Influence of the structural surface state on the formation of a relief and morphology of GaAs(001) layers during molecular-beam epitaxy ... View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2008-09

AUTHORS

A. V. Vasev, M. A. Putyato, B. R. Semyagin, V. A. Seleznev, V. V. Preobrazhenskii

ABSTRACT

Methods of reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM) are used to investigate the special features of morphological changes on the GaAs(001) surface during the molecular-beam epitaxy (MBE) growth and vacuum annealing. A relationship is revealed between the superstructural state of the surface and the character of these changes. Thermodynamic conditions of epitaxial GaAs(001) growth with the most structurally perfect surface are established. The characteristics of the processes causing evolution of the relief during MBE growth in states with reconstruction (2 × 4) are determined. A new technique that allows the efficiency of smoothing of the GaAs(001) surface to be increased considerably by annealing in an arsenic flow is suggested and tested. More... »

PAGES

887-896

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s11182-009-9140-8

DOI

http://dx.doi.org/10.1007/s11182-009-9140-8

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1037928574


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Institute of Semiconductor Physics", 
          "id": "https://www.grid.ac/institutes/grid.450314.7", 
          "name": [
            "Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Vasev", 
        "givenName": "A. V.", 
        "id": "sg:person.010043354044.00", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010043354044.00"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute of Semiconductor Physics", 
          "id": "https://www.grid.ac/institutes/grid.450314.7", 
          "name": [
            "Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Putyato", 
        "givenName": "M. A.", 
        "id": "sg:person.014730523656.90", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014730523656.90"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute of Semiconductor Physics", 
          "id": "https://www.grid.ac/institutes/grid.450314.7", 
          "name": [
            "Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Semyagin", 
        "givenName": "B. R.", 
        "id": "sg:person.011644303155.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011644303155.87"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute of Semiconductor Physics", 
          "id": "https://www.grid.ac/institutes/grid.450314.7", 
          "name": [
            "Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Seleznev", 
        "givenName": "V. A.", 
        "id": "sg:person.01042670271.15", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01042670271.15"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute of Semiconductor Physics", 
          "id": "https://www.grid.ac/institutes/grid.450314.7", 
          "name": [
            "Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Preobrazhenskii", 
        "givenName": "V. V.", 
        "id": "sg:person.010664106542.73", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010664106542.73"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0039-6028(85)90724-1", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1008212986"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(85)90724-1", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1008212986"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(81)90649-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011063759"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(81)90649-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011063759"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(91)90959-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012616637"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(91)90959-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012616637"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(87)90355-1", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1013003183"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(87)90355-1", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1013003183"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0042-207x(83)90578-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1018481183"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0042-207x(83)90578-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1018481183"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf00616570", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1020349546", 
          "https://doi.org/10.1007/bf00616570"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf00616570", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1020349546", 
          "https://doi.org/10.1007/bf00616570"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(80)90582-8", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1024038769"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(80)90582-8", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1024038769"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf00617180", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1025292050", 
          "https://doi.org/10.1007/bf00617180"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf00617180", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1025292050", 
          "https://doi.org/10.1007/bf00617180"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(84)90574-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1027173967"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(84)90574-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1027173967"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(89)90354-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1028516972"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(89)90354-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1028516972"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/1.1500455", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1035165458", 
          "https://doi.org/10.1134/1.1500455"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1134/1.1500455", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1035165458", 
          "https://doi.org/10.1134/1.1500455"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0169-4332(94)00542-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1040685809"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(87)90358-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1041495399"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(87)90358-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1041495399"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/9780470142592.ch4", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1043280161"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(91)90951-z", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1045098578"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-0248(91)90951-z", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1045098578"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/978-1-4757-0091-6_5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1045579096", 
          "https://doi.org/10.1007/978-1-4757-0091-6_5"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0039-6028(00)00453-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1053333171"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.107285", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057654854"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.112734", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057660287"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.341041", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057948085"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.351209", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057965343"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.96281", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058136414"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.44.5897", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060559739"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.44.5897", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060559739"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.50.5335", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060574014"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevb.50.5335", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060574014"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.78.2381", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060814948"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.78.2381", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060814948"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.79.3938", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060816214"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.79.3938", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060816214"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.84.3358", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060821075"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.84.3358", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060821075"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1116/1.575795", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1062185842"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1116/1.590182", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1062200228"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1142/s0218625x98001079", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1062982020"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1142/s0218625x98001250", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1062982038"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1557/proc-237-255", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1067919334"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2008-09", 
    "datePublishedReg": "2008-09-01", 
    "description": "Methods of reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM) are used to investigate the special features of morphological changes on the GaAs(001) surface during the molecular-beam epitaxy (MBE) growth and vacuum annealing. A relationship is revealed between the superstructural state of the surface and the character of these changes. Thermodynamic conditions of epitaxial GaAs(001) growth with the most structurally perfect surface are established. The characteristics of the processes causing evolution of the relief during MBE growth in states with reconstruction (2 \u00d7 4) are determined. A new technique that allows the efficiency of smoothing of the GaAs(001) surface to be increased considerably by annealing in an arsenic flow is suggested and tested.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/s11182-009-9140-8", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1313824", 
        "issn": [
          "1064-8887", 
          "1573-9228"
        ], 
        "name": "Russian Physics Journal", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "9", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "51"
      }
    ], 
    "name": "Influence of the structural surface state on the formation of a relief and morphology of GaAs(001) layers during molecular-beam epitaxy and vacuum annealing", 
    "pagination": "887-896", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "b4adda7f92a9f0a458a48834547f87586e6be9c2b13ec86e84ca1cd03c74391d"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s11182-009-9140-8"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1037928574"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s11182-009-9140-8", 
      "https://app.dimensions.ai/details/publication/pub.1037928574"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-10T23:27", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8693_00000523.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007%2Fs11182-009-9140-8"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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This table displays all metadata directly associated to this object as RDF triples.

189 TRIPLES      21 PREDICATES      59 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s11182-009-9140-8 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author Na2cf6fe4f9eb4997984cdfec660ba93b
4 schema:citation sg:pub.10.1007/978-1-4757-0091-6_5
5 sg:pub.10.1007/bf00616570
6 sg:pub.10.1007/bf00617180
7 sg:pub.10.1134/1.1500455
8 https://doi.org/10.1002/9780470142592.ch4
9 https://doi.org/10.1016/0022-0248(87)90355-1
10 https://doi.org/10.1016/0022-0248(87)90358-7
11 https://doi.org/10.1016/0022-0248(89)90354-0
12 https://doi.org/10.1016/0022-0248(91)90951-z
13 https://doi.org/10.1016/0022-0248(91)90959-9
14 https://doi.org/10.1016/0039-6028(80)90582-8
15 https://doi.org/10.1016/0039-6028(81)90649-x
16 https://doi.org/10.1016/0039-6028(84)90574-0
17 https://doi.org/10.1016/0039-6028(85)90724-1
18 https://doi.org/10.1016/0042-207x(83)90578-x
19 https://doi.org/10.1016/0169-4332(94)00542-7
20 https://doi.org/10.1016/s0039-6028(00)00453-2
21 https://doi.org/10.1063/1.107285
22 https://doi.org/10.1063/1.112734
23 https://doi.org/10.1063/1.341041
24 https://doi.org/10.1063/1.351209
25 https://doi.org/10.1063/1.96281
26 https://doi.org/10.1103/physrevb.44.5897
27 https://doi.org/10.1103/physrevb.50.5335
28 https://doi.org/10.1103/physrevlett.78.2381
29 https://doi.org/10.1103/physrevlett.79.3938
30 https://doi.org/10.1103/physrevlett.84.3358
31 https://doi.org/10.1116/1.575795
32 https://doi.org/10.1116/1.590182
33 https://doi.org/10.1142/s0218625x98001079
34 https://doi.org/10.1142/s0218625x98001250
35 https://doi.org/10.1557/proc-237-255
36 schema:datePublished 2008-09
37 schema:datePublishedReg 2008-09-01
38 schema:description Methods of reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM) are used to investigate the special features of morphological changes on the GaAs(001) surface during the molecular-beam epitaxy (MBE) growth and vacuum annealing. A relationship is revealed between the superstructural state of the surface and the character of these changes. Thermodynamic conditions of epitaxial GaAs(001) growth with the most structurally perfect surface are established. The characteristics of the processes causing evolution of the relief during MBE growth in states with reconstruction (2 × 4) are determined. A new technique that allows the efficiency of smoothing of the GaAs(001) surface to be increased considerably by annealing in an arsenic flow is suggested and tested.
39 schema:genre research_article
40 schema:inLanguage en
41 schema:isAccessibleForFree false
42 schema:isPartOf N7ff6703a522444d78442b4a901e68b8d
43 Nd05a3b34ace84a6faeecea628ace52f1
44 sg:journal.1313824
45 schema:name Influence of the structural surface state on the formation of a relief and morphology of GaAs(001) layers during molecular-beam epitaxy and vacuum annealing
46 schema:pagination 887-896
47 schema:productId N178072ce55244c8db6e0a6c48af818a8
48 N2de1119cd7c94104bd0c2526401bdd26
49 Ncb9c67f53c014217aef896475eba380c
50 schema:sameAs https://app.dimensions.ai/details/publication/pub.1037928574
51 https://doi.org/10.1007/s11182-009-9140-8
52 schema:sdDatePublished 2019-04-10T23:27
53 schema:sdLicense https://scigraph.springernature.com/explorer/license/
54 schema:sdPublisher N574d8b06e7004cbe9368d31963cb61a4
55 schema:url http://link.springer.com/10.1007%2Fs11182-009-9140-8
56 sgo:license sg:explorer/license/
57 sgo:sdDataset articles
58 rdf:type schema:ScholarlyArticle
59 N178072ce55244c8db6e0a6c48af818a8 schema:name doi
60 schema:value 10.1007/s11182-009-9140-8
61 rdf:type schema:PropertyValue
62 N2de1119cd7c94104bd0c2526401bdd26 schema:name dimensions_id
63 schema:value pub.1037928574
64 rdf:type schema:PropertyValue
65 N3a8ef4b422434d4aa40913f46b250a90 rdf:first sg:person.010664106542.73
66 rdf:rest rdf:nil
67 N574d8b06e7004cbe9368d31963cb61a4 schema:name Springer Nature - SN SciGraph project
68 rdf:type schema:Organization
69 N7ff6703a522444d78442b4a901e68b8d schema:volumeNumber 51
70 rdf:type schema:PublicationVolume
71 N8a8b03543ddf413592438f4d9124c4a5 rdf:first sg:person.011644303155.87
72 rdf:rest Nbad677a5c9b24914afa357d09f227ab4
73 N9d353327a7f943f98abb39b6f5e1ea86 rdf:first sg:person.014730523656.90
74 rdf:rest N8a8b03543ddf413592438f4d9124c4a5
75 Na2cf6fe4f9eb4997984cdfec660ba93b rdf:first sg:person.010043354044.00
76 rdf:rest N9d353327a7f943f98abb39b6f5e1ea86
77 Nbad677a5c9b24914afa357d09f227ab4 rdf:first sg:person.01042670271.15
78 rdf:rest N3a8ef4b422434d4aa40913f46b250a90
79 Ncb9c67f53c014217aef896475eba380c schema:name readcube_id
80 schema:value b4adda7f92a9f0a458a48834547f87586e6be9c2b13ec86e84ca1cd03c74391d
81 rdf:type schema:PropertyValue
82 Nd05a3b34ace84a6faeecea628ace52f1 schema:issueNumber 9
83 rdf:type schema:PublicationIssue
84 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
85 schema:name Physical Sciences
86 rdf:type schema:DefinedTerm
87 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
88 schema:name Other Physical Sciences
89 rdf:type schema:DefinedTerm
90 sg:journal.1313824 schema:issn 1064-8887
91 1573-9228
92 schema:name Russian Physics Journal
93 rdf:type schema:Periodical
94 sg:person.010043354044.00 schema:affiliation https://www.grid.ac/institutes/grid.450314.7
95 schema:familyName Vasev
96 schema:givenName A. V.
97 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010043354044.00
98 rdf:type schema:Person
99 sg:person.01042670271.15 schema:affiliation https://www.grid.ac/institutes/grid.450314.7
100 schema:familyName Seleznev
101 schema:givenName V. A.
102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01042670271.15
103 rdf:type schema:Person
104 sg:person.010664106542.73 schema:affiliation https://www.grid.ac/institutes/grid.450314.7
105 schema:familyName Preobrazhenskii
106 schema:givenName V. V.
107 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010664106542.73
108 rdf:type schema:Person
109 sg:person.011644303155.87 schema:affiliation https://www.grid.ac/institutes/grid.450314.7
110 schema:familyName Semyagin
111 schema:givenName B. R.
112 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011644303155.87
113 rdf:type schema:Person
114 sg:person.014730523656.90 schema:affiliation https://www.grid.ac/institutes/grid.450314.7
115 schema:familyName Putyato
116 schema:givenName M. A.
117 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014730523656.90
118 rdf:type schema:Person
119 sg:pub.10.1007/978-1-4757-0091-6_5 schema:sameAs https://app.dimensions.ai/details/publication/pub.1045579096
120 https://doi.org/10.1007/978-1-4757-0091-6_5
121 rdf:type schema:CreativeWork
122 sg:pub.10.1007/bf00616570 schema:sameAs https://app.dimensions.ai/details/publication/pub.1020349546
123 https://doi.org/10.1007/bf00616570
124 rdf:type schema:CreativeWork
125 sg:pub.10.1007/bf00617180 schema:sameAs https://app.dimensions.ai/details/publication/pub.1025292050
126 https://doi.org/10.1007/bf00617180
127 rdf:type schema:CreativeWork
128 sg:pub.10.1134/1.1500455 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035165458
129 https://doi.org/10.1134/1.1500455
130 rdf:type schema:CreativeWork
131 https://doi.org/10.1002/9780470142592.ch4 schema:sameAs https://app.dimensions.ai/details/publication/pub.1043280161
132 rdf:type schema:CreativeWork
133 https://doi.org/10.1016/0022-0248(87)90355-1 schema:sameAs https://app.dimensions.ai/details/publication/pub.1013003183
134 rdf:type schema:CreativeWork
135 https://doi.org/10.1016/0022-0248(87)90358-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1041495399
136 rdf:type schema:CreativeWork
137 https://doi.org/10.1016/0022-0248(89)90354-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1028516972
138 rdf:type schema:CreativeWork
139 https://doi.org/10.1016/0022-0248(91)90951-z schema:sameAs https://app.dimensions.ai/details/publication/pub.1045098578
140 rdf:type schema:CreativeWork
141 https://doi.org/10.1016/0022-0248(91)90959-9 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012616637
142 rdf:type schema:CreativeWork
143 https://doi.org/10.1016/0039-6028(80)90582-8 schema:sameAs https://app.dimensions.ai/details/publication/pub.1024038769
144 rdf:type schema:CreativeWork
145 https://doi.org/10.1016/0039-6028(81)90649-x schema:sameAs https://app.dimensions.ai/details/publication/pub.1011063759
146 rdf:type schema:CreativeWork
147 https://doi.org/10.1016/0039-6028(84)90574-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1027173967
148 rdf:type schema:CreativeWork
149 https://doi.org/10.1016/0039-6028(85)90724-1 schema:sameAs https://app.dimensions.ai/details/publication/pub.1008212986
150 rdf:type schema:CreativeWork
151 https://doi.org/10.1016/0042-207x(83)90578-x schema:sameAs https://app.dimensions.ai/details/publication/pub.1018481183
152 rdf:type schema:CreativeWork
153 https://doi.org/10.1016/0169-4332(94)00542-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1040685809
154 rdf:type schema:CreativeWork
155 https://doi.org/10.1016/s0039-6028(00)00453-2 schema:sameAs https://app.dimensions.ai/details/publication/pub.1053333171
156 rdf:type schema:CreativeWork
157 https://doi.org/10.1063/1.107285 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057654854
158 rdf:type schema:CreativeWork
159 https://doi.org/10.1063/1.112734 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057660287
160 rdf:type schema:CreativeWork
161 https://doi.org/10.1063/1.341041 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057948085
162 rdf:type schema:CreativeWork
163 https://doi.org/10.1063/1.351209 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057965343
164 rdf:type schema:CreativeWork
165 https://doi.org/10.1063/1.96281 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058136414
166 rdf:type schema:CreativeWork
167 https://doi.org/10.1103/physrevb.44.5897 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060559739
168 rdf:type schema:CreativeWork
169 https://doi.org/10.1103/physrevb.50.5335 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060574014
170 rdf:type schema:CreativeWork
171 https://doi.org/10.1103/physrevlett.78.2381 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060814948
172 rdf:type schema:CreativeWork
173 https://doi.org/10.1103/physrevlett.79.3938 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060816214
174 rdf:type schema:CreativeWork
175 https://doi.org/10.1103/physrevlett.84.3358 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060821075
176 rdf:type schema:CreativeWork
177 https://doi.org/10.1116/1.575795 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062185842
178 rdf:type schema:CreativeWork
179 https://doi.org/10.1116/1.590182 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062200228
180 rdf:type schema:CreativeWork
181 https://doi.org/10.1142/s0218625x98001079 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062982020
182 rdf:type schema:CreativeWork
183 https://doi.org/10.1142/s0218625x98001250 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062982038
184 rdf:type schema:CreativeWork
185 https://doi.org/10.1557/proc-237-255 schema:sameAs https://app.dimensions.ai/details/publication/pub.1067919334
186 rdf:type schema:CreativeWork
187 https://www.grid.ac/institutes/grid.450314.7 schema:alternateName Institute of Semiconductor Physics
188 schema:name Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia
189 rdf:type schema:Organization
 




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