Influence of nitrogen flow rates on materials properties of CrNx films grown by reactive magnetron sputtering View Full Text


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Article Info

DATE

2012-08

AUTHORS

B SUBRAMANIAN, K PRABAKARAN, M JAYACHANDRAN

ABSTRACT

Chromium nitride (CrN) hard thin films were deposited on different substrates by reactive direct current (d.c.) magnetron sputtering with different nitrogen flow rates. The X-ray diffraction patterns showed mixed Cr2N and CrN phases. The variations in structural parameters are discussed. The grain size increased with increasing nitrogen flow rates. Scanning electron microscopy image showed columnar and dense microstructure with varying nitrogen flow rates. An elemental analysis of the samples was realized by means of energy dispersive spectroscopy. The electrical studies indicated the semiconducting behaviour of the films at the nitrogen flow rate of 15 sccm. More... »

PAGES

505-511

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s12034-012-0344-0

DOI

http://dx.doi.org/10.1007/s12034-012-0344-0

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1013903723


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Central Electrochemical Research Institute", 
          "id": "https://www.grid.ac/institutes/grid.417628.e", 
          "name": [
            "Electrochemical Materials Science Division, CSIR- Central Electrochemical Research Institute, 630 006, Karaikudi, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "SUBRAMANIAN", 
        "givenName": "B", 
        "id": "sg:person.01345262565.57", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01345262565.57"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Central Electrochemical Research Institute", 
          "id": "https://www.grid.ac/institutes/grid.417628.e", 
          "name": [
            "Electrochemical Materials Science Division, CSIR- Central Electrochemical Research Institute, 630 006, Karaikudi, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "PRABAKARAN", 
        "givenName": "K", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Central Electrochemical Research Institute", 
          "id": "https://www.grid.ac/institutes/grid.417628.e", 
          "name": [
            "Electrochemical Materials Science Division, CSIR- Central Electrochemical Research Institute, 630 006, Karaikudi, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "JAYACHANDRAN", 
        "givenName": "M", 
        "id": "sg:person.0736105065.13", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0736105065.13"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/j.matlet.2004.05.020", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1004190652"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.surfcoat.2006.03.037", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1007555565"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0040-6090(03)01113-1", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1009283596"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0040-6090(03)01113-1", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1009283596"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0042-207x(02)00146-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1009747430"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.jmatprotec.2005.06.011", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1010124513"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.jmatprotec.2005.06.011", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1010124513"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.vacuum.2003.12.158", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011458883"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0022-3093(97)00197-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1017926820"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.vacuum.2008.12.007", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1018467738"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.surfcoat.2006.05.013", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1018880643"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.electacta.2005.09.042", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1020192137"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.matlet.2007.09.002", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1021962654"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(91)90225-m", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023000130"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(91)90225-m", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023000130"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.msea.2007.01.149", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023806231"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.matchemphys.2006.10.007", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1024470152"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.surfcoat.2009.08.010", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1028807379"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0040-6090(01)01388-8", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029364330"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.tsf.2004.08.067", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1034107228"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.surfcoat.2007.04.005", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1035500673"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/pssa.200623009", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1043986566"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.tsf.2008.09.093", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1044369731"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.vacuum.2006.08.005", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1048413175"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.apsusc.2008.06.190", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049111589"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.surfcoat.2009.01.016", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049405440"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.surfcoat.2003.12.026", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049939212"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.1836878", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057825871"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.4028/www.scientific.net/msf.555.35", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1072126435"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2012-08", 
    "datePublishedReg": "2012-08-01", 
    "description": "Chromium nitride (CrN) hard thin films were deposited on different substrates by reactive direct current (d.c.) magnetron sputtering with different nitrogen flow rates. The X-ray diffraction patterns showed mixed Cr2N and CrN phases. The variations in structural parameters are discussed. The grain size increased with increasing nitrogen flow rates. Scanning electron microscopy image showed columnar and dense microstructure with varying nitrogen flow rates. An elemental analysis of the samples was realized by means of energy dispersive spectroscopy. The electrical studies indicated the semiconducting behaviour of the films at the nitrogen flow rate of 15 sccm.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/s12034-012-0344-0", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": true, 
    "isPartOf": [
      {
        "id": "sg:journal.1136251", 
        "issn": [
          "0250-4707", 
          "0973-7669"
        ], 
        "name": "Bulletin of Materials Science", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "4", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "35"
      }
    ], 
    "name": "Influence of nitrogen flow rates on materials properties of CrNx films grown by reactive magnetron sputtering", 
    "pagination": "505-511", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "423bca22e4835a7ac83b7678fe2d096ed7f04c0edc7a53ca92e62a2a0e0635e5"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s12034-012-0344-0"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1013903723"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s12034-012-0344-0", 
      "https://app.dimensions.ai/details/publication/pub.1013903723"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-10T23:26", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8693_00000521.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007%2Fs12034-012-0344-0"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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This table displays all metadata directly associated to this object as RDF triples.

152 TRIPLES      21 PREDICATES      53 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s12034-012-0344-0 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author N66f39ac6cca64e31b32dffebe2f471a1
4 schema:citation https://doi.org/10.1002/pssa.200623009
5 https://doi.org/10.1016/0040-6090(91)90225-m
6 https://doi.org/10.1016/j.apsusc.2008.06.190
7 https://doi.org/10.1016/j.electacta.2005.09.042
8 https://doi.org/10.1016/j.jmatprotec.2005.06.011
9 https://doi.org/10.1016/j.matchemphys.2006.10.007
10 https://doi.org/10.1016/j.matlet.2004.05.020
11 https://doi.org/10.1016/j.matlet.2007.09.002
12 https://doi.org/10.1016/j.msea.2007.01.149
13 https://doi.org/10.1016/j.surfcoat.2003.12.026
14 https://doi.org/10.1016/j.surfcoat.2006.03.037
15 https://doi.org/10.1016/j.surfcoat.2006.05.013
16 https://doi.org/10.1016/j.surfcoat.2007.04.005
17 https://doi.org/10.1016/j.surfcoat.2009.01.016
18 https://doi.org/10.1016/j.surfcoat.2009.08.010
19 https://doi.org/10.1016/j.tsf.2004.08.067
20 https://doi.org/10.1016/j.tsf.2008.09.093
21 https://doi.org/10.1016/j.vacuum.2003.12.158
22 https://doi.org/10.1016/j.vacuum.2006.08.005
23 https://doi.org/10.1016/j.vacuum.2008.12.007
24 https://doi.org/10.1016/s0022-3093(97)00197-x
25 https://doi.org/10.1016/s0040-6090(01)01388-8
26 https://doi.org/10.1016/s0040-6090(03)01113-1
27 https://doi.org/10.1016/s0042-207x(02)00146-x
28 https://doi.org/10.1063/1.1836878
29 https://doi.org/10.4028/www.scientific.net/msf.555.35
30 schema:datePublished 2012-08
31 schema:datePublishedReg 2012-08-01
32 schema:description Chromium nitride (CrN) hard thin films were deposited on different substrates by reactive direct current (d.c.) magnetron sputtering with different nitrogen flow rates. The X-ray diffraction patterns showed mixed Cr2N and CrN phases. The variations in structural parameters are discussed. The grain size increased with increasing nitrogen flow rates. Scanning electron microscopy image showed columnar and dense microstructure with varying nitrogen flow rates. An elemental analysis of the samples was realized by means of energy dispersive spectroscopy. The electrical studies indicated the semiconducting behaviour of the films at the nitrogen flow rate of 15 sccm.
33 schema:genre research_article
34 schema:inLanguage en
35 schema:isAccessibleForFree true
36 schema:isPartOf N5397bb9529c84fe0be84bc09e491cf4a
37 Nf27cdccfccf5423a8dd35dd502c37ef6
38 sg:journal.1136251
39 schema:name Influence of nitrogen flow rates on materials properties of CrNx films grown by reactive magnetron sputtering
40 schema:pagination 505-511
41 schema:productId N7ef6eb4b11894f15bb45cc227dba15c7
42 N8c5083d314344cf1a3144dbca33188ee
43 N9e5a05fdddbc46eaa46b157b323bee5a
44 schema:sameAs https://app.dimensions.ai/details/publication/pub.1013903723
45 https://doi.org/10.1007/s12034-012-0344-0
46 schema:sdDatePublished 2019-04-10T23:26
47 schema:sdLicense https://scigraph.springernature.com/explorer/license/
48 schema:sdPublisher N6ce6ed1b08e744718d44c6eb9603b168
49 schema:url http://link.springer.com/10.1007%2Fs12034-012-0344-0
50 sgo:license sg:explorer/license/
51 sgo:sdDataset articles
52 rdf:type schema:ScholarlyArticle
53 N5397bb9529c84fe0be84bc09e491cf4a schema:volumeNumber 35
54 rdf:type schema:PublicationVolume
55 N66f39ac6cca64e31b32dffebe2f471a1 rdf:first sg:person.01345262565.57
56 rdf:rest Nf44a8183b547495a8ddc31b0174107b4
57 N6ce6ed1b08e744718d44c6eb9603b168 schema:name Springer Nature - SN SciGraph project
58 rdf:type schema:Organization
59 N7ef6eb4b11894f15bb45cc227dba15c7 schema:name readcube_id
60 schema:value 423bca22e4835a7ac83b7678fe2d096ed7f04c0edc7a53ca92e62a2a0e0635e5
61 rdf:type schema:PropertyValue
62 N8c5083d314344cf1a3144dbca33188ee schema:name doi
63 schema:value 10.1007/s12034-012-0344-0
64 rdf:type schema:PropertyValue
65 N9202d0e6bf6d4a63bea28f8a05b76270 rdf:first sg:person.0736105065.13
66 rdf:rest rdf:nil
67 N9e5a05fdddbc46eaa46b157b323bee5a schema:name dimensions_id
68 schema:value pub.1013903723
69 rdf:type schema:PropertyValue
70 Nec8680395aab4f9bb7a9a273ccc7cd95 schema:affiliation https://www.grid.ac/institutes/grid.417628.e
71 schema:familyName PRABAKARAN
72 schema:givenName K
73 rdf:type schema:Person
74 Nf27cdccfccf5423a8dd35dd502c37ef6 schema:issueNumber 4
75 rdf:type schema:PublicationIssue
76 Nf44a8183b547495a8ddc31b0174107b4 rdf:first Nec8680395aab4f9bb7a9a273ccc7cd95
77 rdf:rest N9202d0e6bf6d4a63bea28f8a05b76270
78 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
79 schema:name Engineering
80 rdf:type schema:DefinedTerm
81 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
82 schema:name Materials Engineering
83 rdf:type schema:DefinedTerm
84 sg:journal.1136251 schema:issn 0250-4707
85 0973-7669
86 schema:name Bulletin of Materials Science
87 rdf:type schema:Periodical
88 sg:person.01345262565.57 schema:affiliation https://www.grid.ac/institutes/grid.417628.e
89 schema:familyName SUBRAMANIAN
90 schema:givenName B
91 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01345262565.57
92 rdf:type schema:Person
93 sg:person.0736105065.13 schema:affiliation https://www.grid.ac/institutes/grid.417628.e
94 schema:familyName JAYACHANDRAN
95 schema:givenName M
96 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0736105065.13
97 rdf:type schema:Person
98 https://doi.org/10.1002/pssa.200623009 schema:sameAs https://app.dimensions.ai/details/publication/pub.1043986566
99 rdf:type schema:CreativeWork
100 https://doi.org/10.1016/0040-6090(91)90225-m schema:sameAs https://app.dimensions.ai/details/publication/pub.1023000130
101 rdf:type schema:CreativeWork
102 https://doi.org/10.1016/j.apsusc.2008.06.190 schema:sameAs https://app.dimensions.ai/details/publication/pub.1049111589
103 rdf:type schema:CreativeWork
104 https://doi.org/10.1016/j.electacta.2005.09.042 schema:sameAs https://app.dimensions.ai/details/publication/pub.1020192137
105 rdf:type schema:CreativeWork
106 https://doi.org/10.1016/j.jmatprotec.2005.06.011 schema:sameAs https://app.dimensions.ai/details/publication/pub.1010124513
107 rdf:type schema:CreativeWork
108 https://doi.org/10.1016/j.matchemphys.2006.10.007 schema:sameAs https://app.dimensions.ai/details/publication/pub.1024470152
109 rdf:type schema:CreativeWork
110 https://doi.org/10.1016/j.matlet.2004.05.020 schema:sameAs https://app.dimensions.ai/details/publication/pub.1004190652
111 rdf:type schema:CreativeWork
112 https://doi.org/10.1016/j.matlet.2007.09.002 schema:sameAs https://app.dimensions.ai/details/publication/pub.1021962654
113 rdf:type schema:CreativeWork
114 https://doi.org/10.1016/j.msea.2007.01.149 schema:sameAs https://app.dimensions.ai/details/publication/pub.1023806231
115 rdf:type schema:CreativeWork
116 https://doi.org/10.1016/j.surfcoat.2003.12.026 schema:sameAs https://app.dimensions.ai/details/publication/pub.1049939212
117 rdf:type schema:CreativeWork
118 https://doi.org/10.1016/j.surfcoat.2006.03.037 schema:sameAs https://app.dimensions.ai/details/publication/pub.1007555565
119 rdf:type schema:CreativeWork
120 https://doi.org/10.1016/j.surfcoat.2006.05.013 schema:sameAs https://app.dimensions.ai/details/publication/pub.1018880643
121 rdf:type schema:CreativeWork
122 https://doi.org/10.1016/j.surfcoat.2007.04.005 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035500673
123 rdf:type schema:CreativeWork
124 https://doi.org/10.1016/j.surfcoat.2009.01.016 schema:sameAs https://app.dimensions.ai/details/publication/pub.1049405440
125 rdf:type schema:CreativeWork
126 https://doi.org/10.1016/j.surfcoat.2009.08.010 schema:sameAs https://app.dimensions.ai/details/publication/pub.1028807379
127 rdf:type schema:CreativeWork
128 https://doi.org/10.1016/j.tsf.2004.08.067 schema:sameAs https://app.dimensions.ai/details/publication/pub.1034107228
129 rdf:type schema:CreativeWork
130 https://doi.org/10.1016/j.tsf.2008.09.093 schema:sameAs https://app.dimensions.ai/details/publication/pub.1044369731
131 rdf:type schema:CreativeWork
132 https://doi.org/10.1016/j.vacuum.2003.12.158 schema:sameAs https://app.dimensions.ai/details/publication/pub.1011458883
133 rdf:type schema:CreativeWork
134 https://doi.org/10.1016/j.vacuum.2006.08.005 schema:sameAs https://app.dimensions.ai/details/publication/pub.1048413175
135 rdf:type schema:CreativeWork
136 https://doi.org/10.1016/j.vacuum.2008.12.007 schema:sameAs https://app.dimensions.ai/details/publication/pub.1018467738
137 rdf:type schema:CreativeWork
138 https://doi.org/10.1016/s0022-3093(97)00197-x schema:sameAs https://app.dimensions.ai/details/publication/pub.1017926820
139 rdf:type schema:CreativeWork
140 https://doi.org/10.1016/s0040-6090(01)01388-8 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029364330
141 rdf:type schema:CreativeWork
142 https://doi.org/10.1016/s0040-6090(03)01113-1 schema:sameAs https://app.dimensions.ai/details/publication/pub.1009283596
143 rdf:type schema:CreativeWork
144 https://doi.org/10.1016/s0042-207x(02)00146-x schema:sameAs https://app.dimensions.ai/details/publication/pub.1009747430
145 rdf:type schema:CreativeWork
146 https://doi.org/10.1063/1.1836878 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057825871
147 rdf:type schema:CreativeWork
148 https://doi.org/10.4028/www.scientific.net/msf.555.35 schema:sameAs https://app.dimensions.ai/details/publication/pub.1072126435
149 rdf:type schema:CreativeWork
150 https://www.grid.ac/institutes/grid.417628.e schema:alternateName Central Electrochemical Research Institute
151 schema:name Electrochemical Materials Science Division, CSIR- Central Electrochemical Research Institute, 630 006, Karaikudi, India
152 rdf:type schema:Organization
 




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