Influence of the thermal degradation on the dielectric properties of a thermoset View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2006-09

AUTHORS

Lisardo Núñez-Regueira, M. Villanueva, I. Fraga, C. A. Gracia-Fernández, S. Gómez-Barreiro

ABSTRACT

The thermal degradation of an epoxy system consisting of a diglycidyl ether of bisphenol A (DGEBA, n=0) and m-xylylenediamine (m-XDA) was studied by both thermogravimetric analysis (TG) and dielectric analysis (DEA). It has been checked a deviation of the typical behaviour in the Arrhenius plot expected for this kind of systems, owing to the thermal degradation. Both, structural relaxation time and conductivity values, were represented as a function of the mass loss, that allow a relationship to be obtained between characteristic relaxation time and the degree of degradation at the beginning of the degradation process. More... »

PAGES

235-241

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10973-005-7190-x

DOI

http://dx.doi.org/10.1007/s10973-005-7190-x

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1012827823


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