Ontology type: schema:ScholarlyArticle Open Access: True
2015-12
AUTHORSZ. Ghorannevis, E. Akbarnejad, M. Ghoranneviss
ABSTRACTPhysical properties of transparent and conducting indium tin oxide (ITO) thin films grown by radiofrequency (RF) magnetron sputtering are studied systematically by changing deposition time. The X-ray diffraction (XRD) data indicate polycrystalline thin films with grain orientations predominantly along the (2 2 2) and (4 0 0) directions. From atomic force microscopy (AFM) it is found that by increasing the deposition time, the roughness of the film increases. Scanning electron microscopy (SEM) images show a network of a high-porosity interconnected nanoparticles, which approximately have a pore size ranging between 20 and 30 nm. Optical measurements suggest an average transmission of 80 % for the ITO films. Sheet resistances are investigated using four-point probes, which imply that by increasing the film thickness the resistivities of the films decrease to 2.43 × 10−5 Ω cm. More... »
PAGES285-290
http://scigraph.springernature.com/pub.10.1007/s40094-015-0187-3
DOIhttp://dx.doi.org/10.1007/s40094-015-0187-3
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