Structural, optical and magnetic properties of Ba and Ni doped CdS thin films prepared by spray pyrolysis method View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2017-05-09

AUTHORS

R. Murugesan, S. Sivakumar, P. Anandan, M. Haris

ABSTRACT

Pure, Barium and Nickel doped cadmium sulphide (CdS) thin films have been coated on glass substrates at 400 °C by spray pyrolysis technique. The prepared CdS and doped CdS thin films were analysed by various measurements such as X-ray diffraction (XRD), SEM, optical and Vibrating Sample Magnetometer (VSM). X-ray diffraction measurements show that the coated pure, Ba and Ni-doped CdS thin films belong to the cubic crystal structure with orientation preferentially along (111) direction. The average crystallite size of pure, Ba and Ni doped CdS thin films were determined as 31, 33 and 45 nm, respectively. The average dislocation density (δ) and stacking fault (SF) of pure, Ba and Ni doped CdS thin films were also determined. The surface morphology and elemental analysis of the thin films were determined by scanning electron microscopy and energy dispersive X-ray spectrum (SEM with EDAX). It is observed that the optical energy bandgap has been decreased from 2.43 to 2.1 eV due to the doping Ba. The luminescence spectrum shows a strong emission peak at 517 nm in the case of pure CdS thin film and a meager red shift has been observed due to the doping. VSM studies were employed to study the magnetic behaviour of Ba and Ni doped CdS thin films. More... »

PAGES

12432-12439

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10854-017-7064-6

DOI

http://dx.doi.org/10.1007/s10854-017-7064-6

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1085215384


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Department of Physics, Thiru Kolanjiappar Government Arts College, 606001, Vriddhachalam, India", 
          "id": "http://www.grid.ac/institutes/grid.449556.f", 
          "name": [
            "Department of Physics, Government Arts College (Autonomous), 636007, Salem, India", 
            "Department of Physics, Thiru Kolanjiappar Government Arts College, 606001, Vriddhachalam, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Murugesan", 
        "givenName": "R.", 
        "id": "sg:person.011131444404.32", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011131444404.32"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Physics, Government Arts College (Autonomous), 636007, Salem, India", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Department of Physics, Government Arts College (Autonomous), 636007, Salem, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Sivakumar", 
        "givenName": "S.", 
        "id": "sg:person.013321766004.72", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013321766004.72"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Physics, Thiru Kolanjiappar Government Arts College, 606001, Vriddhachalam, India", 
          "id": "http://www.grid.ac/institutes/grid.449556.f", 
          "name": [
            "Department of Physics, Thiru Kolanjiappar Government Arts College, 606001, Vriddhachalam, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Anandan", 
        "givenName": "P.", 
        "id": "sg:person.01353326146.17", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01353326146.17"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Physics, Karunya University, 641 114, Coimbatore, India", 
          "id": "http://www.grid.ac/institutes/grid.412056.4", 
          "name": [
            "Department of Physics, Karunya University, 641 114, Coimbatore, India"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Haris", 
        "givenName": "M.", 
        "id": "sg:person.013330500047.01", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013330500047.01"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1007/s10854-014-2647-y", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1014412771", 
          "https://doi.org/10.1007/s10854-014-2647-y"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s12034-014-0642-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1052899980", 
          "https://doi.org/10.1007/s12034-014-0642-9"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s13204-014-0313-6", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1003143837", 
          "https://doi.org/10.1007/s13204-014-0313-6"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s11051-010-9915-4", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029485476", 
          "https://doi.org/10.1007/s11051-010-9915-4"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf02708491", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1052821113", 
          "https://doi.org/10.1007/bf02708491"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s11164-012-0940-z", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1026169318", 
          "https://doi.org/10.1007/s11164-012-0940-z"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1023/a:1025148817623", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1028086284", 
          "https://doi.org/10.1023/a:1025148817623"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2017-05-09", 
    "datePublishedReg": "2017-05-09", 
    "description": "Pure, Barium and Nickel doped cadmium sulphide (CdS) thin films have been coated on glass substrates at 400\u2009\u00b0C by spray pyrolysis technique. The prepared CdS and doped CdS thin films were analysed by various measurements such as X-ray diffraction (XRD), SEM, optical and Vibrating Sample Magnetometer (VSM). X-ray diffraction measurements show that the coated pure, Ba and Ni-doped CdS thin films belong to the cubic crystal structure with orientation preferentially along (111) direction. The average crystallite size of pure, Ba and Ni doped CdS thin films were determined as 31, 33 and 45\u00a0nm, respectively. The average dislocation density (\u03b4) and stacking fault (SF) of pure, Ba and Ni doped CdS thin films were also determined. The surface morphology and elemental analysis of the thin films were determined by scanning electron microscopy and energy dispersive X-ray spectrum (SEM with EDAX). It is observed that the optical energy bandgap has been decreased from 2.43 to 2.1\u00a0eV due to the doping Ba. The luminescence spectrum shows a strong emission peak at 517\u00a0nm in the case of pure CdS thin film and a meager red shift has been observed due to the doping. VSM studies were employed to study the magnetic behaviour of Ba and Ni doped CdS thin films.", 
    "genre": "article", 
    "id": "sg:pub.10.1007/s10854-017-7064-6", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1136825", 
        "issn": [
          "0957-4522", 
          "1573-482X"
        ], 
        "name": "Journal of Materials Science: Materials in Electronics", 
        "publisher": "Springer Nature", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "17", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "28"
      }
    ], 
    "keywords": [
      "CdS thin films", 
      "thin films", 
      "pure CdS thin film", 
      "X-ray diffraction", 
      "cadmium sulfide thin films", 
      "optical energy bandgap", 
      "X-ray spectra", 
      "energy dispersive X-ray spectrum", 
      "dispersive X-ray spectrum", 
      "sulfide thin films", 
      "spray pyrolysis technique", 
      "X-ray diffraction measurements", 
      "strong emission peak", 
      "spray pyrolysis method", 
      "average crystallite size", 
      "cubic crystal structure", 
      "energy bandgap", 
      "glass substrates", 
      "average dislocation density", 
      "pyrolysis technique", 
      "luminescence spectra", 
      "red shift", 
      "emission peak", 
      "sample magnetometer", 
      "diffraction measurements", 
      "prepared CdS", 
      "VSM studies", 
      "dislocation density", 
      "magnetic behavior", 
      "pyrolysis method", 
      "surface morphology", 
      "magnetic properties", 
      "films", 
      "crystallite size", 
      "electron microscopy", 
      "spectra", 
      "Ni", 
      "bandgap", 
      "eV", 
      "measurements", 
      "magnetometer", 
      "crystal structure", 
      "diffraction", 
      "doping", 
      "microscopy", 
      "SEM", 
      "elemental analysis", 
      "nickel", 
      "Ba", 
      "faults", 
      "peak", 
      "density", 
      "substrate", 
      "shift", 
      "properties", 
      "morphology", 
      "Pure", 
      "structure", 
      "behavior", 
      "direction", 
      "barium", 
      "orientation", 
      "technique", 
      "size", 
      "method", 
      "Cd", 
      "analysis", 
      "cases", 
      "study"
    ], 
    "name": "Structural, optical and magnetic properties of Ba and Ni doped CdS thin films prepared by spray pyrolysis method", 
    "pagination": "12432-12439", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1085215384"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s10854-017-7064-6"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s10854-017-7064-6", 
      "https://app.dimensions.ai/details/publication/pub.1085215384"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-11-24T21:01", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20221124/entities/gbq_results/article/article_717.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1007/s10854-017-7064-6"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/s10854-017-7064-6'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/s10854-017-7064-6'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/s10854-017-7064-6'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/s10854-017-7064-6'


 

This table displays all metadata directly associated to this object as RDF triples.

182 TRIPLES      21 PREDICATES      100 URIs      85 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s10854-017-7064-6 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author N77e5eed470e44624855209e5fd337614
4 schema:citation sg:pub.10.1007/bf02708491
5 sg:pub.10.1007/s10854-014-2647-y
6 sg:pub.10.1007/s11051-010-9915-4
7 sg:pub.10.1007/s11164-012-0940-z
8 sg:pub.10.1007/s12034-014-0642-9
9 sg:pub.10.1007/s13204-014-0313-6
10 sg:pub.10.1023/a:1025148817623
11 schema:datePublished 2017-05-09
12 schema:datePublishedReg 2017-05-09
13 schema:description Pure, Barium and Nickel doped cadmium sulphide (CdS) thin films have been coated on glass substrates at 400 °C by spray pyrolysis technique. The prepared CdS and doped CdS thin films were analysed by various measurements such as X-ray diffraction (XRD), SEM, optical and Vibrating Sample Magnetometer (VSM). X-ray diffraction measurements show that the coated pure, Ba and Ni-doped CdS thin films belong to the cubic crystal structure with orientation preferentially along (111) direction. The average crystallite size of pure, Ba and Ni doped CdS thin films were determined as 31, 33 and 45 nm, respectively. The average dislocation density (δ) and stacking fault (SF) of pure, Ba and Ni doped CdS thin films were also determined. The surface morphology and elemental analysis of the thin films were determined by scanning electron microscopy and energy dispersive X-ray spectrum (SEM with EDAX). It is observed that the optical energy bandgap has been decreased from 2.43 to 2.1 eV due to the doping Ba. The luminescence spectrum shows a strong emission peak at 517 nm in the case of pure CdS thin film and a meager red shift has been observed due to the doping. VSM studies were employed to study the magnetic behaviour of Ba and Ni doped CdS thin films.
14 schema:genre article
15 schema:isAccessibleForFree false
16 schema:isPartOf Nb2e89ab5da884ab695b9513e2362a143
17 Nc1b9a906ac5b411384f6fd580883a426
18 sg:journal.1136825
19 schema:keywords Ba
20 Cd
21 CdS thin films
22 Ni
23 Pure
24 SEM
25 VSM studies
26 X-ray diffraction
27 X-ray diffraction measurements
28 X-ray spectra
29 analysis
30 average crystallite size
31 average dislocation density
32 bandgap
33 barium
34 behavior
35 cadmium sulfide thin films
36 cases
37 crystal structure
38 crystallite size
39 cubic crystal structure
40 density
41 diffraction
42 diffraction measurements
43 direction
44 dislocation density
45 dispersive X-ray spectrum
46 doping
47 eV
48 electron microscopy
49 elemental analysis
50 emission peak
51 energy bandgap
52 energy dispersive X-ray spectrum
53 faults
54 films
55 glass substrates
56 luminescence spectra
57 magnetic behavior
58 magnetic properties
59 magnetometer
60 measurements
61 method
62 microscopy
63 morphology
64 nickel
65 optical energy bandgap
66 orientation
67 peak
68 prepared CdS
69 properties
70 pure CdS thin film
71 pyrolysis method
72 pyrolysis technique
73 red shift
74 sample magnetometer
75 shift
76 size
77 spectra
78 spray pyrolysis method
79 spray pyrolysis technique
80 strong emission peak
81 structure
82 study
83 substrate
84 sulfide thin films
85 surface morphology
86 technique
87 thin films
88 schema:name Structural, optical and magnetic properties of Ba and Ni doped CdS thin films prepared by spray pyrolysis method
89 schema:pagination 12432-12439
90 schema:productId N0e8e13a1c3e04154acab21cd7adf5b12
91 N34d8e2d12a1443eabfa68b15c62ac479
92 schema:sameAs https://app.dimensions.ai/details/publication/pub.1085215384
93 https://doi.org/10.1007/s10854-017-7064-6
94 schema:sdDatePublished 2022-11-24T21:01
95 schema:sdLicense https://scigraph.springernature.com/explorer/license/
96 schema:sdPublisher Nb4f785bd47dc4776a213af00b9d07d2c
97 schema:url https://doi.org/10.1007/s10854-017-7064-6
98 sgo:license sg:explorer/license/
99 sgo:sdDataset articles
100 rdf:type schema:ScholarlyArticle
101 N0e8e13a1c3e04154acab21cd7adf5b12 schema:name dimensions_id
102 schema:value pub.1085215384
103 rdf:type schema:PropertyValue
104 N1fcfeb5f25104289aa639dc0d72f3cf6 rdf:first sg:person.013330500047.01
105 rdf:rest rdf:nil
106 N34d8e2d12a1443eabfa68b15c62ac479 schema:name doi
107 schema:value 10.1007/s10854-017-7064-6
108 rdf:type schema:PropertyValue
109 N384bdbdbe2214b82ac17f58cd7e0ba8f rdf:first sg:person.013321766004.72
110 rdf:rest Na44fd740e8be49e8820d7a5d009a7cfe
111 N77e5eed470e44624855209e5fd337614 rdf:first sg:person.011131444404.32
112 rdf:rest N384bdbdbe2214b82ac17f58cd7e0ba8f
113 Na44fd740e8be49e8820d7a5d009a7cfe rdf:first sg:person.01353326146.17
114 rdf:rest N1fcfeb5f25104289aa639dc0d72f3cf6
115 Nb2e89ab5da884ab695b9513e2362a143 schema:volumeNumber 28
116 rdf:type schema:PublicationVolume
117 Nb4f785bd47dc4776a213af00b9d07d2c schema:name Springer Nature - SN SciGraph project
118 rdf:type schema:Organization
119 Nc1b9a906ac5b411384f6fd580883a426 schema:issueNumber 17
120 rdf:type schema:PublicationIssue
121 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
122 schema:name Engineering
123 rdf:type schema:DefinedTerm
124 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
125 schema:name Materials Engineering
126 rdf:type schema:DefinedTerm
127 sg:journal.1136825 schema:issn 0957-4522
128 1573-482X
129 schema:name Journal of Materials Science: Materials in Electronics
130 schema:publisher Springer Nature
131 rdf:type schema:Periodical
132 sg:person.011131444404.32 schema:affiliation grid-institutes:grid.449556.f
133 schema:familyName Murugesan
134 schema:givenName R.
135 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011131444404.32
136 rdf:type schema:Person
137 sg:person.013321766004.72 schema:affiliation grid-institutes:None
138 schema:familyName Sivakumar
139 schema:givenName S.
140 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013321766004.72
141 rdf:type schema:Person
142 sg:person.013330500047.01 schema:affiliation grid-institutes:grid.412056.4
143 schema:familyName Haris
144 schema:givenName M.
145 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013330500047.01
146 rdf:type schema:Person
147 sg:person.01353326146.17 schema:affiliation grid-institutes:grid.449556.f
148 schema:familyName Anandan
149 schema:givenName P.
150 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01353326146.17
151 rdf:type schema:Person
152 sg:pub.10.1007/bf02708491 schema:sameAs https://app.dimensions.ai/details/publication/pub.1052821113
153 https://doi.org/10.1007/bf02708491
154 rdf:type schema:CreativeWork
155 sg:pub.10.1007/s10854-014-2647-y schema:sameAs https://app.dimensions.ai/details/publication/pub.1014412771
156 https://doi.org/10.1007/s10854-014-2647-y
157 rdf:type schema:CreativeWork
158 sg:pub.10.1007/s11051-010-9915-4 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029485476
159 https://doi.org/10.1007/s11051-010-9915-4
160 rdf:type schema:CreativeWork
161 sg:pub.10.1007/s11164-012-0940-z schema:sameAs https://app.dimensions.ai/details/publication/pub.1026169318
162 https://doi.org/10.1007/s11164-012-0940-z
163 rdf:type schema:CreativeWork
164 sg:pub.10.1007/s12034-014-0642-9 schema:sameAs https://app.dimensions.ai/details/publication/pub.1052899980
165 https://doi.org/10.1007/s12034-014-0642-9
166 rdf:type schema:CreativeWork
167 sg:pub.10.1007/s13204-014-0313-6 schema:sameAs https://app.dimensions.ai/details/publication/pub.1003143837
168 https://doi.org/10.1007/s13204-014-0313-6
169 rdf:type schema:CreativeWork
170 sg:pub.10.1023/a:1025148817623 schema:sameAs https://app.dimensions.ai/details/publication/pub.1028086284
171 https://doi.org/10.1023/a:1025148817623
172 rdf:type schema:CreativeWork
173 grid-institutes:None schema:alternateName Department of Physics, Government Arts College (Autonomous), 636007, Salem, India
174 schema:name Department of Physics, Government Arts College (Autonomous), 636007, Salem, India
175 rdf:type schema:Organization
176 grid-institutes:grid.412056.4 schema:alternateName Department of Physics, Karunya University, 641 114, Coimbatore, India
177 schema:name Department of Physics, Karunya University, 641 114, Coimbatore, India
178 rdf:type schema:Organization
179 grid-institutes:grid.449556.f schema:alternateName Department of Physics, Thiru Kolanjiappar Government Arts College, 606001, Vriddhachalam, India
180 schema:name Department of Physics, Government Arts College (Autonomous), 636007, Salem, India
181 Department of Physics, Thiru Kolanjiappar Government Arts College, 606001, Vriddhachalam, India
182 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...