X-ray diffraction investigation of siloxanes. III. Structure and configuration of cyclic tetra-and pentasiloxanes bearing different organic substituents at silicon atoms View Full Text


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Article Info

DATE

2007-01

AUTHORS

S. T. Malinovskii, A. Tesuro Vallina, H. Stoeckli-Evans

ABSTRACT

Single crystal X-ray diffraction is applied to elucidate the structures of six tetra-and one penta-siloxane compounds differing in the nature and position of silicon-sitting organic substituents (Me — methyl, Ph — phenyl, mPh — methoxyphenyl, 2mPh — dimethoxyphenyl, 3mPh — trimethoxypehnyl, and C4H6N — butironitrile). Charge states of atoms in the siloxane molecules are calculated, and the effect of oxygen-containing radicals on the Si-O bond lengths and Si-O-Si bond angles affecting the configurations of the tetra-and pentasiloxane cycles is shown. More... »

PAGES

128-136

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10947-007-0019-7

DOI

http://dx.doi.org/10.1007/s10947-007-0019-7

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1010272995


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