High harmonic exploring on different materials in dynamic atomic force microscopy View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2018-03

AUTHORS

ZhiYue Zheng, Rui Xu, ShiLi Ye, Sabir Hussain, Wei Ji, Peng Cheng, YanJun Li, Yasuhiro Sugawara, ZhiHai Cheng

ABSTRACT

In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-sample interaction have been recently demonstrated as a promising technique for exploring more extensive material properties. Here we present an exploratory study of high harmonic atomic force microscopy by force-spectroscopy and high harmonic imaging. Since these components are very weak compared to the fundamental response, we firstly designed a high harmonic cantilever by tuning the second order flexural resonance frequency to an integer 6 times of its fundamental mode (i.e. ω2=6ω1). Moreover, it is verified that high harmonic can discern extra features than topographies on different samples with amplitude/frequency modulation (AM/FM) dynamic AFM mode. In AM mode, the first resonance amplitude and 6th harmonic amplitude were discussed. The 6th harmonic is more sensitive than the first order response. In FM mode, it is noted that the decaying rate of the 6th harmonic frequency is approximately 6 multiples to the slope of the fundamental frequency shift when the tip approaches to the surface of sample. This non-destructive method was also adopted to investigate the local interlayer coupling and intercalation in the two-dimensional graphene films tentatively. More... »

PAGES

446-452

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s11431-017-9161-4

DOI

http://dx.doi.org/10.1007/s11431-017-9161-4

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1095857699


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Huazhong University of Science and Technology", 
          "id": "https://www.grid.ac/institutes/grid.33199.31", 
          "name": [
            "CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China", 
            "The State Key Laboratory of Digital Manufacturing Equipment and Technology, Department of Instrument Science and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, 430074, Wuhan, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Zheng", 
        "givenName": "ZhiYue", 
        "id": "sg:person.012361211243.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012361211243.87"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "National Center for Nanoscience and Technology", 
          "id": "https://www.grid.ac/institutes/grid.419265.d", 
          "name": [
            "CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Xu", 
        "givenName": "Rui", 
        "id": "sg:person.01114652612.09", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01114652612.09"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Chinese Academy of Sciences", 
          "id": "https://www.grid.ac/institutes/grid.410726.6", 
          "name": [
            "CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China", 
            "University of Chinese Academy of Sciences, 100049, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ye", 
        "givenName": "ShiLi", 
        "id": "sg:person.012125212222.23", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012125212222.23"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Chinese Academy of Sciences", 
          "id": "https://www.grid.ac/institutes/grid.410726.6", 
          "name": [
            "CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China", 
            "University of Chinese Academy of Sciences, 100049, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hussain", 
        "givenName": "Sabir", 
        "id": "sg:person.012722572622.28", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012722572622.28"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Renmin University of China", 
          "id": "https://www.grid.ac/institutes/grid.24539.39", 
          "name": [
            "Department of Physics, Renmin University of China, 100872, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ji", 
        "givenName": "Wei", 
        "id": "sg:person.07536771640.97", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07536771640.97"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Asylum Research, 93117, Santa Barbara, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Cheng", 
        "givenName": "Peng", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Osaka University", 
          "id": "https://www.grid.ac/institutes/grid.136593.b", 
          "name": [
            "Department of Applied Physics, Graduate School of Engineering, Osaka University, 565-0871, Osaka, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Li", 
        "givenName": "YanJun", 
        "id": "sg:person.015113114222.44", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015113114222.44"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Osaka University", 
          "id": "https://www.grid.ac/institutes/grid.136593.b", 
          "name": [
            "Department of Applied Physics, Graduate School of Engineering, Osaka University, 565-0871, Osaka, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Sugawara", 
        "givenName": "Yasuhiro", 
        "id": "sg:person.07422211771.98", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07422211771.98"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Renmin University of China", 
          "id": "https://www.grid.ac/institutes/grid.24539.39", 
          "name": [
            "CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China", 
            "Department of Physics, Renmin University of China, 100872, Beijing, China"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Cheng", 
        "givenName": "ZhiHai", 
        "id": "sg:person.01173105023.82", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01173105023.82"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1038/srep02677", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1002442966", 
          "https://doi.org/10.1038/srep02677"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1073/pnas.122040599", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1015673252"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1038/nnano.2012.38", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1015783149", 
          "https://doi.org/10.1038/nnano.2012.38"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1038/nnano.2009.454", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029058950", 
          "https://doi.org/10.1038/nnano.2009.454"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1038/nnano.2009.454", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029058950", 
          "https://doi.org/10.1038/nnano.2009.454"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1088/0957-4484/15/3/020", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1032286937"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1039/c4nr05907g", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1033107557"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/978-3-642-02525-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1035911156", 
          "https://doi.org/10.1007/978-3-642-02525-9"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/978-3-642-02525-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1035911156", 
          "https://doi.org/10.1007/978-3-642-02525-9"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.sna.2003.11.031", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1044079094"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1038/ncomms7550", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1044250976", 
          "https://doi.org/10.1038/ncomms7550"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/revmodphys.75.949", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1044309770"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/revmodphys.75.949", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1044309770"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1021/nl2030773", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1056218932"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1021/nl2030773", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1056218932"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.1325404", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057694956"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.2355437", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057851567"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.4755749", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058060539"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1088/1367-2630/2/1/005", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1059137757"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.21.5601", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060527463"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.21.5601", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060527463"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.29.5372", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060534609"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.29.5372", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060534609"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.69.165416", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060609504"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.69.165416", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060609504"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.72.235422", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060616072"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.72.235422", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060616072"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.97.036104", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060832580"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.97.036104", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060832580"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1126/science.1099730", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1062449775"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1360/n092015-00246", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065073187"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1360/n092016-00013", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065073230"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.3762/bjnano.5.255", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1071378834"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.3762/bjnano.6.14", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1071378963"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/9783527632183", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1101847081"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2018-03", 
    "datePublishedReg": "2018-03-01", 
    "description": "In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-sample interaction have been recently demonstrated as a promising technique for exploring more extensive material properties. Here we present an exploratory study of high harmonic atomic force microscopy by force-spectroscopy and high harmonic imaging. Since these components are very weak compared to the fundamental response, we firstly designed a high harmonic cantilever by tuning the second order flexural resonance frequency to an integer 6 times of its fundamental mode (i.e. \u03c92=6\u03c91). Moreover, it is verified that high harmonic can discern extra features than topographies on different samples with amplitude/frequency modulation (AM/FM) dynamic AFM mode. In AM mode, the first resonance amplitude and 6th harmonic amplitude were discussed. The 6th harmonic is more sensitive than the first order response. In FM mode, it is noted that the decaying rate of the 6th harmonic frequency is approximately 6 multiples to the slope of the fundamental frequency shift when the tip approaches to the surface of sample. This non-destructive method was also adopted to investigate the local interlayer coupling and intercalation in the two-dimensional graphene films tentatively.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/s11431-017-9161-4", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1134340", 
        "issn": [
          "1674-7321", 
          "1869-1900"
        ], 
        "name": "Science China Technological Sciences", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "3", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "61"
      }
    ], 
    "name": "High harmonic exploring on different materials in dynamic atomic force microscopy", 
    "pagination": "446-452", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "e7d5d5325afd5b42b889f44e0efe55ef0221025f92c2412a7763827fa2b3faf2"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s11431-017-9161-4"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1095857699"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s11431-017-9161-4", 
      "https://app.dimensions.ai/details/publication/pub.1095857699"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-10T22:25", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8690_00000484.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007/s11431-017-9161-4"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/s11431-017-9161-4'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/s11431-017-9161-4'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/s11431-017-9161-4'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/s11431-017-9161-4'


 

This table displays all metadata directly associated to this object as RDF triples.

216 TRIPLES      21 PREDICATES      53 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s11431-017-9161-4 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N5a2ab006ed9e461f9e83ccda3a4934bc
4 schema:citation sg:pub.10.1007/978-3-642-02525-9
5 sg:pub.10.1038/ncomms7550
6 sg:pub.10.1038/nnano.2009.454
7 sg:pub.10.1038/nnano.2012.38
8 sg:pub.10.1038/srep02677
9 https://doi.org/10.1002/9783527632183
10 https://doi.org/10.1016/j.sna.2003.11.031
11 https://doi.org/10.1021/nl2030773
12 https://doi.org/10.1039/c4nr05907g
13 https://doi.org/10.1063/1.1325404
14 https://doi.org/10.1063/1.2355437
15 https://doi.org/10.1063/1.4755749
16 https://doi.org/10.1073/pnas.122040599
17 https://doi.org/10.1088/0957-4484/15/3/020
18 https://doi.org/10.1088/1367-2630/2/1/005
19 https://doi.org/10.1103/physrevb.21.5601
20 https://doi.org/10.1103/physrevb.29.5372
21 https://doi.org/10.1103/physrevb.69.165416
22 https://doi.org/10.1103/physrevb.72.235422
23 https://doi.org/10.1103/physrevlett.97.036104
24 https://doi.org/10.1103/revmodphys.75.949
25 https://doi.org/10.1126/science.1099730
26 https://doi.org/10.1360/n092015-00246
27 https://doi.org/10.1360/n092016-00013
28 https://doi.org/10.3762/bjnano.5.255
29 https://doi.org/10.3762/bjnano.6.14
30 schema:datePublished 2018-03
31 schema:datePublishedReg 2018-03-01
32 schema:description In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-sample interaction have been recently demonstrated as a promising technique for exploring more extensive material properties. Here we present an exploratory study of high harmonic atomic force microscopy by force-spectroscopy and high harmonic imaging. Since these components are very weak compared to the fundamental response, we firstly designed a high harmonic cantilever by tuning the second order flexural resonance frequency to an integer 6 times of its fundamental mode (i.e. ω2=6ω1). Moreover, it is verified that high harmonic can discern extra features than topographies on different samples with amplitude/frequency modulation (AM/FM) dynamic AFM mode. In AM mode, the first resonance amplitude and 6th harmonic amplitude were discussed. The 6th harmonic is more sensitive than the first order response. In FM mode, it is noted that the decaying rate of the 6th harmonic frequency is approximately 6 multiples to the slope of the fundamental frequency shift when the tip approaches to the surface of sample. This non-destructive method was also adopted to investigate the local interlayer coupling and intercalation in the two-dimensional graphene films tentatively.
33 schema:genre research_article
34 schema:inLanguage en
35 schema:isAccessibleForFree false
36 schema:isPartOf Nf4aa42c486a24969b2c780489a5cf8ef
37 Nfd45cdc7ce2640f6b243cef4a9a93fde
38 sg:journal.1134340
39 schema:name High harmonic exploring on different materials in dynamic atomic force microscopy
40 schema:pagination 446-452
41 schema:productId N00d280e6afff46129d54543d00eccf94
42 Neaf0bee1798d43cd891322597eb86055
43 Nfd7222e436814bf68c17c29827e8dc0a
44 schema:sameAs https://app.dimensions.ai/details/publication/pub.1095857699
45 https://doi.org/10.1007/s11431-017-9161-4
46 schema:sdDatePublished 2019-04-10T22:25
47 schema:sdLicense https://scigraph.springernature.com/explorer/license/
48 schema:sdPublisher Nc92eea284e5e49d886bcdfa27d520bce
49 schema:url http://link.springer.com/10.1007/s11431-017-9161-4
50 sgo:license sg:explorer/license/
51 sgo:sdDataset articles
52 rdf:type schema:ScholarlyArticle
53 N00d280e6afff46129d54543d00eccf94 schema:name doi
54 schema:value 10.1007/s11431-017-9161-4
55 rdf:type schema:PropertyValue
56 N0842bc5f26514412b40e1b3bf9ec143c rdf:first N732739998e9345639a26502d7555aa0e
57 rdf:rest N3da41fdcf4dd41069b7919f49ed5fc87
58 N3da41fdcf4dd41069b7919f49ed5fc87 rdf:first sg:person.015113114222.44
59 rdf:rest N5d0ab62d65df42e188e620a8bdbd8896
60 N45fb9236a9d947a9a32cf26f27758417 rdf:first sg:person.012722572622.28
61 rdf:rest Nc65ded27c9f0400aa579af2a90629ecc
62 N5a2ab006ed9e461f9e83ccda3a4934bc rdf:first sg:person.012361211243.87
63 rdf:rest Na7dbb5d9a8884f40a419dd1664e76da7
64 N5d0ab62d65df42e188e620a8bdbd8896 rdf:first sg:person.07422211771.98
65 rdf:rest Na37a4979d1674b8eba878539beb8164a
66 N732739998e9345639a26502d7555aa0e schema:affiliation Na8dc286c81c24dee94b3f79c09c676ce
67 schema:familyName Cheng
68 schema:givenName Peng
69 rdf:type schema:Person
70 N8cf2578d48544f568a909c594f37c752 rdf:first sg:person.012125212222.23
71 rdf:rest N45fb9236a9d947a9a32cf26f27758417
72 Na37a4979d1674b8eba878539beb8164a rdf:first sg:person.01173105023.82
73 rdf:rest rdf:nil
74 Na7dbb5d9a8884f40a419dd1664e76da7 rdf:first sg:person.01114652612.09
75 rdf:rest N8cf2578d48544f568a909c594f37c752
76 Na8dc286c81c24dee94b3f79c09c676ce schema:name Asylum Research, 93117, Santa Barbara, USA
77 rdf:type schema:Organization
78 Nc65ded27c9f0400aa579af2a90629ecc rdf:first sg:person.07536771640.97
79 rdf:rest N0842bc5f26514412b40e1b3bf9ec143c
80 Nc92eea284e5e49d886bcdfa27d520bce schema:name Springer Nature - SN SciGraph project
81 rdf:type schema:Organization
82 Neaf0bee1798d43cd891322597eb86055 schema:name dimensions_id
83 schema:value pub.1095857699
84 rdf:type schema:PropertyValue
85 Nf4aa42c486a24969b2c780489a5cf8ef schema:issueNumber 3
86 rdf:type schema:PublicationIssue
87 Nfd45cdc7ce2640f6b243cef4a9a93fde schema:volumeNumber 61
88 rdf:type schema:PublicationVolume
89 Nfd7222e436814bf68c17c29827e8dc0a schema:name readcube_id
90 schema:value e7d5d5325afd5b42b889f44e0efe55ef0221025f92c2412a7763827fa2b3faf2
91 rdf:type schema:PropertyValue
92 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
93 schema:name Physical Sciences
94 rdf:type schema:DefinedTerm
95 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
96 schema:name Other Physical Sciences
97 rdf:type schema:DefinedTerm
98 sg:journal.1134340 schema:issn 1674-7321
99 1869-1900
100 schema:name Science China Technological Sciences
101 rdf:type schema:Periodical
102 sg:person.01114652612.09 schema:affiliation https://www.grid.ac/institutes/grid.419265.d
103 schema:familyName Xu
104 schema:givenName Rui
105 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01114652612.09
106 rdf:type schema:Person
107 sg:person.01173105023.82 schema:affiliation https://www.grid.ac/institutes/grid.24539.39
108 schema:familyName Cheng
109 schema:givenName ZhiHai
110 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01173105023.82
111 rdf:type schema:Person
112 sg:person.012125212222.23 schema:affiliation https://www.grid.ac/institutes/grid.410726.6
113 schema:familyName Ye
114 schema:givenName ShiLi
115 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012125212222.23
116 rdf:type schema:Person
117 sg:person.012361211243.87 schema:affiliation https://www.grid.ac/institutes/grid.33199.31
118 schema:familyName Zheng
119 schema:givenName ZhiYue
120 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012361211243.87
121 rdf:type schema:Person
122 sg:person.012722572622.28 schema:affiliation https://www.grid.ac/institutes/grid.410726.6
123 schema:familyName Hussain
124 schema:givenName Sabir
125 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.012722572622.28
126 rdf:type schema:Person
127 sg:person.015113114222.44 schema:affiliation https://www.grid.ac/institutes/grid.136593.b
128 schema:familyName Li
129 schema:givenName YanJun
130 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015113114222.44
131 rdf:type schema:Person
132 sg:person.07422211771.98 schema:affiliation https://www.grid.ac/institutes/grid.136593.b
133 schema:familyName Sugawara
134 schema:givenName Yasuhiro
135 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07422211771.98
136 rdf:type schema:Person
137 sg:person.07536771640.97 schema:affiliation https://www.grid.ac/institutes/grid.24539.39
138 schema:familyName Ji
139 schema:givenName Wei
140 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07536771640.97
141 rdf:type schema:Person
142 sg:pub.10.1007/978-3-642-02525-9 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035911156
143 https://doi.org/10.1007/978-3-642-02525-9
144 rdf:type schema:CreativeWork
145 sg:pub.10.1038/ncomms7550 schema:sameAs https://app.dimensions.ai/details/publication/pub.1044250976
146 https://doi.org/10.1038/ncomms7550
147 rdf:type schema:CreativeWork
148 sg:pub.10.1038/nnano.2009.454 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029058950
149 https://doi.org/10.1038/nnano.2009.454
150 rdf:type schema:CreativeWork
151 sg:pub.10.1038/nnano.2012.38 schema:sameAs https://app.dimensions.ai/details/publication/pub.1015783149
152 https://doi.org/10.1038/nnano.2012.38
153 rdf:type schema:CreativeWork
154 sg:pub.10.1038/srep02677 schema:sameAs https://app.dimensions.ai/details/publication/pub.1002442966
155 https://doi.org/10.1038/srep02677
156 rdf:type schema:CreativeWork
157 https://doi.org/10.1002/9783527632183 schema:sameAs https://app.dimensions.ai/details/publication/pub.1101847081
158 rdf:type schema:CreativeWork
159 https://doi.org/10.1016/j.sna.2003.11.031 schema:sameAs https://app.dimensions.ai/details/publication/pub.1044079094
160 rdf:type schema:CreativeWork
161 https://doi.org/10.1021/nl2030773 schema:sameAs https://app.dimensions.ai/details/publication/pub.1056218932
162 rdf:type schema:CreativeWork
163 https://doi.org/10.1039/c4nr05907g schema:sameAs https://app.dimensions.ai/details/publication/pub.1033107557
164 rdf:type schema:CreativeWork
165 https://doi.org/10.1063/1.1325404 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057694956
166 rdf:type schema:CreativeWork
167 https://doi.org/10.1063/1.2355437 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057851567
168 rdf:type schema:CreativeWork
169 https://doi.org/10.1063/1.4755749 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058060539
170 rdf:type schema:CreativeWork
171 https://doi.org/10.1073/pnas.122040599 schema:sameAs https://app.dimensions.ai/details/publication/pub.1015673252
172 rdf:type schema:CreativeWork
173 https://doi.org/10.1088/0957-4484/15/3/020 schema:sameAs https://app.dimensions.ai/details/publication/pub.1032286937
174 rdf:type schema:CreativeWork
175 https://doi.org/10.1088/1367-2630/2/1/005 schema:sameAs https://app.dimensions.ai/details/publication/pub.1059137757
176 rdf:type schema:CreativeWork
177 https://doi.org/10.1103/physrevb.21.5601 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060527463
178 rdf:type schema:CreativeWork
179 https://doi.org/10.1103/physrevb.29.5372 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060534609
180 rdf:type schema:CreativeWork
181 https://doi.org/10.1103/physrevb.69.165416 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060609504
182 rdf:type schema:CreativeWork
183 https://doi.org/10.1103/physrevb.72.235422 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060616072
184 rdf:type schema:CreativeWork
185 https://doi.org/10.1103/physrevlett.97.036104 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060832580
186 rdf:type schema:CreativeWork
187 https://doi.org/10.1103/revmodphys.75.949 schema:sameAs https://app.dimensions.ai/details/publication/pub.1044309770
188 rdf:type schema:CreativeWork
189 https://doi.org/10.1126/science.1099730 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062449775
190 rdf:type schema:CreativeWork
191 https://doi.org/10.1360/n092015-00246 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065073187
192 rdf:type schema:CreativeWork
193 https://doi.org/10.1360/n092016-00013 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065073230
194 rdf:type schema:CreativeWork
195 https://doi.org/10.3762/bjnano.5.255 schema:sameAs https://app.dimensions.ai/details/publication/pub.1071378834
196 rdf:type schema:CreativeWork
197 https://doi.org/10.3762/bjnano.6.14 schema:sameAs https://app.dimensions.ai/details/publication/pub.1071378963
198 rdf:type schema:CreativeWork
199 https://www.grid.ac/institutes/grid.136593.b schema:alternateName Osaka University
200 schema:name Department of Applied Physics, Graduate School of Engineering, Osaka University, 565-0871, Osaka, Japan
201 rdf:type schema:Organization
202 https://www.grid.ac/institutes/grid.24539.39 schema:alternateName Renmin University of China
203 schema:name CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China
204 Department of Physics, Renmin University of China, 100872, Beijing, China
205 rdf:type schema:Organization
206 https://www.grid.ac/institutes/grid.33199.31 schema:alternateName Huazhong University of Science and Technology
207 schema:name CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China
208 The State Key Laboratory of Digital Manufacturing Equipment and Technology, Department of Instrument Science and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, 430074, Wuhan, China
209 rdf:type schema:Organization
210 https://www.grid.ac/institutes/grid.410726.6 schema:alternateName University of Chinese Academy of Sciences
211 schema:name CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China
212 University of Chinese Academy of Sciences, 100049, Beijing, China
213 rdf:type schema:Organization
214 https://www.grid.ac/institutes/grid.419265.d schema:alternateName National Center for Nanoscience and Technology
215 schema:name CAS Center for Excellence in Nanoscience and Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, 100190, Beijing, China
216 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...