Temperature Dependence of the Phonon Escape Time Deduced from the Nucleation Time of Phase Slip Center in Superconducting NbTiN Thin ... View Full Text


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Article Info

DATE

2017-05

AUTHORS

K. Harrabi, F. O. Bakare, F. Oktasendra, J. P. Maneval

ABSTRACT

We have investigated the voltage response of superconducting NbTiN strips to a step-pulse of overcritical current in the range of temperatures 0.4 < T/T c < 0.9, where the critical temperature, Tc, is 8.7 K. The current-induced destruction of the Cooper pairs leads to the nucleation of a phase-slip center. The response appears after a certain delay time td, which we analyze through a Time-Dependent Ginzburg-Landau (TDGL) theory according to Tinkham’s approach. The experimental findings can be fitted by inferring a film cooling time of about 1.8 ns for a 20-nm-thick film, very little dependent upon sample width and temperature. Assuming a definite ratio between the electron and phonon specific heats, one deduces an average phonon escape time of 90 ps per nm thickness of NbTiN film sputtered on sapphire. More... »

PAGES

1349-1352

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10948-016-3833-3

DOI

http://dx.doi.org/10.1007/s10948-016-3833-3

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1021215892


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