Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2019-03

AUTHORS

Srinivasa Rao Gadde, K. Rosaiah, Sridhar Babu Mothukuri

ABSTRACT

Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Fréchet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples. More... »

PAGES

33-41

References to SciGraph publications

  • 1993. An Introduction to the Bootstrap in NONE
  • 2006-06. The Exponentiated Type Distributions in ACTA APPLICANDAE MATHEMATICAE
  • 2016-10. Estimation of stress-strength reliability from exponentiated Fréchet distribution in THE INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
  • 2017-11. Bootstrap Confidence Intervals of the Modified Process Capability Index for Weibull distribution in ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING
  • Identifiers

    URI

    http://scigraph.springernature.com/pub.10.1007/s41872-018-0069-1

    DOI

    http://dx.doi.org/10.1007/s41872-018-0069-1

    DIMENSIONS

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