Electrodynamic Analysis of Near-Field Enhancement View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2007-12

AUTHORS

Igor Tsukerman, František Čajko, Jianhua Dai

ABSTRACT

The paper reviews computational models for plasmonic field enhancement, especially with applications to tip-enhanced scanning near-field optical microscopy (SNOM). Both plasmon-enhanced and scattering-type SNOM are considered. The importance of full electrodynamic analysis is emphasized: the electrostatic treatment is valid only if the size of the whole system, rather than its individual components (such as the apex of the tip or an individual particle in a cluster), is much smaller than the wavelength. Illustrative numerical results are included. More... »

PAGES

148

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s12030-008-9016-y

DOI

http://dx.doi.org/10.1007/s12030-008-9016-y

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1032674437


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