A (not so) dangerous method: pXRF vs. EPMA-WDS analyses of copper-based artefacts View Full Text


Ontology type: schema:ScholarlyArticle      Open Access: True


Article Info

DATE

2015-09

AUTHORS

V. Orfanou, Th. Rehren

ABSTRACT

Analysis of metal objects with portable and handheld X-ray fluorescence spectrometry has become increasingly popular in recent years. Here, methodological concerns that apply to non-destructive, surface examination with XRF instruments of ancient metal artefacts are discussed based on the comparative analyses of a set of copper-based objects by means of portable X-ray fluorescence (pXRF) and electron probe microanalyser (EPMA). The analytical investigation aims to explore issues of instrument comparability and reliability of the non-invasive pXRF results. The different analytical approaches produce a comparable pattern for the major element concentrations, but substantial variation is evident when it comes to the absolute values for major and minor/trace elements. More... »

PAGES

387-397

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s12520-014-0198-z

DOI

http://dx.doi.org/10.1007/s12520-014-0198-z

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1029241485


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