Interpretation of Scanning Tunnel Microscopy Data View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2015-10

AUTHORS

A. M. Mandel, A. I. Loskutov, V. B. Oshurko, G. I. Solomakho, S. V. Veselko

ABSTRACT

This is a discussion of phenomena that conflict with a unique relationship between the tunnel current and the width of the tunnel gap during measurements of surface profiles with scanning tunnel microscopes. The emphasis is on the effect of the structure of surface electronic states on the tunnel current.

PAGES

741-746

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s11018-015-0786-z

DOI

http://dx.doi.org/10.1007/s11018-015-0786-z

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1001726029


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