Resistivity Studies on Different Variants of κ-(BEDT-TTF)2Cu[N(CN)2]Br: Evidence for Disorder and /or Defect-Induced Inelastic Scattering Contributions View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2006-02

AUTHORS

M. Lang, Ch. Strack, C. Akinci, B. Wolf, J. A. Schlueter, J. Wosnitza, D. Schweitzer, J. Schreuer, L. Wiehl

ABSTRACT

Comparative resistivity measurements have been performed on differently prepared κ-(ET)2Cu[N(CN)2]Br single crystals. While the Tc values and their shifts under hydrostatic pressure are found to be sample independent, the resistivity profiles, especially around the resistivity hump at 90 K and the low-temperature ρ ∝ T2 behavior, show striking sample-to-sample variations. In the absence of significant differences in the crystals’ structural parameters and chemical compositions, as proved by high-resolution X-ray and electron-probe-microanalysis studies, these results indicate that real structure phenomena, i.e. disorder and/or defects, strongly affect the inelastic scattering in these molecular conductors. More... »

PAGES

191-197

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10909-006-9018-x

DOI

http://dx.doi.org/10.1007/s10909-006-9018-x

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1003574395


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