Defect characterization of amorphous silicon thin film solar cell based on low frequency noise View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2018-06

AUTHORS

Linna Hu, Liang He, Hua Chen, Xiaofei Jia, Ying Hu, Hongmei Ma, Dandan Guo, Yu Qin

ABSTRACT

N/A

PAGES

069403

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s11432-017-9360-7

DOI

http://dx.doi.org/10.1007/s11432-017-9360-7

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1103480496


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "author": [
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hu", 
        "givenName": "Linna", 
        "id": "sg:person.014700652347.44", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014700652347.44"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "He", 
        "givenName": "Liang", 
        "id": "sg:person.014310066007.31", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014310066007.31"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Chen", 
        "givenName": "Hua", 
        "id": "sg:person.011527616754.35", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011527616754.35"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ankang University", 
          "id": "https://www.grid.ac/institutes/grid.459339.1", 
          "name": [
            "School of Electronic and Information Engineering, Ankang University, 725000, Ankang, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Jia", 
        "givenName": "Xiaofei", 
        "id": "sg:person.012715125007.89", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012715125007.89"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hu", 
        "givenName": "Ying", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ma", 
        "givenName": "Hongmei", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Guo", 
        "givenName": "Dandan", 
        "id": "sg:person.012510330747.81", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012510330747.81"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Xidian University", 
          "id": "https://www.grid.ac/institutes/grid.440736.2", 
          "name": [
            "School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi\u2019an, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Qin", 
        "givenName": "Yu", 
        "id": "sg:person.010366122547.47", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010366122547.47"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1103/physrevb.68.125207", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011398724"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.68.125207", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011398724"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s11432-015-5362-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029574323", 
          "https://doi.org/10.1007/s11432-015-5362-2"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.4028/www.scientific.net/ssp.242.449", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1072158737"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2018-06", 
    "datePublishedReg": "2018-06-01", 
    "genre": "non_research_article", 
    "id": "sg:pub.10.1007/s11432-017-9360-7", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isFundedItemOf": [
      {
        "id": "sg:grant.7004223", 
        "type": "MonetaryGrant"
      }
    ], 
    "isPartOf": [
      {
        "id": "sg:journal.1135989", 
        "issn": [
          "1009-2757", 
          "1674-733X"
        ], 
        "name": "Science China Information Sciences", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "6", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "61"
      }
    ], 
    "name": "Defect characterization of amorphous silicon thin film solar cell based on low frequency noise", 
    "pagination": "069403", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s11432-017-9360-7"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "0c0882c3ecf0a76e1d5dc03bcb7de75f58c426841ecc2678e10d1de5859f85f3"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1103480496"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s11432-017-9360-7", 
      "https://app.dimensions.ai/details/publication/pub.1103480496"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-15T09:12", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000376_0000000376/records_56159_00000004.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://link.springer.com/10.1007%2Fs11432-017-9360-7"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/s11432-017-9360-7'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/s11432-017-9360-7'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/s11432-017-9360-7'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/s11432-017-9360-7'


 

This table displays all metadata directly associated to this object as RDF triples.

114 TRIPLES      19 PREDICATES      27 URIs      18 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s11432-017-9360-7 schema:author Nf043452f7a684d57adc6cbe1a667b4b5
2 schema:citation sg:pub.10.1007/s11432-015-5362-2
3 https://doi.org/10.1103/physrevb.68.125207
4 https://doi.org/10.4028/www.scientific.net/ssp.242.449
5 schema:datePublished 2018-06
6 schema:datePublishedReg 2018-06-01
7 schema:genre non_research_article
8 schema:inLanguage en
9 schema:isAccessibleForFree false
10 schema:isPartOf N8a6ec2761d9a4c01b7e1864e5f68f1d8
11 Ne668b0ca7f8e48ba9c81992cda240b09
12 sg:journal.1135989
13 schema:name Defect characterization of amorphous silicon thin film solar cell based on low frequency noise
14 schema:pagination 069403
15 schema:productId N3ec8891a46294d48859374dd9ef1345c
16 N8b1a41f6aff84506aa37d292a062f8ad
17 Nb11d666add724a2881a05762e40c584f
18 schema:sameAs https://app.dimensions.ai/details/publication/pub.1103480496
19 https://doi.org/10.1007/s11432-017-9360-7
20 schema:sdDatePublished 2019-04-15T09:12
21 schema:sdLicense https://scigraph.springernature.com/explorer/license/
22 schema:sdPublisher N1210f7564bcb4e0cacfe8b1d5a0512ce
23 schema:url https://link.springer.com/10.1007%2Fs11432-017-9360-7
24 sgo:license sg:explorer/license/
25 sgo:sdDataset articles
26 rdf:type schema:ScholarlyArticle
27 N1210f7564bcb4e0cacfe8b1d5a0512ce schema:name Springer Nature - SN SciGraph project
28 rdf:type schema:Organization
29 N130e395ed48442fa8772b40ffab8da56 rdf:first Nd6745c65ef424469a25d6c3d030caaee
30 rdf:rest N30bbe56fb5c1486792ce2e82471001c2
31 N20c9a6e61e0f499e9b726c3abcf40812 rdf:first sg:person.012510330747.81
32 rdf:rest N4e828f09e6c2435ab410ce9a508074a6
33 N30bbe56fb5c1486792ce2e82471001c2 rdf:first Na14b87e487cd45f79960bbdd4d2e6ebd
34 rdf:rest N20c9a6e61e0f499e9b726c3abcf40812
35 N3aea812459ee4d5eb15d2b74be5039b9 rdf:first sg:person.014310066007.31
36 rdf:rest N7c5d867d6d064082bb6f51c4d9a402b3
37 N3ec8891a46294d48859374dd9ef1345c schema:name dimensions_id
38 schema:value pub.1103480496
39 rdf:type schema:PropertyValue
40 N4e828f09e6c2435ab410ce9a508074a6 rdf:first sg:person.010366122547.47
41 rdf:rest rdf:nil
42 N7c5d867d6d064082bb6f51c4d9a402b3 rdf:first sg:person.011527616754.35
43 rdf:rest Ne642cdf7895a4789b88c9c68c1c583f0
44 N8a6ec2761d9a4c01b7e1864e5f68f1d8 schema:volumeNumber 61
45 rdf:type schema:PublicationVolume
46 N8b1a41f6aff84506aa37d292a062f8ad schema:name readcube_id
47 schema:value 0c0882c3ecf0a76e1d5dc03bcb7de75f58c426841ecc2678e10d1de5859f85f3
48 rdf:type schema:PropertyValue
49 Na14b87e487cd45f79960bbdd4d2e6ebd schema:affiliation https://www.grid.ac/institutes/grid.440736.2
50 schema:familyName Ma
51 schema:givenName Hongmei
52 rdf:type schema:Person
53 Nb11d666add724a2881a05762e40c584f schema:name doi
54 schema:value 10.1007/s11432-017-9360-7
55 rdf:type schema:PropertyValue
56 Nd6745c65ef424469a25d6c3d030caaee schema:affiliation https://www.grid.ac/institutes/grid.440736.2
57 schema:familyName Hu
58 schema:givenName Ying
59 rdf:type schema:Person
60 Ne642cdf7895a4789b88c9c68c1c583f0 rdf:first sg:person.012715125007.89
61 rdf:rest N130e395ed48442fa8772b40ffab8da56
62 Ne668b0ca7f8e48ba9c81992cda240b09 schema:issueNumber 6
63 rdf:type schema:PublicationIssue
64 Nf043452f7a684d57adc6cbe1a667b4b5 rdf:first sg:person.014700652347.44
65 rdf:rest N3aea812459ee4d5eb15d2b74be5039b9
66 sg:grant.7004223 http://pending.schema.org/fundedItem sg:pub.10.1007/s11432-017-9360-7
67 rdf:type schema:MonetaryGrant
68 sg:journal.1135989 schema:issn 1009-2757
69 1674-733X
70 schema:name Science China Information Sciences
71 rdf:type schema:Periodical
72 sg:person.010366122547.47 schema:affiliation https://www.grid.ac/institutes/grid.440736.2
73 schema:familyName Qin
74 schema:givenName Yu
75 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010366122547.47
76 rdf:type schema:Person
77 sg:person.011527616754.35 schema:affiliation https://www.grid.ac/institutes/grid.440736.2
78 schema:familyName Chen
79 schema:givenName Hua
80 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011527616754.35
81 rdf:type schema:Person
82 sg:person.012510330747.81 schema:affiliation https://www.grid.ac/institutes/grid.440736.2
83 schema:familyName Guo
84 schema:givenName Dandan
85 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012510330747.81
86 rdf:type schema:Person
87 sg:person.012715125007.89 schema:affiliation https://www.grid.ac/institutes/grid.459339.1
88 schema:familyName Jia
89 schema:givenName Xiaofei
90 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012715125007.89
91 rdf:type schema:Person
92 sg:person.014310066007.31 schema:affiliation https://www.grid.ac/institutes/grid.440736.2
93 schema:familyName He
94 schema:givenName Liang
95 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014310066007.31
96 rdf:type schema:Person
97 sg:person.014700652347.44 schema:affiliation https://www.grid.ac/institutes/grid.440736.2
98 schema:familyName Hu
99 schema:givenName Linna
100 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014700652347.44
101 rdf:type schema:Person
102 sg:pub.10.1007/s11432-015-5362-2 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029574323
103 https://doi.org/10.1007/s11432-015-5362-2
104 rdf:type schema:CreativeWork
105 https://doi.org/10.1103/physrevb.68.125207 schema:sameAs https://app.dimensions.ai/details/publication/pub.1011398724
106 rdf:type schema:CreativeWork
107 https://doi.org/10.4028/www.scientific.net/ssp.242.449 schema:sameAs https://app.dimensions.ai/details/publication/pub.1072158737
108 rdf:type schema:CreativeWork
109 https://www.grid.ac/institutes/grid.440736.2 schema:alternateName Xidian University
110 schema:name School of Advanced Materials and Nanotechnology, Xidian University, 710126, Xi’an, China
111 rdf:type schema:Organization
112 https://www.grid.ac/institutes/grid.459339.1 schema:alternateName Ankang University
113 schema:name School of Electronic and Information Engineering, Ankang University, 725000, Ankang, China
114 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...