X-ray-Induced Paramagnetic Centers in SiO2Xerogels View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2001-05

AUTHORS

N. A. Poklonskii, I. V. Pototskii, N. I. Gorbachuk

ABSTRACT

SiO2xerogels prepared by a sol–gel process followed by sintering at 350–1100°C were irradiated with 30-keV x-rays at a dose rate of 80 R/s. The room-temperature electron spin resonance (ESR) spectra of the xerogels showed signals arising from radiation-induced intrinsic defects (E " centers and terminal oxygens) and organic radicals. By recording ESR spectra in a vacuum of ∼10–2Pa, surface E " centers differing in relaxation time from the volume centers were identified for the first time. The ESR signal from the E " centers was measured as a function of x-ray dose. The possible mechanisms for the formation of E " centers under x-ray irradiation are discussed. More... »

PAGES

482-486

Identifiers

URI

http://scigraph.springernature.com/pub.10.1023/a:1017528801182

DOI

http://dx.doi.org/10.1023/a:1017528801182

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1023883169


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