A Self-Consistent Event Biasing Scheme for Statistical Enhancement View Full Text


Ontology type: schema:ScholarlyArticle      Open Access: True


Article Info

DATE

2004-10

AUTHORS

M. Nedjalkov, S. Ahmed, D. Vasileska

ABSTRACT

The event biasing approach for statistical enhancement is generalized for self-consistent device simulations, posed by mixed boundary and initial conditions transport problems. It is shown that the weight of the particles, as obtained by biasing of the Boltzmann equation, survives between the successive steps of solving the Poisson equation. Particular biasing techniques are applied to the simulation of a 15 nm MOSFET and the convergence of the terminal and channel currents is analyzed. More... »

PAGES

305-309

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10825-004-7066-5

DOI

http://dx.doi.org/10.1007/s10825-004-7066-5

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1037268569


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0205", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Optical Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0906", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Electrical and Electronic Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ", 
          "id": "http://www.grid.ac/institutes/grid.215654.1", 
          "name": [
            "Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Nedjalkov", 
        "givenName": "M.", 
        "id": "sg:person.011142023427.48", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011142023427.48"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ", 
          "id": "http://www.grid.ac/institutes/grid.215654.1", 
          "name": [
            "Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ahmed", 
        "givenName": "S.", 
        "id": "sg:person.014220066037.94", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014220066037.94"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ", 
          "id": "http://www.grid.ac/institutes/grid.215654.1", 
          "name": [
            "Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Vasileska", 
        "givenName": "D.", 
        "id": "sg:person.01360124374.41", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01360124374.41"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2004-10", 
    "datePublishedReg": "2004-10-01", 
    "description": "The event biasing approach for statistical enhancement is generalized for self-consistent device simulations, posed by mixed boundary and initial conditions transport problems. It is shown that the weight of the particles, as obtained by biasing of the Boltzmann equation, survives between the successive steps of solving the Poisson equation. Particular biasing techniques are applied to the simulation of a 15 nm MOSFET and the convergence of the terminal and channel currents is analyzed.", 
    "genre": "article", 
    "id": "sg:pub.10.1007/s10825-004-7066-5", 
    "inLanguage": "en", 
    "isAccessibleForFree": true, 
    "isPartOf": [
      {
        "id": "sg:journal.1036340", 
        "issn": [
          "1569-8025", 
          "1572-8137"
        ], 
        "name": "Journal of Computational Electronics", 
        "publisher": "Springer Nature", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "3-4", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "3"
      }
    ], 
    "keywords": [
      "statistical enhancement", 
      "self-consistent device simulations", 
      "Boltzmann equation", 
      "transport problems", 
      "Poisson equation", 
      "device simulation", 
      "equations", 
      "biasing scheme", 
      "simulations", 
      "convergence", 
      "biasing technique", 
      "scheme", 
      "problem", 
      "successive steps", 
      "current", 
      "MOSFETs", 
      "biasing", 
      "approach", 
      "technique", 
      "particles", 
      "step", 
      "enhancement", 
      "terminals", 
      "weight", 
      "channel currents", 
      "events"
    ], 
    "name": "A Self-Consistent Event Biasing Scheme for Statistical Enhancement", 
    "pagination": "305-309", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1037268569"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s10825-004-7066-5"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s10825-004-7066-5", 
      "https://app.dimensions.ai/details/publication/pub.1037268569"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-05-20T07:22", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220519/entities/gbq_results/article/article_378.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1007/s10825-004-7066-5"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

106 TRIPLES      21 PREDICATES      54 URIs      44 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s10825-004-7066-5 schema:about anzsrc-for:02
2 anzsrc-for:0205
3 anzsrc-for:09
4 anzsrc-for:0906
5 schema:author N30d16e3eace3493ab184d57df0b09b0f
6 schema:datePublished 2004-10
7 schema:datePublishedReg 2004-10-01
8 schema:description The event biasing approach for statistical enhancement is generalized for self-consistent device simulations, posed by mixed boundary and initial conditions transport problems. It is shown that the weight of the particles, as obtained by biasing of the Boltzmann equation, survives between the successive steps of solving the Poisson equation. Particular biasing techniques are applied to the simulation of a 15 nm MOSFET and the convergence of the terminal and channel currents is analyzed.
9 schema:genre article
10 schema:inLanguage en
11 schema:isAccessibleForFree true
12 schema:isPartOf N8d55ef626e9b4c0c8bdbcb149fc5cbb0
13 Ne1e8d997190d4297ad3c409a6ecb8e3a
14 sg:journal.1036340
15 schema:keywords Boltzmann equation
16 MOSFETs
17 Poisson equation
18 approach
19 biasing
20 biasing scheme
21 biasing technique
22 channel currents
23 convergence
24 current
25 device simulation
26 enhancement
27 equations
28 events
29 particles
30 problem
31 scheme
32 self-consistent device simulations
33 simulations
34 statistical enhancement
35 step
36 successive steps
37 technique
38 terminals
39 transport problems
40 weight
41 schema:name A Self-Consistent Event Biasing Scheme for Statistical Enhancement
42 schema:pagination 305-309
43 schema:productId Nb3ec53d046984e818f52ef0c757278b7
44 Ne94662e667ed4a51a8d26d9cd78c187b
45 schema:sameAs https://app.dimensions.ai/details/publication/pub.1037268569
46 https://doi.org/10.1007/s10825-004-7066-5
47 schema:sdDatePublished 2022-05-20T07:22
48 schema:sdLicense https://scigraph.springernature.com/explorer/license/
49 schema:sdPublisher Nbd2879ef86474231a9bc51b5e81bb067
50 schema:url https://doi.org/10.1007/s10825-004-7066-5
51 sgo:license sg:explorer/license/
52 sgo:sdDataset articles
53 rdf:type schema:ScholarlyArticle
54 N29681ab6f84348a5982ba78997b1511e rdf:first sg:person.014220066037.94
55 rdf:rest N605b2898d97040f39f75f392b63ed905
56 N30d16e3eace3493ab184d57df0b09b0f rdf:first sg:person.011142023427.48
57 rdf:rest N29681ab6f84348a5982ba78997b1511e
58 N605b2898d97040f39f75f392b63ed905 rdf:first sg:person.01360124374.41
59 rdf:rest rdf:nil
60 N8d55ef626e9b4c0c8bdbcb149fc5cbb0 schema:issueNumber 3-4
61 rdf:type schema:PublicationIssue
62 Nb3ec53d046984e818f52ef0c757278b7 schema:name doi
63 schema:value 10.1007/s10825-004-7066-5
64 rdf:type schema:PropertyValue
65 Nbd2879ef86474231a9bc51b5e81bb067 schema:name Springer Nature - SN SciGraph project
66 rdf:type schema:Organization
67 Ne1e8d997190d4297ad3c409a6ecb8e3a schema:volumeNumber 3
68 rdf:type schema:PublicationVolume
69 Ne94662e667ed4a51a8d26d9cd78c187b schema:name dimensions_id
70 schema:value pub.1037268569
71 rdf:type schema:PropertyValue
72 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
73 schema:name Physical Sciences
74 rdf:type schema:DefinedTerm
75 anzsrc-for:0205 schema:inDefinedTermSet anzsrc-for:
76 schema:name Optical Physics
77 rdf:type schema:DefinedTerm
78 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
79 schema:name Engineering
80 rdf:type schema:DefinedTerm
81 anzsrc-for:0906 schema:inDefinedTermSet anzsrc-for:
82 schema:name Electrical and Electronic Engineering
83 rdf:type schema:DefinedTerm
84 sg:journal.1036340 schema:issn 1569-8025
85 1572-8137
86 schema:name Journal of Computational Electronics
87 schema:publisher Springer Nature
88 rdf:type schema:Periodical
89 sg:person.011142023427.48 schema:affiliation grid-institutes:grid.215654.1
90 schema:familyName Nedjalkov
91 schema:givenName M.
92 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011142023427.48
93 rdf:type schema:Person
94 sg:person.01360124374.41 schema:affiliation grid-institutes:grid.215654.1
95 schema:familyName Vasileska
96 schema:givenName D.
97 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01360124374.41
98 rdf:type schema:Person
99 sg:person.014220066037.94 schema:affiliation grid-institutes:grid.215654.1
100 schema:familyName Ahmed
101 schema:givenName S.
102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014220066037.94
103 rdf:type schema:Person
104 grid-institutes:grid.215654.1 schema:alternateName Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ
105 schema:name Department of Electrical Engineering, Arizona State University, 85287-5706, Tempe, AZ
106 rdf:type schema:Organization
 




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