Scan BIST with biased scan test signals View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2008-06-08

AUTHORS

Dong Xiang, MingJing Chen, JiaGuang Sun

ABSTRACT

The conventional test-per-scan built-in self-test (BIST) scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flipflops are shifted out while shifting in the next test vector like scan testing. Unlike deterministic testing, it is unnecessary to apply a complete test vector to the scan chains. A new scan-based BIST scheme is proposed by properly controlling the test signals of the scan chains. Different biased random values are assigned to the test signals of scan flip-flops in separate scan chains. Capture cycles can be inserted at any clock cycle if necessary. A new testability estimation procedure according to the proposed testing scheme is presented. A greedy procedure is proposed to select a weight for each scan chain. Experimental results show that the proposed method can improve test effectiveness of scan-based BIST greatly, and most circuits can obtain complete fault coverage or very close to complete fault coverage. More... »

PAGES

881-895

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s11432-008-0078-1

DOI

http://dx.doi.org/10.1007/s11432-008-0078-1

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1048729402


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/08", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Information and Computing Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0804", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Data Format", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0806", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Information Systems", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0899", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Information and Computing Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "School of Software, Tsinghua University, 100084, Beijing, China", 
          "id": "http://www.grid.ac/institutes/grid.12527.33", 
          "name": [
            "School of Software, Tsinghua University, 100084, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Xiang", 
        "givenName": "Dong", 
        "id": "sg:person.012631173725.30", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012631173725.30"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Computer Science and Engineering, University of California, 92093, San Diego, La Jolla, CA, USA", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Department of Computer Science and Engineering, University of California, 92093, San Diego, La Jolla, CA, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Chen", 
        "givenName": "MingJing", 
        "id": "sg:person.015313713653.29", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015313713653.29"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "School of Software, Tsinghua University, 100084, Beijing, China", 
          "id": "http://www.grid.ac/institutes/grid.12527.33", 
          "name": [
            "School of Software, Tsinghua University, 100084, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Sun", 
        "givenName": "JiaGuang", 
        "id": "sg:person.011411464635.59", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011411464635.59"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2008-06-08", 
    "datePublishedReg": "2008-06-08", 
    "description": "The conventional test-per-scan built-in self-test (BIST) scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flipflops are shifted out while shifting in the next test vector like scan testing. Unlike deterministic testing, it is unnecessary to apply a complete test vector to the scan chains. A new scan-based BIST scheme is proposed by properly controlling the test signals of the scan chains. Different biased random values are assigned to the test signals of scan flip-flops in separate scan chains. Capture cycles can be inserted at any clock cycle if necessary. A new testability estimation procedure according to the proposed testing scheme is presented. A greedy procedure is proposed to select a weight for each scan chain. Experimental results show that the proposed method can improve test effectiveness of scan-based BIST greatly, and most circuits can obtain complete fault coverage or very close to complete fault coverage.", 
    "genre": "article", 
    "id": "sg:pub.10.1007/s11432-008-0078-1", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1135989", 
        "issn": [
          "1009-2757", 
          "1674-733X"
        ], 
        "name": "Science China Information Sciences", 
        "publisher": "Springer Nature", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "7", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "51"
      }
    ], 
    "keywords": [
      "self-test (BIST) scheme", 
      "scheme", 
      "fault effects", 
      "scan flipflops", 
      "test vectors", 
      "deterministic testing", 
      "scan chains", 
      "test signals", 
      "random values", 
      "separate scan chains", 
      "clock cycles", 
      "greedy procedure", 
      "experimental results", 
      "test effectiveness", 
      "scan-based BIST", 
      "complete fault coverage", 
      "fault coverage", 
      "conventional tests", 
      "test", 
      "number", 
      "shift cycle", 
      "cycle", 
      "capture cycles", 
      "effect", 
      "flipflops", 
      "vector", 
      "scan testing", 
      "testing", 
      "chain", 
      "BIST scheme", 
      "signals", 
      "values", 
      "estimation procedure", 
      "procedure", 
      "testing scheme", 
      "weight", 
      "results", 
      "method", 
      "effectiveness", 
      "BIST", 
      "most circuits", 
      "circuit", 
      "coverage", 
      "next test vector", 
      "complete test vector", 
      "new scan-based BIST scheme", 
      "scan-based BIST scheme", 
      "Different biased random values", 
      "biased random values", 
      "new testability estimation procedure", 
      "testability estimation procedure", 
      "biased scan test signals", 
      "scan test signals"
    ], 
    "name": "Scan BIST with biased scan test signals", 
    "pagination": "881-895", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1048729402"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s11432-008-0078-1"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s11432-008-0078-1", 
      "https://app.dimensions.ai/details/publication/pub.1048729402"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-01-01T18:19", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220101/entities/gbq_results/article/article_471.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1007/s11432-008-0078-1"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/s11432-008-0078-1'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/s11432-008-0078-1'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/s11432-008-0078-1'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/s11432-008-0078-1'


 

This table displays all metadata directly associated to this object as RDF triples.

136 TRIPLES      21 PREDICATES      80 URIs      70 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s11432-008-0078-1 schema:about anzsrc-for:08
2 anzsrc-for:0804
3 anzsrc-for:0806
4 anzsrc-for:0899
5 schema:author N2d8fd6b4363842a6bf060c1e134d20da
6 schema:datePublished 2008-06-08
7 schema:datePublishedReg 2008-06-08
8 schema:description The conventional test-per-scan built-in self-test (BIST) scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flipflops are shifted out while shifting in the next test vector like scan testing. Unlike deterministic testing, it is unnecessary to apply a complete test vector to the scan chains. A new scan-based BIST scheme is proposed by properly controlling the test signals of the scan chains. Different biased random values are assigned to the test signals of scan flip-flops in separate scan chains. Capture cycles can be inserted at any clock cycle if necessary. A new testability estimation procedure according to the proposed testing scheme is presented. A greedy procedure is proposed to select a weight for each scan chain. Experimental results show that the proposed method can improve test effectiveness of scan-based BIST greatly, and most circuits can obtain complete fault coverage or very close to complete fault coverage.
9 schema:genre article
10 schema:inLanguage en
11 schema:isAccessibleForFree false
12 schema:isPartOf N043ae35e290a4a969fd00efc5c039d28
13 Nf04b6e9c1f324aaeb7d5a4fe728df753
14 sg:journal.1135989
15 schema:keywords BIST
16 BIST scheme
17 Different biased random values
18 biased random values
19 biased scan test signals
20 capture cycles
21 chain
22 circuit
23 clock cycles
24 complete fault coverage
25 complete test vector
26 conventional tests
27 coverage
28 cycle
29 deterministic testing
30 effect
31 effectiveness
32 estimation procedure
33 experimental results
34 fault coverage
35 fault effects
36 flipflops
37 greedy procedure
38 method
39 most circuits
40 new scan-based BIST scheme
41 new testability estimation procedure
42 next test vector
43 number
44 procedure
45 random values
46 results
47 scan chains
48 scan flipflops
49 scan test signals
50 scan testing
51 scan-based BIST
52 scan-based BIST scheme
53 scheme
54 self-test (BIST) scheme
55 separate scan chains
56 shift cycle
57 signals
58 test
59 test effectiveness
60 test signals
61 test vectors
62 testability estimation procedure
63 testing
64 testing scheme
65 values
66 vector
67 weight
68 schema:name Scan BIST with biased scan test signals
69 schema:pagination 881-895
70 schema:productId N983f5fba471d488692bec94f2bfb7c61
71 Ncb2839760f584dd3b4c5dff1bc411ab3
72 schema:sameAs https://app.dimensions.ai/details/publication/pub.1048729402
73 https://doi.org/10.1007/s11432-008-0078-1
74 schema:sdDatePublished 2022-01-01T18:19
75 schema:sdLicense https://scigraph.springernature.com/explorer/license/
76 schema:sdPublisher N4f1c50f0657e40dba39f751a4141ea52
77 schema:url https://doi.org/10.1007/s11432-008-0078-1
78 sgo:license sg:explorer/license/
79 sgo:sdDataset articles
80 rdf:type schema:ScholarlyArticle
81 N043ae35e290a4a969fd00efc5c039d28 schema:volumeNumber 51
82 rdf:type schema:PublicationVolume
83 N2d8fd6b4363842a6bf060c1e134d20da rdf:first sg:person.012631173725.30
84 rdf:rest N5e20e8c7106f421eac68a6c56364aef4
85 N41c1cd5c06734d289300035bed0fa327 rdf:first sg:person.011411464635.59
86 rdf:rest rdf:nil
87 N4f1c50f0657e40dba39f751a4141ea52 schema:name Springer Nature - SN SciGraph project
88 rdf:type schema:Organization
89 N5e20e8c7106f421eac68a6c56364aef4 rdf:first sg:person.015313713653.29
90 rdf:rest N41c1cd5c06734d289300035bed0fa327
91 N983f5fba471d488692bec94f2bfb7c61 schema:name doi
92 schema:value 10.1007/s11432-008-0078-1
93 rdf:type schema:PropertyValue
94 Ncb2839760f584dd3b4c5dff1bc411ab3 schema:name dimensions_id
95 schema:value pub.1048729402
96 rdf:type schema:PropertyValue
97 Nf04b6e9c1f324aaeb7d5a4fe728df753 schema:issueNumber 7
98 rdf:type schema:PublicationIssue
99 anzsrc-for:08 schema:inDefinedTermSet anzsrc-for:
100 schema:name Information and Computing Sciences
101 rdf:type schema:DefinedTerm
102 anzsrc-for:0804 schema:inDefinedTermSet anzsrc-for:
103 schema:name Data Format
104 rdf:type schema:DefinedTerm
105 anzsrc-for:0806 schema:inDefinedTermSet anzsrc-for:
106 schema:name Information Systems
107 rdf:type schema:DefinedTerm
108 anzsrc-for:0899 schema:inDefinedTermSet anzsrc-for:
109 schema:name Other Information and Computing Sciences
110 rdf:type schema:DefinedTerm
111 sg:journal.1135989 schema:issn 1009-2757
112 1674-733X
113 schema:name Science China Information Sciences
114 schema:publisher Springer Nature
115 rdf:type schema:Periodical
116 sg:person.011411464635.59 schema:affiliation grid-institutes:grid.12527.33
117 schema:familyName Sun
118 schema:givenName JiaGuang
119 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011411464635.59
120 rdf:type schema:Person
121 sg:person.012631173725.30 schema:affiliation grid-institutes:grid.12527.33
122 schema:familyName Xiang
123 schema:givenName Dong
124 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012631173725.30
125 rdf:type schema:Person
126 sg:person.015313713653.29 schema:affiliation grid-institutes:None
127 schema:familyName Chen
128 schema:givenName MingJing
129 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015313713653.29
130 rdf:type schema:Person
131 grid-institutes:None schema:alternateName Department of Computer Science and Engineering, University of California, 92093, San Diego, La Jolla, CA, USA
132 schema:name Department of Computer Science and Engineering, University of California, 92093, San Diego, La Jolla, CA, USA
133 rdf:type schema:Organization
134 grid-institutes:grid.12527.33 schema:alternateName School of Software, Tsinghua University, 100084, Beijing, China
135 schema:name School of Software, Tsinghua University, 100084, Beijing, China
136 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...