Nuclear Microscopy for Air-Pollutant Characterization and Its Advantages over Traditional Techniques View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2014-03-16

AUTHORS

S. S. Ram, R. V. Kumar, P. Chaudhuri, S. Chanda, S. C. Santra, M. Deary, M. Sudarshan, A. Chakraborty

ABSTRACT

In the present study we establish the use of the proton induced X-ray emission (PIXE) technique coupled with Rutherford backscattering as a sensitive technique for air-pollution monitoring. Several elements such as Al, Si, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, and As were detected in the ppm level of concentration. Comparisons show the advantages of micro-PIXE over scanning microscope-based energy-dispersive X-ray spectrometry (SEM-EDX) and energy-dispersive X-ray fluorescence spectrometry (EDXRF). More... »

PAGES

145-150

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10812-014-9900-2

DOI

http://dx.doi.org/10.1007/s10812-014-9900-2

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1009126329


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