1024591910056
    55 rdf:type schema:PropertyValue
    56 N4d1acad6fc164ac287a3da79ae71a74d rdf:first sg:person.013312045576.91
    57 rdf:rest N58df7aab476247dda3b9693bf6e0dbbe
    58 N58df7aab476247dda3b9693bf6e0dbbe rdf:first sg:person.012133406471.13
    59 rdf:rest rdf:nil
    60 N5e28eb66c90e45558f5703f60c700f5d rdf:first sg:person.011052646464.92
    61 rdf:rest N4d1acad6fc164ac287a3da79ae71a74d
    62 N88fd19a3389744c1a7c94d8a552e0958 schema:volumeNumber 39
    63 rdf:type schema:PublicationVolume
    64 Nacd1fdc72fbd457c912f2b53a9b3fdde schema:issueNumber 7
    65 rdf:type schema:PublicationIssue
    66 Nc6266b0af79445bf94f9fc3a24199a1b schema:name Springer Nature - SN SciGraph project
    67 rdf:type schema:Organization
    68 Ne116eb288de4460ca754d002673809dc schema:name dimensions_id
    69 schema:value pub.1016432304
    70 rdf:type schema:PropertyValue
    71 Ne328f6eebe034ce08536dfdb3f690710 rdf:first sg:person.011717104576.05
    72 rdf:rest N5e28eb66c90e45558f5703f60c700f5d
    73 anzsrc-for:03 schema:inDefinedTermSet anzsrc-for:
    74 schema:name Chemical Sciences
    75 rdf:type schema:DefinedTerm
    76 anzsrc-for:0306 schema:inDefinedTermSet anzsrc-for:
    77 schema:name Physical Chemistry (incl. Structural)
    78 rdf:type schema:DefinedTerm
    79 sg:journal.1297638 schema:issn 0020-1685
    80 1608-3172
    81 schema:name Inorganic Materials
    82 schema:publisher Springer Nature
    83 rdf:type schema:Periodical
    84 sg:person.011052646464.92 schema:affiliation grid-institutes:grid.33199.31
    85 schema:familyName Liu
    86 schema:givenName Z. L.
    87 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011052646464.92
    88 rdf:type schema:Person
    89 sg:person.011717104576.05 schema:affiliation grid-institutes:grid.33199.31
    90 schema:familyName Yue
    91 schema:givenName H. M.
    92 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011717104576.05
    93 rdf:type schema:Person
    94 sg:person.012133406471.13 schema:affiliation grid-institutes:grid.33199.31
    95 schema:familyName Yao
    96 schema:givenName K. L.
    97 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012133406471.13
    98 rdf:type schema:Person
    99 sg:person.013312045576.91 schema:affiliation grid-institutes:grid.33199.31
    100 schema:familyName Wang
    101 schema:givenName Y.
    102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013312045576.91
    103 rdf:type schema:Person
    104 sg:pub.10.1007/bf01184984 schema:sameAs https://app.dimensions.ai/details/publication/pub.1043277019
    105 https://doi.org/10.1007/bf01184984
    106 rdf:type schema:CreativeWork
    107 sg:pub.10.1023/a:1006659204467 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035860056
    108 https://doi.org/10.1023/a:1006659204467
    109 rdf:type schema:CreativeWork
    110 sg:pub.10.1023/a:1009934829870 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035725133
    111 https://doi.org/10.1023/a:1009934829870
    112 rdf:type schema:CreativeWork
    113 grid-institutes:grid.33199.31 schema:alternateName Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China
    114 schema:name Department of Physics and the State Key Lab of Laser Technology, Huazhong University of Science and Technology, 430074, Wuhan, China
    115 rdf:type schema:Organization
     




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