Digital Photography in Measuring the Inclination of the Object Surface with Formation of a Speckle Structure View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2003-05

AUTHORS

V. A. Zubov, T. T. Sultanov

ABSTRACT

Optical schemes for measuring surface inclination due to shift or deformation are considered. Speckle-interferometry methods are used. The distinguished features of these schemes are connected with using a digital photocamera and a forming speckle structure in nonmonochromatic light. Several technical solutions are proposed making it possibile to measure inclination with an accuracy up to tenths of degree using standard cheap equipment. To form the speckle structure, the pattern of a random binary structure with unit size of several millimeters is used in the base fixed plane. The digital camera was placed in the analyzed plane and turned together with the plane. It registered a reduced image of the pattern. The registration was done for two positions of the surface, the pattern being illuminated by the camera flash lamp. Measuring the width and orientation of the interference fringes formed for the two speckle structures allows one to determine the inclination and orientation of the rotation axis. More... »

PAGES

204-219

Identifiers

URI

http://scigraph.springernature.com/pub.10.1023/a:1024047708354

DOI

http://dx.doi.org/10.1023/a:1024047708354

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1004158074


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "P. N. Lebedev Physical Institute, Russian Academy of Sciences, Leninskii Pr. 53, 119991, Moscow, Russia", 
          "id": "http://www.grid.ac/institutes/grid.425806.d", 
          "name": [
            "P. N. Lebedev Physical Institute, Russian Academy of Sciences, Leninskii Pr. 53, 119991, Moscow, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Zubov", 
        "givenName": "V. A.", 
        "id": "sg:person.013653363167.80", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013653363167.80"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "P. N. Lebedev Physical Institute, Russian Academy of Sciences, Leninskii Pr. 53, 119991, Moscow, Russia", 
          "id": "http://www.grid.ac/institutes/grid.425806.d", 
          "name": [
            "P. N. Lebedev Physical Institute, Russian Academy of Sciences, Leninskii Pr. 53, 119991, Moscow, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Sultanov", 
        "givenName": "T. T.", 
        "id": "sg:person.014226050506.53", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014226050506.53"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2003-05", 
    "datePublishedReg": "2003-05-01", 
    "description": "Optical schemes for measuring surface inclination due to shift or deformation are considered. Speckle-interferometry methods are used. The distinguished features of these schemes are connected with using a digital photocamera and a forming speckle structure in nonmonochromatic light. Several technical solutions are proposed making it possibile to measure inclination with an accuracy up to tenths of degree using standard cheap equipment. To form the speckle structure, the pattern of a random binary structure with unit size of several millimeters is used in the base fixed plane. The digital camera was placed in the analyzed plane and turned together with the plane. It registered a reduced image of the pattern. The registration was done for two positions of the surface, the pattern being illuminated by the camera flash lamp. Measuring the width and orientation of the interference fringes formed for the two speckle structures allows one to determine the inclination and orientation of the rotation axis.", 
    "genre": "article", 
    "id": "sg:pub.10.1023/a:1024047708354", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1091852", 
        "issn": [
          "0270-2010", 
          "1071-2836"
        ], 
        "name": "Journal of Russian Laser Research", 
        "publisher": "Springer Nature", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "3", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "24"
      }
    ], 
    "keywords": [
      "speckle structure", 
      "cheap equipment", 
      "surface inclination", 
      "tenths of degree", 
      "technical solutions", 
      "nonmonochromatic light", 
      "flash lamp", 
      "binary structure", 
      "interference fringes", 
      "digital camera", 
      "object surface", 
      "surface", 
      "distinguished features", 
      "digital photocamera", 
      "analyzed plane", 
      "deformation", 
      "inclination", 
      "plane", 
      "structure", 
      "equipment", 
      "unit size", 
      "rotation axis", 
      "orientation", 
      "optical scheme", 
      "millimeters", 
      "lamp", 
      "scheme", 
      "width", 
      "camera", 
      "solution", 
      "accuracy", 
      "fringes", 
      "size", 
      "digital photography", 
      "method", 
      "photocamera", 
      "tenth", 
      "photography", 
      "formation", 
      "images", 
      "axis", 
      "base", 
      "possibile", 
      "position", 
      "degree", 
      "features", 
      "light", 
      "patterns", 
      "registration", 
      "shift", 
      "Speckle-interferometry methods", 
      "standard cheap equipment", 
      "random binary structure", 
      "camera flash lamp"
    ], 
    "name": "Digital Photography in Measuring the Inclination of the Object Surface with Formation of a Speckle Structure", 
    "pagination": "204-219", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1004158074"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1023/a:1024047708354"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1023/a:1024047708354", 
      "https://app.dimensions.ai/details/publication/pub.1004158074"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2021-12-01T19:14", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20211201/entities/gbq_results/article/article_372.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1023/a:1024047708354"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1023/a:1024047708354'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1023/a:1024047708354'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1023/a:1024047708354'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1023/a:1024047708354'


 

This table displays all metadata directly associated to this object as RDF triples.

119 TRIPLES      21 PREDICATES      80 URIs      72 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1023/a:1024047708354 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N763da4cb0802423ba98e3b1b59ba3625
4 schema:datePublished 2003-05
5 schema:datePublishedReg 2003-05-01
6 schema:description Optical schemes for measuring surface inclination due to shift or deformation are considered. Speckle-interferometry methods are used. The distinguished features of these schemes are connected with using a digital photocamera and a forming speckle structure in nonmonochromatic light. Several technical solutions are proposed making it possibile to measure inclination with an accuracy up to tenths of degree using standard cheap equipment. To form the speckle structure, the pattern of a random binary structure with unit size of several millimeters is used in the base fixed plane. The digital camera was placed in the analyzed plane and turned together with the plane. It registered a reduced image of the pattern. The registration was done for two positions of the surface, the pattern being illuminated by the camera flash lamp. Measuring the width and orientation of the interference fringes formed for the two speckle structures allows one to determine the inclination and orientation of the rotation axis.
7 schema:genre article
8 schema:inLanguage en
9 schema:isAccessibleForFree false
10 schema:isPartOf N5218a17b2e194eceb71c567394862695
11 Nda5a7c1f3cbd40f883450dee11e6cacc
12 sg:journal.1091852
13 schema:keywords Speckle-interferometry methods
14 accuracy
15 analyzed plane
16 axis
17 base
18 binary structure
19 camera
20 camera flash lamp
21 cheap equipment
22 deformation
23 degree
24 digital camera
25 digital photocamera
26 digital photography
27 distinguished features
28 equipment
29 features
30 flash lamp
31 formation
32 fringes
33 images
34 inclination
35 interference fringes
36 lamp
37 light
38 method
39 millimeters
40 nonmonochromatic light
41 object surface
42 optical scheme
43 orientation
44 patterns
45 photocamera
46 photography
47 plane
48 position
49 possibile
50 random binary structure
51 registration
52 rotation axis
53 scheme
54 shift
55 size
56 solution
57 speckle structure
58 standard cheap equipment
59 structure
60 surface
61 surface inclination
62 technical solutions
63 tenth
64 tenths of degree
65 unit size
66 width
67 schema:name Digital Photography in Measuring the Inclination of the Object Surface with Formation of a Speckle Structure
68 schema:pagination 204-219
69 schema:productId Nf9a870a3b9444b5ea8ee9bef10d8380e
70 Nfcf5727aba014fb6adece546037451b3
71 schema:sameAs https://app.dimensions.ai/details/publication/pub.1004158074
72 https://doi.org/10.1023/a:1024047708354
73 schema:sdDatePublished 2021-12-01T19:14
74 schema:sdLicense https://scigraph.springernature.com/explorer/license/
75 schema:sdPublisher N95c9ded04fc345a38260fc536eb96052
76 schema:url https://doi.org/10.1023/a:1024047708354
77 sgo:license sg:explorer/license/
78 sgo:sdDataset articles
79 rdf:type schema:ScholarlyArticle
80 N5218a17b2e194eceb71c567394862695 schema:issueNumber 3
81 rdf:type schema:PublicationIssue
82 N763da4cb0802423ba98e3b1b59ba3625 rdf:first sg:person.013653363167.80
83 rdf:rest N7f58f4affcb4419daf9c5efe9004841f
84 N7f58f4affcb4419daf9c5efe9004841f rdf:first sg:person.014226050506.53
85 rdf:rest rdf:nil
86 N95c9ded04fc345a38260fc536eb96052 schema:name Springer Nature - SN SciGraph project
87 rdf:type schema:Organization
88 Nda5a7c1f3cbd40f883450dee11e6cacc schema:volumeNumber 24
89 rdf:type schema:PublicationVolume
90 Nf9a870a3b9444b5ea8ee9bef10d8380e schema:name doi
91 schema:value 10.1023/a:1024047708354
92 rdf:type schema:PropertyValue
93 Nfcf5727aba014fb6adece546037451b3 schema:name dimensions_id
94 schema:value pub.1004158074
95 rdf:type schema:PropertyValue
96 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
97 schema:name Physical Sciences
98 rdf:type schema:DefinedTerm
99 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
100 schema:name Other Physical Sciences
101 rdf:type schema:DefinedTerm
102 sg:journal.1091852 schema:issn 0270-2010
103 1071-2836
104 schema:name Journal of Russian Laser Research
105 schema:publisher Springer Nature
106 rdf:type schema:Periodical
107 sg:person.013653363167.80 schema:affiliation grid-institutes:grid.425806.d
108 schema:familyName Zubov
109 schema:givenName V. A.
110 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013653363167.80
111 rdf:type schema:Person
112 sg:person.014226050506.53 schema:affiliation grid-institutes:grid.425806.d
113 schema:familyName Sultanov
114 schema:givenName T. T.
115 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014226050506.53
116 rdf:type schema:Person
117 grid-institutes:grid.425806.d schema:alternateName P. N. Lebedev Physical Institute, Russian Academy of Sciences, Leninskii Pr. 53, 119991, Moscow, Russia
118 schema:name P. N. Lebedev Physical Institute, Russian Academy of Sciences, Leninskii Pr. 53, 119991, Moscow, Russia
119 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...