Damage Threshold of Ni Thin Film by Terahertz Pulses View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2018-11

AUTHORS

O. V. Chefonov, A. V. Ovchinnikov, S. A. Evlashin, M. B. Agranat

ABSTRACT

Damage in a thin nickel film irradiated by subpicosecond pulses of terahertz (THz) radiation in the range of 1–3 THz at electric-field strengths up to 20 MV/cm at the center of a focal spot is observed. The damage threshold fluence is evaluated for single-pulse experiments. The damage pattern induced by multiple THz pulses has the appearance of a complex periodic structure in the form of elongated channels of metal film discontinuity that are perpendicular to the in-plane electric field direction of THz radiation. More... »

PAGES

1047-1054

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10762-018-0537-8

DOI

http://dx.doi.org/10.1007/s10762-018-0537-8

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1106705771


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